Silicon
atomic number 14 tetravalent metalloid chemical element.
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Product
3μm Silicon Interdigitated Electrode (IDE)
SIE1
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3 μm silicon-based interdigitated electrode (IDE) designed for MEMS sensors, gas sensing, biosensing, photoelectric detection, and electrochemical research. Fabricated using precision microfabrication on a silicon substrate, with customizable electrode materials, dimensions, and layouts for laboratory and OEM applications.
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Product
Ka-Band Silicon 5G Quad Core IC
AWMF-0108
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The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Product
Silicon Carbide Diodes
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In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Product
Quick Silicon Discriminator
HS-QSD
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HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting,it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Product
Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Product
Silicon Irradiance Sensors
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Measure the irradiance intensity on your photovoltaics system precisely at an affordable price with IMT Technology’s robust silicon solar irradiance sensors (Si sensors).
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Product
Silicon Based Thermopile Detector: 4 Channels
ST150 Quad
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A four-channel silicon-based thermopile detector in a TO-8 package. Each active area size is 1.5mm x 1.5mm. Affordable four-channel design with strong output and a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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Product
Silicon Diodes
DT-670 Series
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DT-670 Series silicon diodes offer better accuracy over a wider temperature range than any previously marketed silicon diodes. Conforming to the Curve DT-670 standard voltage versus temperature response curve, sensors within the DT-670 series are interchangeable and, for many applications, do not require individual calibration. DT-670 sensors in the SD package are available in four tolerance bands—three for general cryogenic use across the 1.4 K to 500 K temperature range and one that offers superior accuracy for applications from 30 K to room temperature. DT-670 sensors also come in a seventh tolerance band, B and E, which are available only as bare die. For applications requiring greater accuracy, DT-670-SD diodes are available with calibration across the full 1.4 K to 500 K temperature range.
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Product
X-Band Silicon Radar Quad Core IC
AWS-0104
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The AWS-0104 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and single beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain during transmit mode, 21dB gain in receive mode, +15 dBm output power during transmit, and 3.4 dB NF during receive. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 QFN for easy installation in planar phased array antennas.
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Product
Silicon Detectors
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Through the photovoltaic effect, detectors provide a means of transforming light energy to an electrical current. The root of the theory behind this phenomenon is a small energy gap between the valence and conduction bands of the detector. When light, with enough energy to excite an electron from the valence to the conduction band, is incident upon the detector, the resulting accumulation of charge leads to a flow of current in an external circuit. Since light is not the only source of energy that can excite an electron, detectors will have some amount of current that is not representative of incident light. For example, fluctuations in thermal energy can easily be mistaken for light intensity changes. A variety of these "non-light" contributions are present and, when summed up, make up the total noise within the detector.
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Product
3μm Silicon Interdigitated Electrode (IDE)
EAP1
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Silicon IDE chip with a 3μm gap for MEMS, biosensing, gas sensing, and electrochemical applications.
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Product
Silicon Pyranometer
LPSILICON-PYRA04
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Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Product
Silicon Phosphor and Boron Analyze system
HS-ICP-MS
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The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
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Product
X-Band Silicon Radar Quad Core IC
AWS-0103
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The AWS-0103 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain and +15 dBm output power during transmit mode and 7 dB gain and +7 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Product
Pyranometer with Silicon Photodiode
LP471SILICONPYRA
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Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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Product
Super Silicon Resistivity and Type Tester
HS-3FC II
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Super Silicon Resistivity and Type Tester is specially designed for silicon sorting,it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Product
Capacitors - DC Floating/RF Bypass Mounting
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Macom Technology Solutions Holdings Inc.
MACOM’s Mounting Capacitors are designed for transient protection for MICs and FETs. Since the capacitor substrate is silicon, it provides an optimum match both thermally and mechanically with the device to be mounted. A wide range of sizes and capacitance values are available as standard products. Our design flexibility allows MACOM to offer a variety of size and capacitance options for specific customer requirements.
