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Product
Life Sciences Applications
LS-AFM
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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
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Life Science Microscope
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Our product range includes a wide range of smart life science microscope, excel life science microscope, select binocular microscope, crown trinocular life science microscope, classic life science trinocular microscope and premium trinocular microscope.
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Life Science Instrumentation
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With a wide spectrum of Teledyne technologies such as high-performance cameras, sensors, automation and pumps, OEM solutions serves the vast Life Science industry in many ways.
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Life Cycle & Fatigue Testers
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Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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Product
Laser Diode Life Test
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Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Full-Featured Life Cycle Test System
LCV
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Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Highly Accelerated Life (HALT) Test
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HALT consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated life testing is performed to identify design weaknesses and problems prior to production. HALT subjects equipment to overstress conditions at a level which does affect life, but offers an advantage by reducing the design and development phases of a program.
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Product
High Temperature Operating Life
7000 Series
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With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Product
IoT Battery Life Optimization Solution
X8712A
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The Keysight X8712A is an IoT battery-life-optimization solution that consists of a DC power analyzer, 20 W or 80 W battery drain analyzer source/measure unit (SMU) modules, RF event detector, and dedicated software in one integrated solution.
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Minority Carrier Life Time System
MWR-SIM
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MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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Product
Rotary Switch Life Tester
CX-1
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Shenzhen Chuangxin Instruments Co., Ltd.
1: The CX-1 Rotary Switch Life Tester is strictly designed according to IEC60669-1, IEC61058-1, GB15092-1-2003 and GB15092.1 Standard. It's mainly used to test the service life of household and similar switch equipment products. 2: This rotary switch life tester connected to the power load cabinet and conduct electrical life test, normal operation and breaking capacity test of the rotary switch. 3: The rotary switch life tester is mainly used to test the all kinds switch
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Stability and Shelf Life Test Chambers / Rooms
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Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
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Long Life Serismic Energy Source
2800LLX
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Bolt introduced the LONG-LIFE air gun in 1992. Since then it has become the standard energy source for marine seismic exploration.
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Life Sciences
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Life science is defined as all sciences ranging from biology, chemistry, environmental science and physics. More specifically, life sciences consist of companies in the fields of biotechnology, pharmaceuticals, biomedical technologies, life systems technologies, nutraceuticals, cosmeceuticals, food processing, environmental, biomedical devices, and organizations and institutions that devotes most of their efforts in the various stages of research, development, technology transfer and commercialization.
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Low Temperature Operating Life (LTOL) Test
LTOL
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LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Spectrophotometer For Life Science
BioSpec-nano
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Capable of performing quantitation and purity checking of nucleic acids, quantitation of proteins, and photometric measurements (OD values displayed and printed for specified wavelengths, up to 8 wavelengths). Simply drop 1 to 2 μL of the sample onto the measurement window and press the instrument's Start button (or click the Start Measurement button in the software window), and all steps in the process, from setting the optical path length, measurement, up until the task of wiping off the sample from the measurement window, are all carried out automatically. Troublesome work of moving arm up and down and wiping the sample from the measurement window now unnecessary. Moreover, when using the specialized software, all it takes to perform a measurement, output a report, export data, or carry out other common tasks is to click buttons on the toolbar.
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HALT – Highly Accelerated Life Test
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HALT is a process used on electronic assemblies and modules to determine weaknesses and the stress limits of a product by temperature cycling and omni-axial random vibration step stress. Inherent weaknesses in a products design and build are stimulated by applying increasing levels of mechanical stress. Within an accelerated timescale, faults in a product can be realised prior to product release and preventing failures occurring during after-sale user operation, very often during the warranty period.
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Accelerated Product Life Cycle
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Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Long Life Seismic Energy Source
1900LLX-T
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Output volume of 10 cubic inches to 250 cubic inches. Light weight enough for shallow draught vesselsPowerful enough for blue water seismic surveys. Available with engineered seals for more robust performance.
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Aging and Life Test Rack
SY2036
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SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Point Source
RL Series
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From the very outset, Redline was designed for you, the live audio professional. From corporate events to festivals, every aspect of the design has been targeted at making your life easier. From enclosure handling and fitments to acoustical and electronic components, Redline is built to live as you do: with demanding clients, tight schedules and even tighter budgets.
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Replaceable General Purpose Probe
MEP-30
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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PXI Hybrid Coaxial Switch: DC to 40 GHz, Dual Transfer
M9156CH40
Switch Module
The Keysight M9156CH40 PXI hybrid dual transfer switch module provides an exceptional 0.03 dB insertion loss repeatability, high isolation, low SWR with a long operating life up to 10 million cycles.
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25I15-12
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Debug Adapters
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One thing is sure in the life of an embedded developer - your next microcontroller development board will be fitted with a different debug connector to the one used in your previous design.
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Standard 6.13 (174.00) - 16.00 (456.00) General Purpose Probe
EPA-5E
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Product
3-Phase Current Meter With 3 X 75A Clamp-On CT
EVA-2210
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LoRaWAN® wireless connectivity3 x 75A Clamp-On CTBattery life up till 3.5 years@25 °C, 60 mins interval settingEasy to deploy and maintain
