ICD32Z - CPU3xx Incircuit Debugger P&E's ICD32 for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.

In-Circuit Probes One of the most celebrated award winning probe designs ever introduced, the ICT Probe Series has completely revolutionized in-circuit testing. The ICT probe was not just another new probe design, but a design that marked a major change in probe construction. As test engineers witnessed the lowest and most consistent resistance and the most accurate pointing accuracy they had ever measured on test probes, the outdated bias designs gave way to the ICT Probe Series. While other probe companies continue to focus on the out-dated bias designs introduced over 30 years ago, IDI continues to enhance our revolutionary probe designs, making advancements that set new industry standards.

DS-251 - In-Circuit Emulator # Real-Time and Transparent In-Circuit Emulator for 251s # Uses Intel and Atmel Licensed Bondout Technology # Standard 256K Emulation Memory # Real-Time Trace up to 128K Frames Deep, 128 Bits Wide # Complex Hardware Breakpoints # Supports Both Binary Mode and Source Mode # MS-Windows Debugger # High-Level Support for Popular C-Compilers # Full Support of Local and Global Variables # On-Line Assembler and Disassembler # Performance Analyzer

Capacitor Wizard - In-circuit ESR Meter Equivalent Series Resistance Meter / capacitor tester.

In-Circuit Test Fixtures The top Automated Test Equipment manufacturers count on Circuit Check. We fabricate and customize in-circuit fixtures for testers made by Agilent Technologies, GenRad, Teradyne and others.

ICT Probes Test Center: 50 - 156 mils. Current Raring: 3 - 5 amps. Contact Resistance: 30 - 50 milliohms. Spring Force: 113 - 312 gf (4-11 oz). Barrel: Bronze / Brass; Au plated. Plunger: BeCu / Steel; Au or Ni plated. Receptacles: Bronze / Brass; Au plated. Spring:  Music Wire / Stainless Steel Wire; Au plated 

Series ICT Size L100 - High Performance In-Circuit Probe High Performance In-Circuit Probe 

Series ICT Size L075 - High Performance In-Circuit Probe High Performance In-Circuit Probe 

ATS-UKMFT 627 - New Combined In-circuit-Function Test System The basic version of the combined In-circuit-function test comes with 32 bi-directional logic channels, 32 multi-matrix channels and 128 In-circuit- and function measuring channels (expandable to max. 608). Its in-circuit- and function measuring unit has more than 60 measuring ranges incl. transient recorder functions and Fourier analysis. 2 programmable, complementary twin PSUs, 0 to 24 V, supply the DUT and stimulate signals as does the sine and squarewave generator. This test system is also available with an integrated test fixture (working area 192 x 172 mm) for precise contacting of the PCB. For measuring in new test programs it can be tilted up when closed with the contacted DUT.

ICT Fixture Vacuum Fixtures are designed professionally based on the specification of ICT testers, such as Teradyne, Agilent, and TRI. Probes can be installed on either one-side or double-sides to match the size and test pads of UUT. Different customized fixtures are available

MX6808 - In-Circuit Emulator Hitex offers a powerful and easy to use debug tool, especially designed for 68HC08 applications. The wealth of features offered by the MX6808 in-circuit emulator guarantees fast bug detection and enhanced software quality. The emulator is an invaluable tool for the development of real-time applications and their systems integration. In addition, using an MX6808 in a project will significantly reduce time to market.

AX-ST7 - High-End In-Circuit Emulator System The AX-ST7 is a high-end in-circuit emulator system, which can be easily reconfigured to emulate ST7 or 8-bit microcontrollers from Motorola. Reconfiguration takes place by simply exchanging the adaptation board and thereby enables support of the different families. When climbing the learning curve, this universal approach provides an excellent return on investment in terms of money and time. 

ATS-UKMFT 625 - InCircuit- and Functional Test System The test system is delivered with an integrated test fixture, a pneumatic fixture is optional. The desk-top unit comes with the same transparent menu-driven software as ATS-KMFT 670: based on WINDOWS XP/VISTA®, automatic program generation, CAD-data import, statistics and autolearn for InCircuit and Function test.

ATS-KMFT 670 - Incircuit and Functional Test System XP/VISTA®-based menu-driven software with automatic program generation, CAD data import, statistics and autolearn for both InCircuit- and Functional test, high test accuracy and high test speed. The unit is known for low follow-up costs and extreme reliability.

Series ICT Size 075 - In-Circuit spring probe on .075 centers and .250 travel In-Circuit spring probe on .075 centers and .250 travel

Series ICT Size 50J - In-Circuit spring probe on .050 centers and .250 travel In-Circuit spring probe on .050 centers and .250 travel

TRACE32-ICD - In-Circuit Debugger TRACE32-ICD is a cost effective debugger based on the onchip debug interface or on a ROM monitor solution. Most of the debugger can be enhanced be a trace module to provide program and data flow information. 

JTAGjet-Trace - Real-time Transparent In-circuit Debugger JTAGjet-Trace, a real-time, transparent in-circuit debugger with a real-time trace buffer. Supports all ARM7, ARM9 and OMAP devices equipped with the Embedded Trace Macrocell (ETM) at speeds of up to 400 MHz. Available with trace depths of 256K, 1M, 2M and 4M frames and each frame is time-stamped with CPU cycle accuracy.

ICDHCS08 - 68HCS08 In-Circuit Debugger P&E's ICDHCS08 is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources.

TRACE32-ICE - In-Circuit Emulator TRACE32-ICE, the sophisticated high end In-Circuit Emulator for CISC offers unique features for the test and integration of embedded designs. 

ProWorks - ICT Fixture Design ProWorks is a multi-user process management tool. It will enable you to deploy and manage the execution of established best practices throughout your organization.

Series S Size 100 Probe - In-Circuit spring probe on .100 centers and .250 travel In-Circuit spring probe on .100 centers and .250 travel

Analyst ils - In-line in-circuit test Designed for testing all types of circuit assemblies the CheckSum Analyst ils has all the features of the Analyst ems, but in a package with an integrated high speed board handler for use in an automated production and test line. The CheckSum Analyst ils combines manufacturing process testing with TestJet Technology for high fault coverage in-circuit test of a single assembly or a panel of multiple assemblies in minimum time with maximum fault coverage.