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Wide Mechanical Tuning Bandwidth Gunn Oscillators
Wide mechanical tuning bandwidth Gunn oscillators utilize high performance GaAs Gunn diodes and various cavity designs to yield near full band frequency coverage. Unlike dual-tuner oscillators, frequency and power optimization are accomplished by a single micrometer. Furthermore, these oscillators can be modified into electrically tunable oscillators by replacing the micrometer with an electrical actuator. The wide tuning bandwidth of these oscillators offers a low cost, high performance means o...show more -
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Soft Board Dedicated Automatic Testing Machine
U690FPC
1. CCD automatic alignment, the alignment accuracy reaches ± 15μm2. Support layout test, displacement function3. Up and down jig fine adjustment function4. Soft board stretching function5. Automatic marking function
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Quickly & Accurately Validate Any Pluggable Transceiver from 10M to 100G
iOptics
iOptics offers a complete, powerful and easy-to-use tool for CFP and QSFP qualification and can validate the full range of low- to high-rate transceivers including SFP, SFP+, XFP, CFP, CFP2, CFP4, QSFP+ and QSFP28. iOptics offers a faster, streamlined and automated test sequence aimed at quickly and simply validating any type of 10M to 100G interface. It is the ideal solution for multirate field commissioning with a simple one-button pass/fail. It offers automated stress testing for lab qualification and is also ideally suited for data center and data center interconnect (DCI) testing.
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Splinter Shields
AMETEK Sensors, Test & Calibration
Splinter shields for use with materials testing machines are available to protect the user when testing brittle samples which are liable to fragment. The shields help prevent sample splinters from leaving the test area when performing a test.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Coax, Contact, Receiver, 75 Ohm, RG179
610104157
Primary mating contact 610103169. (May mate with other ITA contacts, as well.)Mechanical SpecificationsDurability 20,000 cyclesContact Material Female & Male Shield – brassCenter Contact – BeCuContact Plating Center Conductor Shield – 30µ” Au over 100µ” NiContact Termination Center Conductor – Crimp or SolderShield – CrimpInsulator PTFEMating Force 4.0 lbs max [1.81 kg]Electrical SpecificationsCharacteristic Impedance 75 ΩFrequency Range DC to 3 GHzVSWR < 2.95 @ 3 GHzInsertion Lo...show more -
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Ring Wave Generator
SKS-1206IA/SKS-1206IB
Shanghai Sanki Electronic Industries Co., Ltd.
The ring wave generator is fully compliant with the new standards of IEC61000-4-12 and GB/T17626.12. The interface contains standard differences between IEC and Chinese national standards. Users can choose to enter the corresponding interface to perform different Test: Program -controlled high-voltage power supply and electronic switch have the characteristics of high precision, long life and good reproducibility.
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IEC60529 IPX5/6 Water Jet Nozzle
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60529 IPX5/6 Water Jet Nozzle is designed according to the requirements of IPX5 and IPX6 code of GB4208 and IEC60529 standard. IEC60529 IPX5/6 Water Jet Nozzle is used to test the waterproof performance of the appliance and electronic. The IEC60529 IPX5/6 Water Jet Nozzle consists of a jet handle that is equipped with a pressure gauge and an easy-to-adjust flow valve. The interchangeable nozzles assemble easily to the jet handle. The nozzles are made from stainless steel.
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Signal Contacts
VPC's own patented signal contact technology allows infinite configuration possibilities for test & measurement interconnectivity.
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Abrasion Testers
A range of instruments used to test the resistance of many coatings materials to scrub, abrasion and wear.
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PXI 8-slot BRIC Multiplexer, 24-Channel, 20-Pole (5 Sub-cards)
40-570A-313
The 40-570A-313 is a 24-channel, 20-pole High-Density Multiplexer and is part of our BRIC family. The 40-570A range is designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing.
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MIMIC® Redfish Simulator
The MIMIC Redfish Simulator, the industry's first integrated simulation tool supporting Redfish, allows developers to perform real world, integrated device simulations. MIMIC simulates thousands of Redfish-capable devices. MIMIC allows suppliers of Redfish devices and applications to design, develop and test their products in a virtual and scalable network environment, assuring customers that their applications will be able to handle the scales of messages and different types of requests to work properly when deployed across heterogeneous environments.
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Test And Repair
If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.
