Filter Results By:




Silicon Drift Detectors

measure X-ray radiation energy at high resolution. AKA: SDD

See Also: SDD, Energy Dispersive X-ray Fluorescence

Showing product results. 1 - 11 of 11 products found.

  • Silicon Drift Detector

    Octane Elite (SDD) Series - EDAX

    The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.

  • FAST SDD and C2 Window

    EDS (SEM) Applications - Amptek Inc.

    Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

  • Micro-XRF spectrometer

    Atlas™ - IXRF Sytems, Inc.

    The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.

  • TEAM EDS Analysis System for TEM


    TEAM EDS Analysis System featuring the Octane Silicon Drift Detector (SDD) Series for Transmission Electron Microscope (TEM) provides the ultimate analytical solution for TEM. The systems are offered for TEMs and STEMs with Smart Features to make them more intuitive and easier to use. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, analysis, and reporting are easy because the TEAM EDS software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.

  • X-ray Fluorescence Measuring Instrument

    FISCHERSCOPE XAN 220 - Helmut Fischer AG

    Optimized for non-destructive analysis of jewelry, coins and precious metalsFixed aperture and fixed filter; thus particularly suited for precious metal analysisWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning

  • X-ray Fluorescence Measuring Instrument

    FISCHERSCOPE X-RAY/XAN 250 - Helmut Fischer AG

    Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning

  • XRF

    L Series - Bowman

    The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.

  • Bias Boards

    CUBE - XGLab S.R.L.

    The CUBE Bias Boards are a set of off-the-shelf biasing boards developed to speed-up the integration process of the CUBE CMOS preamplifier family of XGLab. These boards allow to bias both the detector (SDD as standard, other detector upon request) and the CUBE preamplifier.

  • Energy Dispersive Spectroscopy (EDS) Detector Technology

    EDS - EDAX

    The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.

  • Portable EDXRF Analyzer

    ElvaX Mobile - Elvatech Ltd.

    ElvaX Mobile is a portable EDXRF analyzer for testing all kinds of materials. Sampling tray as in a benchtop instrument allows for convenient placement of x-cells. High resolution SDD detector and the absence of collimators ensure high count rate, which is crucial for quick detection of trace elements.

Get Help