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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Design-for-Test
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As designs move to smaller and more complex process technologies, ensuring devices are thoroughly tested becomes a bigger challenge. Mentor Graphics provides whole-chip test solutions that can help improve test -- and, therefore, device -- quality as well as control, or even reduce, the cost of test.
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PCB Test And Design-For-Test Services Group
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ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Testing Multi-Radio Mobile Devices
IQxstream
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With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Walk-In Solar Spectrum Test Chamber
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WEIBER walk in Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. It is also called Walk in Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Solar spectrum chamber also known as Walk in Solar Simulation Test Chamber
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Electrical Protective Equipment Test Systems
СВС-50М (СВС-100М)
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CBC-M-series systems are designed for high-voltage testing of electrical protective equipment and insulated hand tools. Withstand tests are carried out with AC voltage (CBC-50M: UAC ≤ 50 kVRMS; CBC-100M: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 255 Ohm
40-294-013
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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ACCUplace Position Grid
AP-P Series
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The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
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VDV & USB Cable Tester
PK-2016/2016R
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The VDV & USB cable tester is designed for testing today’s media computer networks which combination of telephone USOC (voice), twisted pair (data) and coax security / alarm (video) as well as PC-USB 2.0 3.0 cables.
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Radar Altimieter Test Panel for ALT-50/55
TA-55
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Radar altimeter panel designed after the ALT-50A test fixture. (Ref. Fig. 5-1). Panel allows testing of the indicator or R/T independently or together. An internal power supply is provided to support stand alone testing of the indicator. This panel contains a 4 digit DVM and comes with enclosure. This panel will allow by the book testing.
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Hipot & Electrical Safety Testers
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Vitrek manufactures two different series of hipot and electrical safety testers. These testers have been designed to fit your testing application. Each series offers 6 different models with a wide variety of test functions and capabilities.
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Digital Earth Resistance Testers
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This groundmeter is designed for testing ground wire of electric power net, as well as earth voltage test in the fields of household electric power system and delectric appliance application.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 63.7 Ohm - SPST
40-294-111
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Resistor Module 2-Channel 1.5R to 1.02k with SPDT
40-293-121
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Rebound Hammer
Schmidt OS-120PM
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The Schmidt OS-120 Pendulum Hammers are designed to test on softer material such as light weight concrete, gypsum boards, fresh concrete and the mortar of joints in brickwork. Their unique design allows easy to handle measurements on vertical and horizontal surfaces.
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Advanced Power System - DC Power Supply, 80 V, 25 A, 2000 W
N6974A
DC Power Supply
The N6974A is designed for automated test equipment (ATE) applications where high performance is critical.
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Gyro Test Panel
TA-256
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Designed to test the KI256 / KI258 panel mounted Flight Director gyros. The panel contains a power supply, the special manufacturers recommended rate board required by SA-103 to properly verify outputs As well as all other electronics required to support by the book testing.
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PCI Resistor Card 2-Channel 1.5 Ohm To 8.19k Ohm
50-293-024
Programmable Resistor Module
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Board Test Fixture Probes
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Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Dial Torque Screwdrivers
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A dial measuring torque screwdriver is designed for torque testing and torque verification. It is a versatile tool that is utilized for torque auditing and product evaluation. It can be used to monitor torque as it increases or decreases or display peak torque applied. The dial screwdriver is used in two common torque verification tests. One is the first movement test and the second is the loosening test. The screwdriver is standard instrument in engineer’s tool kit.
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Harmonic Filter Resistors
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Post Glover designs, builds and tests their harmonic filter resistors in accordance with applicable IEC and IEEE standards to guarantee their performance. With no two installations ever being the same, our experienced engineers develop the proper solution for your particular application and environment. Our low inductance designs are built using all stainless steel elements in corrosion resistant enclosures chosen for your unique specification. Request a quote for your custom harmonic filter resistor.
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Telecommunications
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TELETEL combines its communication and information systems expertise with its strengths in analogue and digital circuit design to develop products suitable for telecommunication, military and industrial applications. TELETEL's products exist in more than 20 countries in Europe, America and Asia. Every module on TELETEL's product line is designed, developed and tested to meet the increasing demands of today's technology for higher transmission speeds and enhanced system performance.
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PXI Resistor Module 2-Channel 1.5R to 2.04k with SPDT
40-293-122
Programmable Resistor Module
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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8 CHANNELS ARINC 429 Simulator Analyzer Tester
CIC429
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The CIC429 is a full featured, high performance Serial bus Simulator Analyzer Tester developed by Andor Design for test and simulation of ARINC 429 or similar Avionic buses. The CIC429 is designed as a 5/8 size plug-in card for an ISA bus. An on board microprocessor off loads the host by organizing the data in a predefined structure in the dual port RAM. Programming the CIC429 consists of changing this data, which can be done on the fly for real time applications
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HOT STICKS & PHASING STICKS
HS-15
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Hot Sticks and Phasing Sticks are voltmeters designed so to permit testing of high-voltage lines or bus bars. The meter is conveniently located, and tilted downwards for easy reading to 5% of full scale.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 127 Ohm - SPST
50-294-112
Programmable Resistor Module
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
