Chroma ATE Inc.
Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and test & automation turnkey solutions marketed globally under the brand name "Chroma". Significant markets served by Chroma include semiconductors, photonics, LED, photovoltaics, video & color, flat panel displays, power electronics, passive components, electrical safety, green batteries, electric vehicles, thermoelectrics, automated optical inspection and intelligent manufacturing systems for ICT and cleantech industries.
- +886-3-327-9999
- +886-3-327-8898
- info@chromaate.com
- 88 Wenmao Road
Guishan District
Guishan, Taoyuan 333001
Taiwan, Province of China
Categories
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product
Wi-Fi / Bluetooth / GPS Tester
MP5010
wi-fi, Bluetooth, GPS test capabilities in one box, high speed production tester for mobile communication devices.
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product
Battery Pack/Module Test Solution
Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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2D/3D Wafer Metrology System
7980
Chroma 7980 provides accurate and reliable profile information. 7980 adopts new BLiS technology and specially designed platform to achieve 2D/3D nanoscale measurement.
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3D Optical Profiler
7503
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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product
Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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product
Automated Optical Inspection Solutions
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
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product
Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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product
VCORE Power Test
To support the heavy computing loads required by AI technologies, system servers must rely on high performance CPUs and GPUs capable of complex, real-time processing. These processors are powered by VCORE power supplies, embedded DC/DC converters, or voltage regulator modules (VRMs).
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Digital Power Meter
66203/66204
Chroma 66203/66204 Power Meters are designed for multiple phase power measurement applications. The wiring mode function allows the user to take accurate power measurements for various wiring modes 1P2W/1P3W/3P3W/3P4W as well as providing accurate standard power measurements common for most electrical devices. A unique feature of the 66203/66204 is its stateof- the-art DSP digitizing technology instead of less accurate and slower traditional analog circuits. The internal 16 bits analog/digital converters with sampling rates of up to 250kHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters. The instruments include a four part display with 7-segment LED front panel readouts. Users can easily select desired parameters and readouts with a touch of a button. The 66203/66204 meters also include remote control using USB or GPIB interfaces via rear panel connections.
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Solar Array Simulator
62000H-S series
The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.
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Partial Discharge Tester
19501-K/19500
Chroma 19501-K partial discharge tester combines hipot test and PD (partial discharge) detector functions in one instrument. The device is capable of a maximum 10kV AC output with leakage current measurement range of 0.01uA and a minimum partial discharge detection of 1pC. The tester is specifically developed to test high voltage semiconductor components and high insulation materials.
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Wafer Chip Inspection System
7940
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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PXI Device Power Supply - 4 Isolated Channels, 20-bit Measurement Resolution
52310e series
Chroma 52310e Series i s a programmabl e PXI-Express DPS (Device Power Supply) Card designed for high-accuracy and reliable output power for device test applications. Its compact size, easy level of integration, and high flexibility make the 52310e Series ideal for multi-channel power supplies. Chroma 52310e Series features 8 selectable control bandwidths to ensure high speed output and stable operation; multiple current measurement ranges with a 20-bit DAC/ADC provide the highest resolution and accuracy with a sampling rate up to 600K S/sec; programmable internal series resistance for battery simulation. Chroma 52310e DPS series has a patented hardware sequence engine that has deterministic t iming to cont rol each DPS channel. The sequencer's on-board memory can store up to 1024 sequencer commands and 32k measurement samples per channel.






















