Chroma ATE Inc.
A world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma".
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Taoyuan City, 333001
Taiwan, Province of China
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Product
Hipot Tester
19070
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Chroma 19070 series are the smallest Hipot Testers currently available in the world. Its super mini size is easy to carry and the large LCD display is suitable for viewing measurement results. These sophisticated hipot testers are most applicable to safety test for electronic components.
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Product
Battery Pack/Module Test Solution
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Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
HiPot Calibrator
Model 9102
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The 9102 Hipot Calibrators is specially designed standard devices for instrument calibration lab. The 9102 can simulate multiple loads and apply to various Hipot testers. These calibration equipment can save manufacturers a great deal of regular calibration fee.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
AC and DC Electronic load
63800 series
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The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.
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Product
Battery Cell Surge Tester
19311
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The Chroma 19311 series battery cell surge tester is designed for testing the insulation quality between the positive and negative plates of the lead-acid battery cell. This is done by applying a high voltage surge/impulse before the electrolyte injection. Its output voltage can reach up to 6kV. It also has four terminal measurement and 200MHz sampling rate. The Chroma 19311 series has single channel (19311) and multi-channel (19311-10) tester.
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Product
Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Product
PCBA Pattern Analyzer
A222918
Analyzer
The test method in the PCBA mainboard production line today mainly depends on the operator judgment. It is "subjective" testing and the accuracy decreased when the operator works for a long time.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
LED Load Simulator
63110A/ 63113A/63115A
Simulator
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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Product
Photovoltaic/Inverter Test & Automation Solutions
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Chroma Photovoltaic/Inverter Test & Automation Solutions
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Product
Solar Array Simulator
62000H-S series
Simulator
The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.






















