Switch Test
Make, break, or change the connection of a circuit.
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Switch PXI Solid-State Switch Module, 6xSPST, 25 A, 100 V
40-184A-001
The 40-184A-001 has 6-off high current SPST switches in two PXI slots and is part of our range of high power solid state switching solutions. Each SPST switch uses a fully isolated solid-state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation.
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PXI/PXIe Microwave Transfer Switch, Dual, 40 GHz, 50 Ω, SMA-2.9, Failsafe
42-782B-542
The 40-782B-542 (PXI) and 42-782B-542 (PXIe) dual failsafe transfer switches are part of our range of PXI microwave switching modules. They have a characteristic impedance of 50 Ω and a maximum operating frequency of 40 GHz. Connections are made via front panel mounted high quality SMA-2.9 coaxial connectors.
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PXI-2598, 26.5 GHz, 50 Ω, Dual-Transfer PXI Transfer Switch Module
778572-98
26.5 GHz, 50 Ω, Dual-Transfer PXI Transfer Switch Module—The PXI‑2598 is a general-purpose switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2598 is also well suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking to predict relay lifetime and reduce unexpected system downtime.
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PXI Solid-State SPST Switch, 6-Channel 25A 100V
40-184-001
This range of PXI high power switches support 6-off high current SPST switches into two PXI slots or 3-off high current SPST switches into one PXI slot. Each SPST switch uses a fully isolated solid-state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each PXI solid-state SPST switch can support 25A of continuous current and switch up to 100V signals. The switch can sustain inrush currents of up to 90A. AC or DC signals can be switched since the switch is polarity insensitive.
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LXI High Voltage Switching - 10xSPST Plugin Module
65-233-904-HI
The 65-233-904-HI plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 9 kV.
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ARINC-429 Module
M4K429RTx
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode, 9/125 Fiber, MU Connectors, With Interlock
42-860A-332-HI
The 40/42-860A-332-HI is a PXI/PXIe triple insert/bypass switch with MU connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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General Purpose Switching System
LX Series
The LX Series matrices are reliable, low cost, and versatile switching systems. A modular design concept is used. Interchangeable control modules, switch modules, and display modules can be assembled into matrices, multiplexers, or individual switch point configurations. All chassis have full front panel LED displays. Status feedback from all switches is provided.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Dielectric Material Test Fixture
16453A
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-H180-1
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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20 Channel Actuator/GP Switch Module for 34970A/34972A
34903A
The Keysight 34903A is a general-purpose switch module for the 34970A/34972A Data Acquisition/Switch Unit. It has 20 independent single-pole, double-throw (SPDT) relays and is used to cycle power to products under test, control indicator and status lights, and to actuate external power relays and solenoids. Combine it with matrix and multiplexer modules to build custom switch systems. Its 300 V, 1 A contacts can handle up to 50 W, enough for many power line switching applications.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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12-Ch SPST 4A-250VAC 24VDC High Current Power Switching
YAV90PIN
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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PXI Source Switching Module
40-618-001
The 40-618 PXI Source Switching Module consists of 12 separate 4-channel multiplexers and 44 uncommitted SPST relay contacts in a single width PXI module. Typical applications include signal routing for avionics test systems that conform to the ARINC 608A specification.
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96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 0.5m
150275-0R5
96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 0.5m - The SH96F-96M SwitchBlock SCSI Cable provides connectivity for SwitchBlock modules. You can connect these to the TBX-2809 Terminal Block, which exposes each channel of the switch module to screw terminals.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Ultra High Density Matrix Switch Card
1260-45
The Astronics 1260-45 offers the highest-density switching matrices in a single-slot C-size VXI module, configurable as 11 different matrices from four 4x16 2-Wire to one 16x16 two-wire. Easily extend this module externally to build a larger matrix in a single VXI chassis to satisfy even the most dense applications.
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PXI 4 x Changeover Switch 1GHz, 75 SMB
40-710-754
Model 40-710 RF switching card has a bank of 4 individual high performance RF changeover switches (50 or 75 Ohm, Bi-directional) with very low insertion loss, suitable for handling signals up to 2.5GHz. Applications include aerial switching, routing high frequency signals into oscilloscopes and analysers.Available with a choice of connectors: SMA, SMB and Siemens 1.0/2.3 versions. BNC versions are also available with reduced bandwidth and 2 PXI slot occupancy.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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2X8 USB Solid State Switch Matrix, 300 KHz To 9 GHz
P9165B
P9165B 2X8 USB solid state switch matrix, 300 KHz to 9 GHz is a full cross-bar switch matrix that provides a switch based multiport VNA solution in the form of compact USB controlled involving larger scale of multi-DUT or multiport measurements such as 5G massive MIMO antenna measurement and others.
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Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.





























