X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Product
ICP OES spectrometer (ICP AES)
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SPECTRO Analytical Instruments GmbH
ICP OES spectrometer (ICP AES) for the rapid analysis of elements in a variety of matrices including aqueous, semi-conductor, petrochemical, soil, metallurgical and slurries
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Product
Fluorescence and Absorbance Spectrometer
Duetta
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Duetta™ is a spectrofluorometer that combines, simultaneously, the functions of fluorescence and absorbance spectrometers. Thanks to its high-speed built-in CCD detector, the Duetta can acquire a full spectrum from 250 nm to 1,100 nm in less than one second, making it the fastest fluorescence spectrometer on the market.
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Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Product
Spectrometers
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Since spectroscopy is used for numerous applications, we have defined our products in different lines, as seen below. We offer instruments with a small form factor to integrate into other devices in the CompactLine: high-sensitivity instruments for more demanding applications in the SensLine and spectrometers especially configured for the near-infrared range in our NIRLine. The StarLine spectrometers are our most versatile instruments for general spectroscopy applications.
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Product
HPGe Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
Baltic Scientific Instruments produces gamma- and X-ray spectrometers based on HPGe coaxial or planar detectors with liquid nitrogen and electric machine cooling. The spectrometers are used for radionuclide analysis and for monitoring of activity in the nuclear industry and related environment monitoring. HPGe detectors have additional applications in scientific research and technology development as well as in various spheres of industry including security and border control.
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Product
High-Performance [Liquid Chromatograph Mass Spectrometer
LCMS-2020
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LCMS-2020 is optimized for the Prominence UFLC/UFLCXR Ultra Fast Liquid Chromatograph. Novel patent-pending technologies offer significantly enhanced scan speed and positive-negative ion polarity switching time, which are essential for UFLC, and simultaneously boost sensitivity. The instrument combines the excellent compound selectivity that is a feature of the mass spectrometer with significantly enhanced total productivity – from method development to analysis. The LCMS-2020 plays a useful role in a range of fields, including the synthesis of compounds in the pharmaceutical and chemical industries.
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Product
Portable XRF Spectrometers
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XRF (X-ray fluorescence) is an innovative, non-destructive technology for material analysis. It`s unique and almost universal, given you get a high-quality XRF gun (handheld XRF). An X-ray gun sees sample contents by using an X-ray source to measure the secondary ways (fluorescent) the sample emits. Such an analysis is clear and fast.
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Product
Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Product
Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
AXIMA Confidence
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Powerful MALDI-TOF performance for reliable mass information and MS/MS derived structural detail.
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Product
High-Performance Liquid Chromatograph Mass Spectrometer
LCMS-2050
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The LCMS-2050 single quadrupole mass spectrometer combines the user-friendliness of an LC detector with the excellent performance of MS to provide a complete package of easy-to-use high-level performance and compactness. To make it accessible to all users, the system is enhanced with technology and functions to ensure that even technicians unfamiliar with mass spectrometers can easily and efficiently perform analysis.
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Product
X-ray Inspection System
X-eye SF160 Series
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High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Product
Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Product
Hybrid Diffuse Reflectance Spectrometer
Poly602™
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Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
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Product
OES Spectrometers
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OES Spectrometers (Optical Emission Spectrometers for OEMs) optimized for SEMICON applications including plasma monitoring/end-point detection and reflectometry (with the addition of a flash lamp). The OES-Star features unmatched throughput and SNR, spectral coverage and < 1 nm resolution). Our new OES Family, OES-Star, VS70-MC and InVizU all include our latest “Multi-Communications interface” electronics (MC= EtherCAT, Ethernet, USB-2). The Invizu integrates both a linear CMOS sensor for UV-VIS and a TE-Cooled INGAAS sensor, which extends the spectral coverage to 1700 nm.
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Product
A Compact X-ray Inspection System, The MedaScope™ Desktop
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A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
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Product
Spectrometer Systems
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ZEISS spectrometer systems leverage our longstanding experience in process optimization and expertise as a pioneer in scientific optics. Regardless of whether it’s in the lab, on the production line or in the field, plan your next project with ZEISS and benefit from:
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Product
Vibrational Circular Dichroism Spectrometer
FVS-6000
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The FVS-6000 vibrational circular dichroism spectrometer measures both IR absorption and VCD and provides accurate and highly sensitive measurements in the fingerprint region. It also has several unique features such as a wide measurement range option of 4,000 to 750 cm-1 with a choice of detectors
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Product
TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Product
UV-VIS-NIR Spectrometer
OES-Star
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Horiba’s OEM division, a major supplier of OES solutions, has developed a high end OES Spectrometer with a proprietary optical configuration for broad coverage (185-1050 nm) and high resolution. The OES-Star is available with a selection of three UV-VIS-NIR Back-Illuminated (B.I.) sensors, one TE-Cooled and two uncooled CCD detectors. This unique OES system features an optical design that provides a high peak symmetry across a very broad spectral range combined with high spectral resolution better than 1 nm, at an unmatched aperture of F/2.3.
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Product
WDXRF Spectrometer
Axios FAST
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Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high uptime go hand in hand with a low cost of ownership.
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Product
High Energy Industrial CT X-Ray Inspection System
MeVX Series
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The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
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Product
Spectrometers, Vacuum
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A compact and versatile vacuum ultraviolet monochromator. A selection of aberration-corrected diffraction gratings is available so you can tailor the instrument to your wavelength of interest and application. Connect this instrument directly to your vacuum plasma physics experiment or build an intense UV tunable source. It is available as a scanning monochromator, as a spectrometer, or as a spectrograph with microchannel plate or direct-detection CCD. The Model 234/302 is popular in systems due to its compact design, high throughput and resolution. It is also available with an additional entrance or exit port.
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Product
Compact High Resolution CMOS or CCD Spectrometer
MiniVS70
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MiniVS70 is the latest evolution of the cost-effective high performance family of mini-spectrometers from HORIBA Scientific. This MiniVS70 system for industrial applications uses a modified miniaturized VS70 optical engine which is optimized for the UV-VIS-NIR spectral range. The MiniVS70 is based on a high performance aberration corrected concave grating fitted with a custom order-sorting filter to eliminate higher orders.
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Product
Optical Emission Spectrometers
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Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Product
Handheld Spectrometer
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United Power Research Technology Corporation
The design concept of UPRtek handheld spectrometer is 『All in One - One in All 』, it is mainly focus on lightweight and intuitive design, you may use it standalone, no computer connection needed and check the measurement data immediately. You can also process wireless control measurement through the application of smart devices. In addition, SD card storage function may help you to use the measurement data freely such like process big data analysis on uSpectrum PC software. UPRtek wishes to provide a handheld spectrometer with high flexibility for different kind of places, different use purposes and different usage scenarios to help you work more efficiently.
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Product
Optical Emission Spectrometers
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Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Product
Energy Dispersive X-ray Fluorescence Spectroscopy
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Energy Dispersive X-ray Fluorescence Spectroscopy
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Product
Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer
Simultix 15
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Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
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Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
