In-Circuit Test - aka ICT

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  • Series SH Size 4 - In-circuit high current spring probes with .156 centers and .250 travel In-circuit high current spring probes with .156 centers and .250 travel
  • IP-5800 - Inspection Pro Incircuit Tester This is a desktop in-circuit tester. Its compact design allows it to be easily moved within the factory. An electric press or pneumatic press can be selected for the press-down unit A hand press fixture can be connected for small boards, which is popular as a space-saving ICT.
    WIT Co. Ltd
  • InteFun 2700 - Functional / In-Circuit Test System The InteFun2700 and functional test services offer industry proven components that build a functional test strategy for a broad range of manufacturing test applications. Designed for production testing, our solutions are optimized for reliability, throughput, repeatability and cost. The InteFun is a complete integrated test solution designed to test common electronic device functions using state-of-the-art measurement hardware, test fixtures and test execution software. It is ideally suited to low to medium volume, high product mix, high product value applications where a reduction in batch turn.
    The Test Connection
  • In-Circuit Test Fixtures KJ has been manufacturing quality In-Circuit test fixtures for the electronics industry for the past 25 years. With our specialization in the fabrication of Custom Vacuum Test Fixtures we offer a complete solution to our customers.
    KJ Test Fixtures
  • DS-251 - In-Circuit Emulator # Real-Time and Transparent In-Circuit Emulator for 251s # Uses Intel and Atmel Licensed Bondout Technology # Standard 256K Emulation Memory # Real-Time Trace up to 128K Frames Deep, 128 Bits Wide # Complex Hardware Breakpoints # Supports Both Binary Mode and Source Mode # MS-Windows Debugger # High-Level Support for Popular C-Compilers # Full Support of Local and Global Variables # On-Line Assembler and Disassembler # Performance Analyzer
  • ICT Performs Comprehensive Testing In circuit testing (ICT) is traditionally used on mature products, especially in subcontract manufacturing. It uses a bed-of-nails test fixture to access multiple test points on the PCB’s bottom side. With sufficient access points, ICT can transmit test signals into and out of PCBs at high speed to perform evaluation of components and circuits.
  • Series SHE Size 3 - In-circuit high current spring probes with .125 centers and .250 travel In-circuit high current spring probes with .125 centers and .250 travel
  • VEC-109EX - 18.0 GHz RealProbe In-circuit Test Probe The ultimate in-circuit high impedance probe till 18GHZ. Shorten your development cycles and accelerate your debugging process.
    Vectria Ltd
  • AX/MX51 - In-Circuit Emulator The modular and flexible in-circuit emulator MX51, which is available in different variations, and the high-end system AX51 cover hundreds of 8051 derivatives. Various adaptation cables and adapters are available to easily switch to new derivatives or packages to be emulated.
    Hitex Development
  • In-Circuit Test Application Development & Fixture Fab Arxtron Technologies has been in the Agilent3070/HP 3070 (Medalist i3070) In-circuit test application development and fixture fabrication business since 2004 when it took over the Agilent Canadian application centre. Our engineers count more than 35 years of experience and have been serving a variety of customers focusing on high end/ high node count complex products (Telecom, Medical, Industrial computers etc.) as well as Automotive and consumer electronics customers. We are also an Agilent channel partner.
    Arxtron Technologies
  • ICT/FCT - In-Circuit / Functional Test In-Circuit / Functional Test (ICT/FCT) Probes
    INGUN Prüfmittelbau
  • ICDPPCZ - Power Architecture 5xx/8xx In-Circuit Debugger P&E's ICDPPC for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources. The ICDPPCZ software works with Freescale's MPC5xx/8xx devices.
    P&E Microcomputer
  • ICDRS08 - In-Circuit Debugger for RS08 Family of Microcontrollers P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
    P&E Microcomputer
  • 5200 Series - Analog In-Circuit Test System The 5220 is a compact Analog In-Circuit Test System that provides a high level of performance and measurement accuracy. It is equally suitable for use in low-cost bench top applications or high volume automated production lines, where its high test speed assists in maximizing production output.
  • In-Circuit Test Fixture Design Services An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems. Standard Fixtures, Pneumatic Fixture, Dual-Stage Fixtures, General Purpose Mechanical/Penumatic Fixtures, Split-Top Fixtures, Bench Top Fixtures, Opens Testing Gate Assemblies, Hold-Down Gates
  • Teradyne Z1890 - In-Circuit Testing and Test Engineering 2048 Pure Pin Test Nodes 3 & 6-wire Analog Measurements Vector Test for VLSI, PLCC’s & ASICS Multiscan II Vectorless Testing IEEE Functional Interface Board Large Custom Vector Library
  • ICD-U64 - In-Circuit Programmer/Debugger ICD-U64 is a complete In-Circuit Programming and In-Circuit Debugging solution for Microchip's PIC® MCUs and dsPIC®DSCs. The ICD-U64 will replace the ICD-U40.
    Custom Computer Services
  • USP-51 & USP51A 8051 - In-circuit Emulators These ICEs replace the 8051 in the target board with a pod that contains the same or similar CPU. Features include: • Overlay memory up to 256 KBytes • Emulates many 8051 families from Atmel, Dallas, Infineon, Intel, NXP (Philips), Teridian, TI, Winbond and others • Real-time trace buffer (PC, XDATA and Ports)
    Signum Systems
  • ICT Probes ICT Probes - Test Center: 50 - 100 mils Current Rating: 3 - 5 amps Contact Resistance: 30 - 50 milliohms Spring Force: 113 - 312 gf (4-11 oz)
    Merica Technology
  • TRACE32-ICE - In-Circuit Emulator TRACE32-ICE, the sophisticated high end In-Circuit Emulator for CISC offers unique features for the test and integration of embedded designs. 
  • i1000 - In-circuit Test > Keysight Medalist Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
    Keysight Technologies
  • "EasyLoader" or "eLoader" - In-Circuit Programmer/Loader In-Circuit Programmer/Loader ("EasyLoader" or "eLoader") is standalone device designed to provide a flexible and cost effective solution for electronic device manufactures as well as for hardware design companies and their customers. It allows upgrading code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash etc) or Microcontrollers at any time of development, testing or production.
  • ATS-UKMFT 625 - InCircuit- and Functional Test System The test system is delivered with an integrated test fixture, a pneumatic fixture is optional. The desk-top unit comes with the same transparent menu-driven software as ATS-KMFT 670: based on WINDOWS XP/VISTA®, automatic program generation, CAD-data import, statistics and autolearn for InCircuit and Function test.
    Reinhardt System-
  • JTAGjet-Trace - Real-time Transparent In-circuit Debugger JTAGjet-Trace, a real-time, transparent in-circuit debugger with a real-time trace buffer. Supports all ARM7, ARM9 and OMAP devices equipped with the Embedded Trace Macrocell (ETM) at speeds of up to 400 MHz. Available with trace depths of 256K, 1M, 2M and 4M frames and each frame is time-stamped with CPU cycle accuracy.
    Signum Systems

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In-Circuit Test - Testing of short circuits, open circuits, component values and operation of ICs.