XRF
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: X-ray Fluorescence, X-ray Fluorescence Spectrometers, XRF Analyzer, EDXRF, TXRF, WDXRF
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XRF, AA & ICP sample preparation
Claisse Range
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Designed for unprecedented analytical accuracy and repeatability, Claisse® electric and gas automatic instruments set new benchmarks in fusion capabilities. The same is true for Claisse pre-fused and homogeneous borate fluxes, high-quality platinumware, as well as analytical consulting services.
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XRF Systems
OEM Solutions
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Amptek offers a complete line of OEM detectors, preamplifiers, digital processors, and power supplies, and can work with you to help develop custom solutions unique to your needs. We provide established and emerging OEM customers a fast track to the market with our modular systems that will meet current needs, while being flexible enough to adapt to your product roadmap. The below options are typical configurations. Please contact us for custom solutions.
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Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Spectrometers-XRF
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For X-ray fluorescence spectrometers for elemental analysis or trace element analysis, SPECTRO is a world leader
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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XRF
O Series
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The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can’t fit through the small apertures, as is the case with collimator systems, the poly-capillary optics assembly allows almost all of the x-rays from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
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As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Energy Dispersive X-ray Fluorescence Analyzer
X-5000
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HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.
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Handheld ED-XRF Spectrometers
SPECTRO xSORT
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SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
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Handheld XRF Analyzer
Vanta Element
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The Vanta Element XRF analyzer series provides elemental analysis for fast alloy grade identification and sorting at an affordable price. The series is available in two cost-effective models
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Single Position Automated Electric Fluxer
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Single-position fully automated electric fusion machine with a typical sample throughput of 5-7 samples per hour. Ideal for preparing fused beads for XRF analysis and solutions for AA, ICP, and wet chemistry analysis. Patent PendingTypical samples include: Cement, Clinker, Ores, Slag, Refractories, Ceramics, Catalysts, Glass, Rocks, Minerals, Soils
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ED-XRF Spectrometer
SPECTROSCOUT
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SPECTRO Analytical Instruments GmbH
The new portable SPECTROSCOUT ED-XRF analyzers deliver much of the analytical power of top-grade laboratory benchtop analyzers. They provide fast, dependable, truly lab-quality results in the field or on the production floor all at a surprisingly low cost. The SPECTROSCOUT analyzers provide exceptional performance, at wide concentration levels, for all of the relevant elements in the range of Na-U. SPECTROSCOUT impresses with unprecedented precision and speed making it the ideal portable XRF for onsite applications where results matter.
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Portable Metal Analyzer
SPECTROPORT
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SPECTRO Analytical Instruments GmbH
When handhelds aren't enough, the amazing new SPECTROPORT portable metal analyzer applies more advanced OES technology in a unit as easy to use as a handheld analyzer. SPECTROPORT delivers many advantages of SPECTRO's portable OES flagship, SPECTROTEST, in a smaller, lighter package. It accurately analyzes elements such as carbon, sulfur, phosphorus, and boron. It's as fast as an XRF, with many analyses taking only a few seconds. And it enables effortless point-and-shoot performance, to minimize operator intervention and decision-making. It adds the convenience and simplicity of the best handheld analyzers to the accuracy and wide analytical range of SPECTRO's renowned OES technology. You get fast, ready response; flexible portability; intuitive ease of use; and minimal standardization efforts.
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Sulfur Benchtop
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XOS offers a variety of sulfur analyzers suitable for a wide range of analysis, throughput requirements, and operating environments. Imagine a smarter analysis solution free of compromise: hassle-free sample prep, easy operation, rapid testing, compliance flexibility, and industry-leading precision. These analyzers range from monochromatic wavelength dispersive XRF (MWDXRF) to high definition XRF (HDXRF) systems, delivering direct measurement without the need for consumable gasses or sample conversion.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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WDXRF Spectrometers
Zetium
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X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Benchtop XRD System
BTX
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The BTX Benchtop XRD System is a fast, low cost, small footprint, benchtop XRD for full phase ID of major, minor and trace components and quick XRF scan of elements Ca – U. Its unique, minimal sample prep technique and sample chamber allow for fast, benchtop analysis rivaling the performance of large costly lab units.
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Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Micro-XRF spectrometer
Atlas™
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The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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Mobile metal analyzers
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SPECTRO Analytical Instruments GmbH
Mobile metal analyzers have been used for over 30 years to conduct metal analysis onsite. The rapid development in instrument technology has led to significant advances in the application possibilities. As a technology leader, SPECTRO has markedly shaped and formed this development from the start. As the worldwide market leader in this area, SPECTRO is today the only company to offer a complete range of metal analyzer products from handheld XRF to arc spark OES spectrometers for the many different tasks in onsite metal analysis.
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X-ray Fluorescence
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XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
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Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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Handheld Portable XRF Spectrometer
QualiX-2000
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Handheld Portable XRF Spectrometer - QualiX-2000 Series are widely applied in accurate and non-destructive detection on a variety of precious metal alloys, low alloy steel, stainless steel, tool steel, electronic components, batteries, toys, stationery, children's products, minerals, raw ore, etc. You can identify material composition and alloy grade.
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Portable XRD System
TERRA
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The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
