Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Product
Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
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This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Product
SINE M-6 Sinusoidal Array
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The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time.The overall size of the array is 70mm x 46mm; centered on an 8.5 inch (215mm) strip of 70mm film, which can also be mounted in glass (TM-G variations) at each modulation (-35, -60, -80).
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Product
USAF Targets
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These targets conform to MIL-STD-150A. Frequencies change by the 6th root of 2. This target is also available in custom sizes and contrasts. This test target meets requirements as specified in MIL-STD-150A for resolving power tests. The target consists of a series of Elements having two sets of lines at right angles. Each set of lines consists of three lines separated by spaces equal to the line width. Each bar has a length to width ratio of 5:1. (Line width is equal to one half of line pitch, which is the inverse of line frequency.) Elements are arranged in groups of six each and Groups are arranged in pairs. Even numbered Groups occupy the left side and bottom right corner and contain a square feature having and edge length equal to the line length of Element 2 in that group. Odd numbered Groups occupy the top right corner and side. Groups and Elements are labeled and differentiated by numbering adjacent to their features. Frequencies in cycles/mm (c/mm) increase between each Element by the sixth root of two (approximately 12.25% per step). The general formula for the line frequency of any target Element can be expressed as 2Group+(Element-1)/6.
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Product
SINE Sinusoidal Vision Demonstration Array
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The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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Product
O.E.M. Optical Standards
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O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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Product
Square Wave Patterns (Ronchi Gratings/Rulings)
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Square Wave patterns (Ronchi Gratings/Rulings) have extremely sharp edges. At APPLIED IMAGE, this sharpness is achieved through our unique manufacturing capabilities and processing technologies which produces the sharpest edges available anywhere. Our standard line of Ronchi Gratings is offered on Chrome on Glass (CG) and Photo Paper (RM).The Ronchi rulings are available on other substrate materials such as B270, quartz, BK-7, and White Opal as well as in English frequency metrics (cycles per inch).
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Product
Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Product
Custom Test Targets & Charts
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Our customers in industries that require camera or scanner image evaluation certainly know the challenges that come from finding the perfect target for a specific system and measurement. Thankfully, we at APPLIED IMAGE know these challenges just as well. The ability to freely customize a target has proved important for our customers to get the image evaluation tools they need. Our sales engineers are experts in different types of targets and specifications that will give you the best results for your project, and will guide you through the process from start to finish.
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Product
SINE M-15-60 Sinusoidal Array
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The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
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Product
Custom Solutions
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We employ a collaborative process that provides our customers with the perfect component. This step-by-step process guides our customers through the creation of totally customized products. Our expert sales engineers take you from conceptual design to prototype, and then final part production, making the process as easy as possible.
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Product
Reticles, Optical Slits, Optical Apertures
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With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Product
Siemens/RIT/Other Targets
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Siemens/RIT/Other Targets by Applied Image - RIT Alphanumeric Chart, Siemens/Star Sector Target, Resolution 2-Cycle Long Test Chart, Sayce Target, Resolution Linear Test Chart, Ultra-High Resolution Target, Digital/Electronic Pixel Target
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Product
ACCUplace Land Pattern Kit
APKIT-1
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APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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Product
SINE FBI Charts
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There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
