Compact Design Measurement System
Benchmark 450 - VIEW Micro-Metrology (VIEW)
The Benchmark's fixed bridge design separates the X and Y axis motions, allowing each to operate without any influence on the other. This arrangement provides the maximum mechanical integrity and accuracy in the stage motion. The bridge type design also makes loading and unloading of large parts more efficient, and helps to minimize the overall footprint of the system.
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High Accuracy Dimensional Metrology System
Pinnacle 250 - VIEW Micro-Metrology
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Critical Dimension Measurement System
MicroLine® Series - VIEW Micro-Metrology
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Compact General-Purpose Metrology System
Benchmark 250 - VIEW Micro-Metrology
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Optical Metrology System
BENCHMARK 300 - VIEW Micro-Metrology
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Dimensional Metrology System
PINNACLE PLUS - VIEW Micro-Metrology
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Dimensional Measurement System
MICROLINE AF - VIEW Micro-Metrology