Wafer Test

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

ISE Labs, Inc. provides effective test solutions that address the full range of industry requirements for Digital and Mixed Signal devices. Test platforms encompass wafer probe and finished package testing. Our skilled staff of test engineers assist in the development of customized solutions designed to address unique test requirements. ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-vo ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance. The thin film technology offers improved power handling capability in ...more

Unique cartridge technology accommodates full-wafer contactors combined with industry-proven parallel test electronics to provide full-wafer burn-in and test. Based on industry-proven burn-in and parallel test electronics. High level, visual programming of timing diagrams ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

Aerotech's AVS100/AVSI100 series stages offer the ideal solution for applications that require very small incremental movements in elevation above a horizontal plane. Their small profiles and precise motion capability make these stages ideal for use in semiconductor wafer inspection and testing, fiber optics assembly and inspection, automated t ...more

The MP 1008, manual prober for 8-inch wafers, is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis of microcircuits. Featuring precision XY stage motion and micrometer control of the probing platform, the MP 1008 may be used with both 4.5-inch and 6-inch wide probe cards, in some instance ...more

The Aetrium Model 1164 Reliability Test System?s massively parallel architecture can run many tests, at many different temperatures, at the same time. It can be configured for a mix of: Copper/Aluminum Electromigration and Stress Migration, Copper ILD/Barrier BTS, Constant Voltage TDDB, SILC, MOS Hot Carrier, and NBTI. Package- and wafer-level ...more

Each system provides a complete solution for a specific test application, including accessories, test instruments and instructions. ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

The aim of AMIDA-888 DC Characteristic Test System is focus on RF high accuracy test and measurement. It is designed and built by AMIDA Technology and developed primarily to address high volume test requirements at minimal cost. Whatever chip wafer map or final test, AMIDA-888 presents it really cost ownership and high reliable.  ...more

Unique cartridge technology accommodates full-wafer contactors to provide full-wafer burn-in. Cost-effective solution for burning-in constant voltage or constant-current devices such as VCSELs. Wafer Pak cartridge accomodates fi ne-pitch, high-density photolithographic contactor technology ...more

SPEA testers, handlers and stimulus units are designed to be easily composed in integrated Test Cells, providing turn key solutions for the wafer- and final- test of mixed-signal devices, smart card and RFID devices, MEMS and sensors. ...more

The ATS150 linear stage provides the high resolution and repeatability required for semiconductor wafer testing and fabrication, automated microscope inspection systems, and precision micromachining applications. ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more

The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process ...more

The AMIDA-1700 MOSFET solution massively parallel architecture can run many tests and measures dynamic characteristics of MOSFET devices at high speed. It can be multi-site and hence, suit for mass production. Package and wafer level testing are both supported. It is not only high speed, but accuracy is proven of well functions in AMIDA-1700 M ...more

AMHS and conveyor manufacturers utilize the Tri-Axial Vibration Test Tool to quantify and qualify the vibration characteristics during development, installation and maintenance of their systems. This industry-standard tool is used by 200mm and 300mm FABs to measure the vibration induced to wafer lots by their material handling systems. By dete ...more

ISE Labs, Inc. provides effective test solutions that address the full range of industry requirements for Digital and Mixed Signal devices. Test platforms encompass wafer probe and finished package testing. Our skilled staff of test engineers assist in the development of customized solutions designed to address unique test requirements. Loadbo ...more

Testing the transmission properties of RF circuits is a common way to characterize RF amplifiers that are manufactured on Gallium Arsenide (GaAs) wafers. A probe station, as shown in Figure 1, tests the transmission and reflection coefficients (s-parameters) as a function of frequency. ...more

The ATN3580 series of attenuator chips incorporate thin film resistors on high resistivity silicon chips to achieve precision attenuation, tight flatness and high return loss to 40 GHz. The design uses a balanced TEE resistive structure to assure broad bandwidth performance.The thin film technology offers improved power handling capability in ...more