IC Test Systems

The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applicati ...more

Achieves simultaneous testing of up to four devices, and are capable of testing driver ICs with 10-bit resolution (1024 gradations). The T6372/6362 are the newest LCD driver test systems capable of testing at with high throughput, with and high accuracy, at low cost. ...more

The SYSTEM 8 Analogue Test Station is a PC-based analogue V-I Tester with fully configurable parameters. The two discrete channels can be used for live comparison whilst the 24 channel interface may be used to speed up acquisition on multiple pin devices or connectors. The ATS is also equipped with the powerful Matrix V-I function for further ...more

ArraytestMaker is an advanced embedded test, diagnosis and repair solution for SRAM, CAM and DRAM. ArraytestMaker prevents ICs containing faulty SRAM from reaching systems. The user can select one of five algorithms that are built-into ArraytestMaker. ...more

The Teseda V520 is the first engineering test platform designed specifically for scan validation, silicon debug and failure analysis, not just as a general-purpose tester adapted for scan test. The Teseda V520 works with the Teseda WorkBench™ DFT-Intelligent™ software and your Design-for-Test (DFT) tools for effortless integration with the chip des ...more

The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of identifying and testing all types of analogue components by means of the well-known, power off V-I test technique. ...more

The PTC (Parallel Test and Configuration) is a member of the Intellitech TEST-IP family of infrastructure IP products.  The TEST-IP product family facilitates test, debug and in-system programming of ICs, PCBs and multi-PCB systems. The PTC provides multiple scan rings at the PCB level and scan access to each PCB at the system level.  ...more

ABI Electronics offers a range of solutions to cover the most common test combinations. Including both analogue and digital test techniques, they provide an excellent starter package for a wide range of applications. ...more

What was at the time of purchasing a pure MDA System can be upgraded to a TR-5001-System. This means the system can grow with the demands you put on it, and anytime later, can be loaded with further analog or additional digital/hybrid Test Points (ICT) as well as integrated, PXI-based Functional Test Enhancements (FCT). And this to prices, whi ...more

Electro World provides turn-key solutions for IC burn-in requirements, which are compliant with MIL-STD-883E and EIA-625 standards including: Consultation (socket selection, burn-in system selection). Design & Manufacture of burn-in boards & system preparation Training  ...more

Unique in its class, Advantest's new M4841 Dynamic Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal dynamic test handler for high volume production of devic ...more

The RM17TIS is a portable solution designed to allow easy interface of telemetry systems to the Honeywell ASCB Version D bus used in PRIMUS EPIC systems. The TIS system uses an ICS developed PCI-NIC card for the interface to the ASCB bus. This card is sanctioned and used by Honeywell in their in-house test equipment and is the same card suppli ...more

Like its equal Zion Single Bank, The Zion Full Bank offers the same qualities. It is fabricated to accommodate your largest board testing needs. Similar to the Zion Single Bank, the gate is designed to gradually close down to avoid the slam and the back swing upon opening. Again, we are proud that all of our parts are fabricated and manufactur ...more

The WL25 uses multi DGS to support total parallel testing of power devices. It provides a wide variety of V/I variations. The newly-developed high-speed BUS that shorten hardware setting times and the lower system noise combine to offer high-accuracy testing ...more

When small test points, extremely tight tolerances or high volume applications are required, use QxQ Pneumatic fixture. Designed for either ICT or functional applications, QxQ pneumatics stand the test. ...more

This is a newly-developed compact version of the WL25. It can measure between one and four small amplitude signal linear devices in parallel, and is ideal for mass-production tests. All the modules used are compatible with the WL25.  ...more

Baseband Video testing – The ANG BBV Series of Noise Generators are designed for testing baseband (NTSC, PAL, SDTV, HDTV) video and audio systems in the presence of noise. Ideal for signal and picture quality testing on encoder/decoder ICs. ...more

The Agilent Medalist i5000 In-Circuit Test (ICT) system is the newest offering in Agilent's ICT line-up, providing a tester that is easy to operate, competitively priced, and expertly supported by Agilent and Agilent partners. This system is designed to allow electronics manufacturers -- including OEMs, contract manufacturers, ODMs and their s ...more

Interface for Data Transfer for REINHARDT Test Systems. Together with Reinhardt System- und Messelectronic GmbH, Tecnomatix (formerly Fabmaster) has created a software which generates data out of the data of CAD-systems or even of bills of materials which can then be used for programming insertion machines and automatic test systems. The CAD-d ...more

Chroma 3500 is the first LCD Driver IC Test System designed specially to test both LCD Driver ICs and Consumer ICs in a single platform. Chroma has engineered an universal architecture which enables free inter-change of the LCD pin cards and I/O pin cards in the test head, so users can easily reconfigure the pin cards to meet rapidly changing ...more

The S230 test system has been specially designed for testing PDP (Plasma display) driver devices and has been a de fact standard in the PDP Driver testing market. This system can be used to test both data driver and high voltage scan driver device testing.  ...more

TR6080 IC Tester is specially designed for testing Power Management IC. It is ideal for testing regulator, detector, reset, switch, and PWM IC. TR6080 system adopts modular design concept. Currently, there are PVC, OVC, DVC, and TMU for DC&AC parameter measurement, and functional pattern testing AC32 modules for various testing requirement ...more

The ETS 406D Static Decay Meter meets the requirements for static charge dissipation and static decay rate testing as required by DOD, NFPA, ESDA, INDA and EIA test specs. A wide variety of electrode configurations are available which enable the static dissipative characteristics of film, flat plaques, IC carriers, tote boxes, garments, tablet ...more

A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government's Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testi ...more

The Ocelot is the most cost-effective manufacturing test system for complex SOC chips. It is the first production system specifically developed to provide comprehensive structural test capabilities for testing ICs that incorporate DFT structures on chip, such as Scan and BIST. ...more