3-Axis Hall Probe K
Introducing the 3-axis Hall Probe K, engineered for advanced measurement and high performance in magnetic field detection. This highly integrated Hall probe utilizes a naked Silicon chip mounted on an alumina ceramic substrate, offering exceptional durability and precision. With two thickness options—0.5 mm for ultra-thin applications and 0.75 mm for enhanced robustness—and three length choices (71 mm, 47 mm, and 8 mm), this probe is versatile enough to accommodate a range of environments and requirements in both analog and digital magnetic field transducers.
The K series Hall Probe incorporates state-of-the-art CMOS technology, enabling high spatial resolution and accuracy with the capability to measure all three magnetic field components (Bx, By, Bz) simultaneously. The device outputs high-level voltages proportional to the detected magnetic fields and includes a built-in temperature sensor. With an angular accuracy of less than ±1° and frequency bandwidth support from DC to 25 kHz, the probe ensures precise measurements with minimal interference, making it an ideal choice for applications requiring reliable and accurate magnetic field sensing.
