Test Program Set Development
provides set of UUT specific documentation, programming and interface.
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Capacitance Tan-Delta Test Set
Since our establishment in the year 1975, we have been engaged in manufacturing and exporting Capacitance Tan-Delta Test Set. This test set is extensively used to measure dissipation and capacitance of various equipment. Manufactured at our well-equipped manufacturing unit as per set international quality standards using supreme quality components, this test set is tested thoroughly by our quality analysts on various defined parameters. Offered Capacitance Tan-Delta Test Set can be purchased from us at pocket-friendly prices.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Primary Injection Test Set
T1000
T1000 primary injection test set is the model featured with light weight and 2 minutes continuous output time at 1000Aac.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Hardware Development Services
We design and build customer-specific hardware components adapted to your specific requirements. Moreover, a variety of standardized products have evolved from our developments in this area which can be used in your projects with minimal effort.
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PathWave Test Executive For Manufacturing Developer Version
KS8328A
PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Missile Warning System Test Set
Baringa™ IR/UV
Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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O.N.E. for Development
"O.N.E. for Development" goes beyond pure data exchange features of a generic middleware. The platform provides:- Deterministic data exchange- Distributed scheduling- Native tooling- Cloud support- Real-time capability- Many HW/SW InterfacesIt has been extensively used in in testing & validation applications within aerospace and automotive industries.
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Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Test Program Sets (TPS)
Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Development System
FE-W7
* Emulates Winbond W77xxx or W78xxx Microcontrollers * 125K Code Memory * Real-Time Emulation * Frequency up to fmax at 1.8V to 5.5V * Wide Supply Voltage Support * MS-Windows Debugger For C And Assembler * Emulation Headers for PLCC, QFP and DIP * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Radar Altimeter Test Set
EA-6061
The EA-6061 Radar Altimeter Test Set is designed to test and calibrate any and all radar altimeter systems regardless of protocol or encryption. The EA6061 provides multiple, programmable delays with front panel and/or remote computer control. It features ultra wide bandwidth, low loss, high isolation, and high dynamic range. Able to simulate altitudes up to 6350 feet, the test set operates from 4 to 5 GHz and offers NIST traceable altitude accuracy up to 2 inches
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Special Development AFM Tips ...
AFM Cantilevers and material variations. Ultra-Short AFM Cantilevers: 1) Ultra-Short Tipless AFM Cantilevers 11 (for High Speed Scanning). Diverse (AFM related)
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LabVIEW & Software Development
We are a National Instruments Gold Alliance Partner and our software engineers are NI Certified LabVIEW Developers. We have successfully delivered hundreds of LabVIEW applications either as custom software applications or integrated with hardware instruments and delivered as turnkey systems.
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Universal Test Set
UTS
The Universal Test Set (UTS) is a portable, battery-powered, programmable, ruggedized radio frequency test set designed to validate improvised explosive device (IED) jamming equipment. Our unit is intended to provide an in-field confidence testing for warfighters employing IED jammers prior to departure.
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Universal Test Set for Recloser Controls
ARCO 400
ARCO 400 is a smart and rugged testing solution for all recloser controls. It provides the fastest way to perform simple manual trip and close checks. Using the OMICRON Smart Connect technology, ARCO 400 is capable of detecting recloser specific test adapters.
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Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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High-Level Application Development Kit
dVeloper
dVeloper Foundation SDK is a high-level application development kit that includes libraries for image acquisition, camera and I/O control, and real-time image processing. It is a comprehensive set of optimized functions designed specifically for all dPict Imaging hardware products, providing for easy porting across any hardware or application. dVeloper Foundation SDK comes with extensive samples and documentation to for quick and easy application development.
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Rapid Test Development
TestEZ® Development Suite
Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Development Platform
NFC/WLC
CISC is offering various technology elements to support the design of NFC-based WLC (wireless charging). These pre-tested hardware modules including various antenna sizes, firmware, and software support customers to quickly have available solutions for their requirements. Customization helps in particular for very challenging application requirements. Customers benefit from very fast time to market for WLC solutions.
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Optical Talk Set
TW4103
Techwin(China) Industry Co., Ltd
Full-duplex digital communication with high quality conversation connection and low background noiseTogether with Optical Clip-on Coupler, enables on line communications availableCombining functions of both a digital optical phone call and a stabilized light source.Large LCD display with backlightLow battery power indicationApplicationsMaintenance in TelecomMaintenance CATVTest Lab of optical fibersOther Fiber Optic Measurements
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The Cyberbit Skill Development Platform
Cyberbit is the only platform that delivers the entire cyber skilling spectrum, on-demand, in coherent learning paths, validating your team’s performance and progress along the way.
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Distortion Test Sets
DTS-C
Matrix Test Equipment Incorporated
The Model DTS Distortion Test Sets combine Matrix products with those of other manufacturers. When properly equipped, a Model DTS can measure virtually any parameter important to the CATV industry. Controlled completely through the (GPIB) IEEE-488 bus interface, a Model DTS allows rapid, repetitive, and objective readings in a production-type environment.
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CAPACITANCE & TAN-DELTA TEST SET FOR HV EQUIPMENT
International Biological Laboratories
Capacitance & Tan-Delta Measuring Equipment along with its accessories is suitable for testing motors, Power Transformers, H.V. Bushings, Generators, Power Capacitors, cables etc. at power frequency.
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Relay Test Set
Widely used in electrical and power sector for testing relays, these equipments are offered to clients in different technical specifications.
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Test Set
TS® 19
The Fluke Networks TS19 Test Set combines all the essential test set features at an affordable price. This test set was specifically designed for in-house telecom technicians. Its high impedance monitor prevents accidental disruption of service from clipping onto a data line while in monitor mode, thus ensuring the integrity of critical data lines.
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Combined High Voltage Test Set
is extensively used to measure AC and DC voltage of different electrical devices.
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Secondary Injection Test Set
PTE-100-C Plus
In the Pro version this voltage source incorporates a dedicated LCD display and its own BUS-PTE connection that make the operation easier and enable it to be used also with other sets in the PTE range.