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Desktop Appliance for PCI Express® Gen4
DE200-G4
A versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
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PXIe-4139 , ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit
782856-03
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology,...show more -
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Field Management
EAG offers field-to-final report project management for studies to demonstrate human and environmental safety. As on-site study directors, our Field Managers bring decades of study design, protocol development, analytical oversight, and GLP/QA compliance expertise across a variety of field management study types. In addition, EAG’s access to a broad network of field sites across the United States and Canada ensures that we can deliver the test system, soil characteristics and geography necessary for just about any regulatory need.
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Voltage Current Calibrator
IVC-222HPII
The Voltage Current Calibrator is a general purpose current and voltage source that can be used in engineering, manufacturing, test, and process control application.Four ranges: 200 mV, 2V, 20V, and 24 mA
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SIGNAL & POWER ISOLATOR
EE301-ISOL
The EE301-ISOLATOR will completely isolate your electronic loads inputs & outputs signals plus ground returns from the main power input UUT (unit under test)... The module allows you to control the electronic load just as you would with any standard control signal. Input / Output & Power signals are fully isolated up to 350 VDC.
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Test Data Investment Services
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can...show more -
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IK Level Tester
IK07-10
IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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High-Speed HD MWIR InSb Camera
FLIR X8500sc MWIR
The FLIR X8500sc is a highly sensitive, high-speed, high definition MWIR camera designed for scientists, researchers, and engineers. It has all the features needed for research and science: from on-camera RAM/SSD recording to a four-position motorized flter wheel. Plus, by combining HD resolution with high-speed frame rates, the X8500sc allows researchers to fully image the scene and stop motion on high-speed events – whether they’re in the lab or on the test range.
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PathWave Test Executive For Manufacturing Developer Version
KS8328A
PathWave Test Executive for Manufacturing (PTEM) is a plug-in that enhances the user experience in developing automated test programs using PathWave Test Automation Platform (TAP). With powerful PathWave Test Executive software, we eliminate the need to maintain or develop a test platform by users, especially in a manufacturing environment where a high mix of products exist, the maintenance, enhancement, and control of it could become challenging. Development of a test execution platform should not be a priority for valuable resources, instead optimizing and improving test coverage should be the key area of focus.
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Digital Power Supply Tester 20/24pin
PST-3
This product is design with LCD to show your ATX power voltage. Simple tester forswitching power supply. It makes it easy to test the power supply output.
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Automotive RF Design Verfication Test System
The system is used for design verification of RF assemblies. By using similar measurement technology and test software as in the production testers, parts of the test procedures developed in development can be reused in production. The DUTs are tested in RF-tight shield boxes and contacted via original plugs. The shield boxes are connected via N-connectors and other typical laboratory contacts. This allows test setups to be easily modified and individual signal paths to be separated.
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Power Distributions
LXinstruments Power Distribution Units (PDU) provide all of the functionality required to power a test system in a compact 19-inch rack. This means that devices can be supplied with both mains voltage and DC voltage. With the soft-on-off function, the PDU can be controlled remotely via remote buttons and other potential-free contacts. We carry single-phase devices for the 16 A connection to three-phase devices for the 3x63 A or for the 125 A connection.
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Leeb Hardness Tester
HT6561
Product synopsis1.1 Typical Applications* Die cavity of molds* Inspection of bearing and other mass produced parts on aproduction line* Failure analysis of pressure vessel, steam generator andother equipment* Inspection of installed machinery, permanent parts ofassembled systems and heavy work pieces.* Testing surface of a small hollow space* Material identification in the warehouse of metallic materials* Rapid testing in large range and multi-measuring areas forlarge-scale work piece1.2 Testing...show more -
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Environmental Test Probe, Temperature
72-8364
Type K Surface Temperature Probe Surface probe is ideal for flat stationary surfaces such as molds, heating elements, integrated circuits, transistors and transformers. Very low sensor element mass enables fast response measurement time. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs. See the complete line of Tenma Thermocouple Probes and Accessories
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PXIe Digital I/O: 28 LVDS Channels, 8 Trigger Channels
M5302A
M5302A is a single-slot Digital IO PXIe module with 28 programmable LVDS channels and 8 single-ended channels. The LVDS channels can be used to communicate to the device under test or can be used to control other devices by emulating protocols such as Camera Link. The single-ended channels are suitable for event triggers or other general-purpose IO applications.
