Functional Probe Cards
STAr's functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
STAr's functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
