3-Axis Hall Probe L
The fully integrated 3-axis Hall Probe of the type LXS is engineered for optimal performance in measuring magnetic fields. With dimensions measuring at just 1.85 x 0.66 x 0.10 mm for the naked silicon chip, it's designed to provide high spatial resolution, making it ideal for applications necessitating close proximity measurements to test subjects. Notably thin, the probe also features an ultra-thin tip of 0.1 mm and a probe body thickness of 0.5 mm, ensuring efficient operation in narrow gaps where traditional probes may struggle.
The LXs Hall Probe offers versatile solutions with three distinct lengths: the long version (LLs) at 71 mm, medium (LMs) at 47 mm, and small (LSs) at 8 mm. The device is equipped to output real-time analog voltages for all three magnetic field components (Bx, By, Bz) while simultaneously monitoring the probe's temperature, which is critical for high-precision applications. The advanced CMOS technology embedded within the probe ensures the orthogonality error remains below 1°, resulting in unparalleled measurement accuracy, making the Hall Probe an essential tool for those demanding exactitude in magnetic field analysis.
