HORIBA, Ltd.
The HORIBA Group of worldwide companies provides an extensive array of instruments and systems for applications ranging from automotive R&D, process and environmental monitoring, in-vitro medical diagnostics, semiconductor manufacturing and metrology, to a broad range of scientific R&D and QC measurements.
- +81 75 313 8123
- +81 75 321 0752
- info@horiba.co.jp
- 2, Miyanohigashi,
Kisshoin
Minami-Ku, Kyoto 601-8510
Japan
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Product
Thermal Flow Splitter
FS-3000
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FS-3000 combines HORIBA STEC’s mass flow controller (MFC) and MuCube (Master controller). By controlling MFC from MuCube equipped with the HORIBA STEC’s proprietary control algorithm, FS-3000 achieves stable splitting control.
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Product
OEM Raman Lasers with Wavelength Stabilization
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Only available for volume OEM purchase, minimum order quantity 50 units.
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Product
Hemostasis Analyzer
Yumizen G Range
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As announced during EuroMedLab 2017, we are expanding our commercial offer with new comprehensive range of instruments and reagents in the hemostasis field.
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Product
Versatile Hyperspectral Cathodoluminescence
H-CLUE
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The H-CLUE direct coupled solution offers the ultimate performance for Cathodoluminescence Imaging and Spectroscopy analysis.Embedding field-proven optical components of HORIBA Scientific, H-CLUE overcomes its competition in terms of sensitivity over wide spectral ranges from FUV to extended NIR.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
Fluorometers
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Our Fluorometers can accommodate any size work-area, and are available as compact or benchtop models, or as large modular systems, to suit your requirements. In addition, our Fluorometers can be coupled to become modular Fluorometer systems, or supercontinuum white-light laser-powered lifetime Fluorometers!HORIBA’s Fluorometers offer incredibly fast lifetime determinations down to picoseconds, deep UV absorbance and fluorescence excitation from as short as 200 nm in the UV, all the way to near-IR wavelengths of 1000 nm.
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Product
Bench-top Raman Spectrometer
MacroRAM™
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Bench-top Raman Spectrometer - Best in Class Raman Sensitivity and Software, with Class 1 Laser Safety. The new MacroRAM Raman spectrometer brings simplicity to Raman measurements without compromising the ability to handle even the most complex samples. Its compact and robust design, including Class 1* laser safety means it''''s safe for use in most environments, from undergraduate teaching labs to industrial QC applications.
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Product
Panel-mount Type pH Meter (Four-Wire Transmission, Industrial Time sharing Proportional Control)
HP-480TP
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HP-480 connects pH sensor and measures pH and temperature in the sample water. Suitable for monitoring and control of various production processes and wastewater treatment, etc. Many types of electrodes are available to match the sample properties.HP-480TP is a pH meter with a time sharing proportional control function, making it ideal for tasks such as interval processing in any type of control process.
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Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Reticle/Mask Particle Remover
RP-1
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The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacement cycle of the pellicle and cleaning cycle of the mask, thereby contributing to a reduction in running costs.
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Product
Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
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Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Product
Fingerprint Enhancement Software Suite
ImaQuest
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Designed originally for Fingerprints, the ImaQuest Digital Image Processing Suite is the most comprehensive package of its kind, including the ability to: secure, scale, enhance, track, compare, chart, and print work from multiple investigators and multiple sources.
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Product
Plasma Profiling TOFMS
PP-TOFMS
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Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
