X-ray Photoelectron Spectrometers
determine the atomic composition of a surface.
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Product
X-Ray Line Camera
X-Scan C
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Slim, plug-and-play-type, water-resistant X-ray line cameras for harsh industrial environments.
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Product
Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II
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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
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Mid-Focal Length Imaging Spectrometers
iHR Series
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The iHR Series of 320 mm and 550 mm focal length high performance and versatile imaging spectrometers are HORIBA’s most popular and iconic spectrometers. The iHR series is built on decades of experience in spectroscopy and represents the highest quality, performance and versatility of any spectrometers in this class. The iHR 320 and iHR 550 spectrometers are immediately recognizable around the world by their unique shape, the result of a superior optical design. These spectrometers benefit from the highest quality of gratings, also designed and manufactured by HORIBA.
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Modular Spectrometers
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B&W Tek boasts one of the most comprehensive lines of UV, Vis and NIR spectrometer modules on the market. Combined with our wide selection of spectroscopy accessories, we offer you nearly limitless utility. Due to their small form factor and customizable software control systems, fiber optic spectrometers are the ideal choice for both integration into your OEM system and for the laboratory, where you can combine modular products to form a complete solution.
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Product
Multitype ICP Emission Spectrometers
ICPE-9800 Series
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Due to their high detection sensitivity down to ppb levels, ability to analyze a broad 5 to 6-digit range of concentrations, and ability to measure multiple elements simultaneously, ICP emission spectrometers are used in a broad range of fields, such as environmental testing, pharmaceuticals, foods, chemicals, and metals. ICPE-9800 Series of simultaneous ICP atomic emission spectrometers are next-generation systems that offer the superior accuracy necessary to simultaneously and quickly analyze multiple elements regardless of their concentration levels. They also feature user-friendly software that makes analysis easy. Furthermore, the systems reduce analysis costs while providing the highest performance levels in the industry. ICPE-9800 Series systems represent the ultimate in ICP atomic emission spectrometry for environmental, pharmaceutical, food, chemical, metal, and other fields.
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Product
X-ray Inspection System
RTX-113™
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Glenbrook’s RTX-113 is designed for heavy production environments where X-ray is used to inspect PCBs and assembled PCBs containing advanced components such as BGA, micro BGA, QFN and other devices.
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Product
ICP-OES Spectrometers
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ICP-OES spectrometers measure the concentration of elements from ppb to % using de-excitation of atoms and ions in a plasma. The robustness of our Ultima ICP spectrometers makes them ideal for applications common to mining, chemicals manufacture, salt production, wear metals in oil analysis, petrochemical, metallurgical production and precious metal refining.
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Product
StellarNet Spectrometer Models
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StellarNet miniature spectrometers are portable & compact fiber optic instruments for UV, VIS, and NIR measurements in the 190-2300nm range. The StellarNet series of miniature spectrometers is a step up in low cost instrument design, offering CCD 2048 & PDA 512/1024 detectors. The units are engineered to have no moving parts, no detector sockets, ruggedized aluminum enclosure, and an integrated A/D digitizer for unmatched durability and quality that out performs any instrument in its class. Numerous models offer standard or high resolution (HR) optics for selected spectral ranges.
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Product
TAPPIR Femtosecond Transient Absorption Pump-Probe Infrared Spectrometer
TAPPIR
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A femtosecond difference frequency generator (DFG) is installed inside the TAPPIR optical unit for the tunable probe of transient absorption within 3 mm - 11 mm. DFG is pumped with signal and idler waves delivered together from an external optical parametric amplifier.
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Ultra-High Resolution Spectrometers
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Fabry-Pérot interferometers are optical resonators used for high-resolution spectroscopy. They use the phenomenon of multiple-beam interference that results when light shines through a cavity bounded by two reflective parallel surfaces. When the light hits one of the surfaces, some is transmitted out, and the remaining part is reflected back. Fabry-Pérot produces a circular fringe pattern, similar to the Michelson pattern. However, the fringes are thinning, brighter, and more widely spaced. As a result, these instruments are able to detect and resolve the fine features of a transmission spectrum with high precision.
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Product
Real Time X-Ray Imaging
GO-SCAN C-VIEW
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Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
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Product
Nano-focus X-ray Inspection System
X-eye NF120
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Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Product
Portable Spectrometers
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*Quick search and detection of gamma radiation sources with radionuclide identification*Measurement of gamma radiation ambient dose equivalent rate
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Product
X-Ray Fluorescence Analyzer
MESA-50
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HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Product
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
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Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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Product
UV-VIS-NIR Spectrometer
OES-Star
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Horiba’s OEM division, a major supplier of OES solutions, has developed a high end OES Spectrometer with a proprietary optical configuration for broad coverage (185-1050 nm) and high resolution. The OES-Star is available with a selection of three UV-VIS-NIR Back-Illuminated (B.I.) sensors, one TE-Cooled and two uncooled CCD detectors. This unique OES system features an optical design that provides a high peak symmetry across a very broad spectral range combined with high spectral resolution better than 1 nm, at an unmatched aperture of F/2.3.
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Product
Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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Product
mm-wave Bridges for EPR/NMR Spectrometers
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ELVA-1 produces mm-wave bridges and components for EPR spectrometers. Lots of scientific laboratories in the world use ELVA-1’s products in their EPR experiments. Up to 170 GHz operating frequency
