Optical Metrology System
BENCHMARK 300 - VIEW Micro-Metrology (VIEW)
The VIEW Benchmark™ 300 is engineered for high performance and reliability in a floor model package. Advanced optics, illumination, image processing, and available Continuous Image Capture make VIEW Benchmark a world-class metrology system.
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High Accuracy Dimensional Metrology System
Pinnacle 250 - VIEW Micro-Metrology
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Critical Dimension Measurement System
MicroLine® Series - VIEW Micro-Metrology
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Compact General-Purpose Metrology System
Benchmark 250 - VIEW Micro-Metrology
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Compact Design Measurement System
Benchmark 450 - VIEW Micro-Metrology
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Dimensional Metrology System
PINNACLE PLUS - VIEW Micro-Metrology
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Dimensional Measurement System
MICROLINE AF - VIEW Micro-Metrology