X-ray Fluorescence Measuring Instrument

FISCHERSCOPE X-RAY/XDAL - Helmut Fischer AG (Fischer Technology, Inc.)

With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings due to better signal/noise ratiosMicro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.Large and spacious measurement chamber with a cutout(C-slot)Fast, programmable XY-stage with pop-out function