In-Circuit Test - aka ICT

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  • R-50J-DE - Receptacle for S-50J and ICT-50J Probes Receptacle for S-50J and ICT-50J Probes 
    Interconnect Devices
  • Series ICT Size 075 - In-Circuit spring probe on .075 centers and .250 travel In-Circuit spring probe on .075 centers and .250 travel
    Interconnect Devices
  • UNITEST 500ADP - ICT Board & Power Tester The UNITEST 500ADP is the most complete model created for In-Circuit, parametric and functional testing on modules containing analog, digital, and/or power supply boards. The analog power instrumentation module includes programmable AC-DC generators, programmable active loads, HV generators and a power matrix. Thanks to the versatility guaranteed by the GAX architecture, it is possible to use the instrumentation in parallel, making the UNITEST 500ADP a high performance test system for testing multiple modules at one time. This gives the user the flexibility to apply the best test strategy in relation to the type and volume of products to be tested.
    SPEA Italy S.p.A.
  • Capacitor Wizard - In-circuit ESR Meter Equivalent Series Resistance Meter / capacitor tester.
    Midwest Devices
  • TR5001V - Digital In-Circuit Test TR5001V includes a mix of MDA, ICT and Functional testing within one platform, allowing a complete optional testing model which provides an economical testing solution according to the needs of customers. TR5001V incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and increase productivity.
    Test Research
  • TestStation LX - Highest Quality In-Circuit Test The TestStation and TestStation LX are Teradyne?s highest pincount, highest performance in-circuit testers. They can be configured with a variety of multiplexed and non-multiplexed pin cards and can be used in both low and high pin count applications up to 7680 pins.
    Teradyne
  • ICT Probes Test Center: 50 - 156 mils. Current Raring: 3 - 5 amps. Contact Resistance: 30 - 50 milliohms. Spring Force: 113 - 312 gf (4-11 oz). Barrel: Bronze / Brass; Au plated. Plunger: BeCu / Steel; Au or Ni plated. Receptacles: Bronze / Brass; Au plated. Spring:  Music Wire / Stainless Steel Wire; Au plated 
    Centalic Technology
  • Series SHE Size 3 - In-circuit high current spring probes with .125 centers and .250 travel In-circuit high current spring probes with .125 centers and .250 travel
    Interconnect Devices
  • Series SHE Size 4 - In-circuit high current spring probes with .156 centers and .250 travel In-circuit high current spring probes with .156 centers and .250 travel
    Interconnect Devices
  • Series ICT Size 50J - In-Circuit spring probe on .050 centers and .250 travel In-Circuit spring probe on .050 centers and .250 travel
    Interconnect Devices
  • MTS180 - Digital Incircuit Tester This is a low-cost, high-performance electrical tester. It comes equipped with software tools that make operation easy. The standard model supports IC pin float detection. A large selection of options is also provided to allow JTAG inspections and necessary function testing using the ICT. Made by Digitaltest (Germany).
    WIT Co. Ltd
  • AX-ST7 - High-End In-Circuit Emulator System The AX-ST7 is a high-end in-circuit emulator system, which can be easily reconfigured to emulate ST7 or 8-bit microcontrollers from Motorola. Reconfiguration takes place by simply exchanging the adaptation board and thereby enables support of the different families. When climbing the learning curve, this universal approach provides an excellent return on investment in terms of money and time. 
    Hitex Development
  • VEC-109EX - 18.0 GHz RealProbe In-circuit Test Probe The ultimate in-circuit high impedance probe till 18GHZ. Shorten your development cycles and accelerate your debugging process.
    Vectria Ltd
  • ATS-KMFT 670 - Incircuit and Functional Test System XP/VISTA®-based menu-driven software with automatic program generation, CAD data import, statistics and autolearn for both InCircuit- and Functional test, high test accuracy and high test speed. The unit is known for low follow-up costs and extreme reliability.
    Reinhardt System-
  • In-Circuit Fixtures In-Circuit test fixtures can be configured for dual stage, dual well and opens testing applications. Even the most complex boards can be accommodated using standard methods of actuation.
    Joule Technologies
  • MX-ST7 - In-Circuit Emulator To guarantee rapid bug detection and a high level of software quality for ST7 applications, the MX-ST7 is available from Hitex. This in-circuit emulator offers a wealth of features and is an invaluable tool for the development and systems integration of real-time applications. Furthermore, use of the tool will significantly decrease a product's time-to-market. .
    Hitex Development
  • IN-CIRCUIT SCORPION iCT7000 - In-circuit fixture-based tester Whether you're choosing from our stand-alone manually loaded tester all the way through to our fully automatic In-line tester system, Acculogic has the system for you! Acculogic's Scorpion family of In-circuit fixture-based testers were created with one underlining theme in mind: Cost-effective Testing.
    Acculogic
  • In-Circuit Probes One of the most celebrated award winning probe designs ever introduced, the ICT Probe Series has completely revolutionized in-circuit testing. The ICT probe was not just another new probe design, but a design that marked a major change in probe construction. As test engineers witnessed the lowest and most consistent resistance and the most accurate pointing accuracy they had ever measured on test probes, the outdated bias designs gave way to the ICT Probe Series. While other probe companies continue to focus on the out-dated bias designs introduced over 30 years ago, IDI continues to enhance our revolutionary probe designs, making advancements that set new industry standards.
    Interconnect Devices
  • ICT Probes ICT Probes - Test Center: 50 - 100 mils Current Rating: 3 - 5 amps Contact Resistance: 30 - 50 milliohms Spring Force: 113 - 312 gf (4-11 oz)
    Merica Technology
  • ESI-2002 - In-Circuit Tester The OKANO ESI-2002 is a sophisticated and powerful tester, yet economical in terms of its price/performance ratio. Its powerful system software, running on Windows 2000, is very user-friendly with pop-up menus and comprehensive online help system. Password protection is also incorporated to prevent unauthorized changes to test data.
    OKA-NO (S) PTE LTD
  • ICDPPCZ - Power Architecture 5xx/8xx In-Circuit Debugger P&E's ICDPPC for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources. The ICDPPCZ software works with Freescale's MPC5xx/8xx devices.
    P&E Microcomputer
  • DS-186 - In-Circuit Emulator - 80C186/80C188 Family * Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors
    * Full-speed Emulation up to 25MHz
    * 1MB of Zero-Wait-State Mapped Memory
    * 8K x 32-bit Frames Dynamic Trace Buffer
    * 1MB Hardware Breakpoints
    * 115 KBaud RS-232 Communication Link
    * Numeric Coprocessor Support
    * OMF Converter
    * Support for Borland, Microsoft and Intel Compilers
    * Full Support for C, C++, Pascal and Assembler
    Ceibo
  • ICT Performs Comprehensive Testing In circuit testing (ICT) is traditionally used on mature products, especially in subcontract manufacturing. It uses a bed-of-nails test fixture to access multiple test points on the PCB’s bottom side. With sufficient access points, ICT can transmit test signals into and out of PCBs at high speed to perform evaluation of components and circuits.
    Nexlogic
  • GR 2286 - Wireless ICT Fixtures Test-X is licensed to sell Wireless Test Fixture Kits under U.S. Patents 5,550,606 and 5,157,325. These kits are machined to close tolerances so as to ensure consistent and uniform probe stroke on both U.U.T. and I.P.C.B. sides of the fixture. Fixtures are sold with or without Test-X Vacuum Sealing Box
    Test-X Fixture Products

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In-Circuit Test - Testing of short circuits, open circuits, component values and operation of ICs.