Showing results: 121 - 135 of 150 items found.
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Model 33010 -
Chroma ATE Inc.
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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52403P -
Chroma ATE Inc.
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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33021 -
Chroma ATE Inc.
Max. 48V DC output with 2 channels per card, 12V-48V independently Programable voltage level, Max. 250mA current per channel
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Chroma ATE Inc.
a programmable PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies.
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33011 -
Chroma ATE Inc.
PXI-e based universal relay control for semiconductor load boards, 32CH direct relay drivers, 2 lanes of SPI relay control interface
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33020 -
Chroma ATE Inc.
High channel density with 8 channels per card 6V-12V independently programable voltage level Max. current gang feature providing max. 4A output per card
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8000 -
Chroma ATE Inc.
It is a customized system for Electric Vehicle AC Charging Compatibility testing.Hardware : Integrated by AC Source/Power Meter/DC Source/Function Generator/Scope/ EVSE CP & PD Simulator…。Software : Fully complies with SAE-J1772, CNS15511 test requirements
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8900 -
Chroma ATE Inc.
Low power testSleep mode current testInput overvoltage limit testLine regulation testEfficiency testLoad regulation testOutput ripple voltage testDC-DC load testOvercurrent testPower doen and isolation test
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Chroma ATE Inc.
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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8200 -
Chroma ATE Inc.
Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.
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7505-02 -
Chroma ATE Inc.
The 7505-02 Automated Optical Inspection System is integrated with high speed camera to shoot Roll to Roll manufacturing processes of ITO (Indium Tin Oxide) film, RFID and FPC that is Line-scan Image Inspection System with PC-based structure.
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7945 -
Chroma ATE Inc.
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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58602 -
Chroma ATE Inc.
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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58604 -
Chroma ATE Inc.
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Chroma ATE Inc.
It is a customized system based on Chroma 8000 ATS specializing inverification of EV Supply Equipment (EVSE) and complying with SAE-J1772 in programming the test items for operation.