Helmut Fischer AG
"Measuring Made Easy". According to this motto, market leading Helmut Fischer Group has been developing and manufacturing high-precision measuring instruments for coating thickness measurement, material analysis, materials testing and microhardness for industry and laboratories.
- 49 7031 303 0
- mail@helmut-fischer.com
- sales.de@helmut-fischer.com
- Industriestraße 21
Sindelfingen, 71069
Germany
Categories
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product
Nanoindentation Testing in the Micrometer RangeFISCHERSCOPE
FISCHERSCOPE® HM2000
Nanoindentation for professionals. Reliable hardness measuring instrument for determining properties such as indentation hardness and the depth-dependent elastic indenter modulus – and all of that in the nanometer range.
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Measuring Devices For Nanoindentation
With our measuring devices, you can determine the mechanical properties of thin coatings reliably and accurately. From protective paint coatings to hardness of PVD coatings: We have the right solution for you. We offer you powerful and easy-to-use measuring instruments for the laboratory and production. You can choose from a wide range of accessories to adapt your device to your individual requirements.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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Terahertz Systems
Non-destructive and non-contact coating thickness measurement of organic single and multilayer systems as well as material analysis.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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X-ray Optics
Do you want to shape your X-rays to a tiny point? Then our X-ray optics can help you. Benefit from 30 years of know-how in the development and manufacture of customized optical components for demanding applications. Our high-precision optics offer unsurpassed performance and enable the best results in a wide range of applications.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10
The most experienced device in our tactile portfolio – reliably solves all special applications.
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Electrical Conductivity Measuring Instrument
SIGMASCOPE® SMP350
Compact handheld device for measuring the electrical conductivity of non-ferrous metals.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
