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2520 - Pulsed Laser Diode Test System w/ Remote Test Head The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing of laser diodes in one compact, halfrack instrument.
TVR 6100 - Diode DC. Characteristics Tester The TVR6100 is a multipurpose, versatile Binning Tester. It can be used to classify parameters, including TRR (reverse recovery time), VF (forward voltage, IF is up to 100A), VBR (reserve breakdown voltage) and IR (reverse leakage current). Moreover, it can test IR SURGE, ΔVR(delta reverse voltage) and IR parameters at the same time. Each parameter, for testing or not testing, can be selected by each operator.
DT100 - Diode / Transistor Tester Checks transistors and diodes in circuit. Identifies NPN or PNP transistors. Checks small or large power types
FEC200E - Diode Tester This is a successor to our longstanding and successful tester FEC200. The FEC200 is described in detail on this site. The "E" version has all of the same capabilities as the original tester. In addition the "E" version has hardware and software enhancements to support various optional external test stations. These stations may add additional tests such as those used to test TVS devices. They may also extend the voltages and currents available in the host tester.
ZSTZDT - Transistor, Zener Diode Tester Forward drop @maximum test current 10A, Reverse / Breakdown voltage up to 1000V Reverse leakage current up to 1 micro A
DVF 6000 - Rectifier Diode DVF Tester The Function of the Model DVF6000 is for the testing of power diode DVF parameters. Its testing procedures first check the VF parameters to screen out abnormal VF diodes, and then it measures the DVF parameter. The maximum current source it can provide is up to 25 A.
MAS830B - Transistor, Diode Test Digital Multimeter Digital Multimeter, DCV:200mV-600V ±(0.5% + 2) ACV:200V-600V ±(1.2% + 10) DCA:200µA-10A ±(1% + 2) OHM:200O-2MO ±(0.8% + 2) Transistor Test:yes Diode Test:yes Data Hold:yes
Model 2520 - Pulsed Laser Diode Test System The Model 2520 Pulsed Laser Diode Test System with Remote Test Head is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing of laser diodes in one compact, halfrack instrument.
DT100K - Diode/Transistor Tester Kit Checks Transistors and Diodes in Circuit Identifies NPN or PNP Transistors Checks Small or Large Power Types
VFR 6000 - Diode Forward Recovery Voltage Tester The main function of the VFR 6000 tester is to test material's VFR(Forward Recovery Voltage) values, not including DC characteristics. It uses a fixed-direction testing. There are 10 groups for setting and saving programs. In addition to this, Xceltron is active in the research and development of production management system software that can provide all types of reports and analysis diagrams.
CV300B - Diode Tester This Clamping Voltage Tester tests silicon Transient Voltage Surpressor (TVS) diodes, both uni-polar and bipolar. The waveform used for the main test is he 10/1000 waveform. The tester can also produce 8/20 and 6/70 exponetial waveforms, 8.3ms half sine and rectangle pulses.
603 - Continuity and Diode Test Digital Multimeters Digital Multimeters. Continuity, Diode Test, hFE Test
DS-711IZ - DIODE TESTER Specialized test for Axial, SMD and 2-pin package type. Electrical Testing: Forward：VF Reverse：VZ、DVZ、IR、ACIR、DIR Four-wire measurement and contact resistance in case of deviation. Manual test or conjunction with automatic machine.
FEC CV400 - Diode Tester The CV400 tests silicon Transient Voltage Suppressor (TVS) diodes, uni-polar and bipolar. The waveform used for the main test is the 10/1000µs waveform. The tester can also produce 8/20µs and 6/70µs exponential waveforms, 8.3ms half sine and rectangle pulses. These tests not only prove the ability of the DUT to endure the pulses without failure, but also measure the peak voltage across the device during the pulse. The CV400 can also measure the VZ of the device both before and after the pulse. Limits may be applied to the absolute value of these VZ tests and to the difference between them. If the initial VZ is outside the programmed limits, the part can be rejected and the main pulse not be applied. IR can be measured before and after the main pulse. This test is intended to detect damage due to the main pulse which is too slight to be detected by the main pulse or VZ test. The tester is designed to work with one or two automatic handlers or manual test stations. Bin sort outputs sort the parts into good devices that pass all requirements, several classes of rejects, and those parts which were not completely tested because of some fault condition.
M3900 - Transistor and Diode Test Digital Multimeter Digital Multimeter, DCV:200mV-1000V ±(0.5% + 1) ACV:200mV-750V ±(0.8% + 3) DCA:20µA-20A ±(0.5% + 1) ACA:20µA-20A ±(1% + 3) OHM:200O-20MO ±(0.8% + 1) Transistor Test:yes Diode Test:yes
PLS1000CM - Diode Tester The PLS1000CM automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methos 4066-1 or 4066-2. In addition, it can test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mv) or degrees per Watt.
SZ6000N - Zener Diode and Switching Diode Tester The Model SZ6000N tester primarily tests Zener Diode and Switching Diode. The testing parameters include VF (forward voltage), Breakdown Voltage, Maximum Power setting VZM, DVR (delta reverse voltage), and two IR (reverse leakage current) testing, which cover all testing parameters for both devices, except for ZZT&ZZK parameters of Zener diode. (Testing equipment is available from Kyoto Enterprise to measure ZZT&ZZK parameters of Zener Diodes.
600 Series - Rotor Stator Diode Tester One 4-1/2" meter,0-200 amps-tests stator current. One 3" meter, 0-10, amps-tests rotor current. 115 V. AC, and 12 & 24 V. DC. Shipping Weight: 40 lbs. Designed for high amperage test of Y and Delta stators to determine open, shorted or grounded conditions. Provides DC test to determine open shorts and grounded rotors.
ZT-605 - ZENER DIODE TESTER Specialized test for Axial package type. Electrical Testing: Forward：VF ReverseVZ、DVZ、IR、DIR、ZZT、ZZK Four-wire measurement and contact resistance in case of deviation. Manual test or conjunction with automatic machine.
LD-607 - LASER DIODE TESTER LIV curve test. LD horizontal and vertical test. LD Spectrum test (620~820 nm). With mechanical machine, the tester can have automatic machine repetition verification function.
CDT-65A - Diode Tester The CDT-65A is a microprocessor based diode tester designed to provide rebuilders with quick, accurate and easy to use device to check and measure all main parameters of regular and avalanche rectifiers. During the test the measured values are compared with preset limits and GOOD/BAD indication displayed along with an audible beeb if the diode is ok.
FTI 3000 - Burn-In and Test of Zener diodes CURRENT CONTROL boards to provide the precise amount of Ir to each diode string during the burn-in periods. MEASURE boards to monitor the diode Vf during the measure periods. External Power Sources to power the diode strings.
Panther II - Ultra Fast Open / Short / Diode Drop Tester Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical. High speed testing at 2 seconds for 2 million test combinations. Can be interfaced to any type of test fixtures. Multi-Site Test support for Strip or Multiple device test.
VF40CM - Diode & Rectifier Tester The VF40CM is intended for testing VF, Half Cycle Surge, and Thermal Response/Resistance on small- and medium- power diodes and rectifiers. It can also measure Thermal Response/Resistance on NPN and PNP bipolar transistors using an external user-supplied VCB supply.
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