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Product
Layer Release Systems
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EVG's IR LayerRelease Technology is a fully front-end-compatible layer release technology that features an infrared (IR) laser that can pass through silicon, which is transparent to the IR laser wavelength. Coupled with the use of specially formulated inorganic layers, this technology enables an IR laser-initiated release of any ultra-thin film or layer from silicon carriers with nanometer precision.
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Energy Meters
Rj-7600
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The Rj-7610 Single Channel Energy Meter works with a variety of probes – pyroelectric, silicon, and thermopile – to measure true energy per pulse from single-shot to 40 Hz, picojoules to Joules, UV to far-IR. Sets of 10 or 100 pulses can be statistically analyzed (mean, minimum, and maximum energies, standard deviation), and data can be transferred to computer via the IEEE-488 GPIB computer interface or using the 0-10 VDC analog outout.
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Product
Wireless Protocols for 2.4 GHz and Sub-GHz
Proprietary
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Silicon Labs' proprietary wireless devices provide high-performance wireless connectivity and ultra-low power 8-bit and 32-bit microcontroller options. With support for major frequency bands in the 142 to 1050 MHz range and 2.4 GHz these devices can be used to develop many classes of Internet of Things (IoT) systems.
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High-Voltage DC Power Supplies
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Higher-voltage and Higher-power Supplies require more complex design solutions. The heat to be dissipated and installation infrastructure, plus choice of insulation system in a HVPS are driven by the output voltage and output power which ultimately dictates packaging. Typical insulation systems are based on air, dielectric oil, epoxy, RTV Silicone and even Sulfur Hexafluoride (SF6). The method of cooling is a factor as well, the choices often coming down to air, water or oil, depending on the platform design requirements. These applications require Excelitas' detailed understanding to help choose the best design solution.
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Product
USB Connectivity Bridges
USBXpress
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Silicon Labs USBXpress devices are highly optimized solutions that enable designers to easily add USB to existing and new applications. These fixed function devices provide the easiest method to add USB without the need for any firmware or driver development. USBxpress portfolio supports several USB to serial bridge devices including human interface (HID) devices and USB Audio devices.
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Product
High Level Language Debugger and Emulator Tool
Universal Debug Engine
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Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Product
Semiconductor Technology, Micro Scriber
Precision Micro Diamond Scriber MR200
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Optik Elektronik Gerätetechnik GmbH
Precision micro diamond scriber MR 200 for exact manual scribing for defined cutting of structured silicon wafers.
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Product
Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Product
Ethernet MACsec PHY
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Macom Technology Solutions Holdings Inc.
IEEE 802.1AE Media Access Control Security (MACsec) is an industry standard security technology that provides secure communication for Ethernet traffic. MACOM’s wire-speed Ethernet MACsec PHY products offer highly scalable and cost-effective encryption solutions to address the data security issues in wireless, carrier, data center and cloud networks. Combining MACOM’s strength in high speed, high performance mixed-signal I/O and industry leading CMOS silicon technology, MACOM’s MACsec PHY products provide line-rate encryption and authentication at a very low power-footprint that enables encryption at wire-speed on every port. They are ideal for adoption on switch/router line cards, data center interconnect (DCI) transponder and wireless xHaul aggregation systems to provide security function in addition to the connectivity to optical and copper modules.
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Product
Fully Compliant ASi-5 Transceiver ASSP
ASI4U-V5
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The ASI4U-V5 is the industry’s first silicon solution to fulfill the ASi-5 (Actuator-Sensor-Interface version 5) standard for industrial network equipment that enables comprehensive Industry 4.0 applications. The ASI4U-V5 ASSP comes with a completely verified and field-proven firmware that fully implements ASi-5. Hence, integration of ASi-5 into any application is very easy, as the complexity of the fieldbus is hidden by the chip and the firmware.
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Product
Flying Probe Test Programming & Testing Services
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Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.





























