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Test And Measuring Instruments
Nagman Instruments & Electronics Pvt. Ltd
At Nagman you can find a wide range of Test and Measuring Instruments that can be used for multiple purposes in your industry. Do you want to calibrate temperature devices or pressure devices? You can find a suitable Test and Measuring Instruments on our website. They consist of a range of devices that are very necessary in almost every industry. Test instruments are used to examine the devices for their quality, longevity, performance and efficiency. Every device or instrument needs to undergo these tests on regular basis. Similarly, measuring instrument are used to measure common parameters in industries like voltage, temperature, pressure, resistance, etc.
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Electrodynamic 3-axis Vibration Tester
Our unique technology, "special slide mechanism" and "floating mechanism" enable 3-axis simultaneous vibration test in high frequency band up to 2000 Hz, which was difficult to realize so far. A frequency range up to 2000 Hz is essential for vibration testing Of Aerospace Electronic And Electrical Devices. Conventional Single-Axis Vibration Testing Has Been The Mainstream In Conventional High-Frequency Vibration Testing Machines, But High-Frequency Three-Axis Vibration Testing Is ...show more -
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Insertion/Return Loss Test Station
JW3327
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW3327 Insertion/Return Loss Test Station is a Joinwit precise instrument, which be adopted advantages from current abroad instrument brand and improved to the application from clients, developed by Joinwit. It is a technological breakthrough in the domestic market and greatly improves the efficiency of IL test of optical devices to the MM with two wavelengths testing result in one station. It has extensive applications in the fiber cable, fiber passive device, fiber active device and optical communication system. It is suitable to perform the WIP testing and sample character testing for fiber device manufacturer research institutes.
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IV Curve Tracer
IVCT
In recent years, we have been developing a sophisticated IV curve tracer for PV modules including a maximum power point tracking (MPPT) function. The IV curve tracer is designed for operation with any market-available steady-state solar simulator. Through our web-based software design, the operator can supervise the test results from every computer in a company network. The software contains functions such as an irradiation sum counter that helps to check requirements stated in a stabilization t...show more -
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Boundary-Scan Test / In-System Programming Controller
CPXI-1149.1/Turbo
The CPXI-1149.1/Turbo is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the CPXI-1149.1/Turbo offers up to 80 MHz clock rates on 4, 8, or 32 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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LFA-3000 Light Flicker Analyzer
Hangzhou Everfine Photo-E-Info Co., LTD
LFA-3000 can simulate flickering measurement and analysis under various voltage fluctuation conditions, and the system has built-in standard voltage waveform database, one operation can complete the test and analysis of IEC 61547-1, convenient and fast. Meet the lighting product design, quality inspection and application of flickering test analysis needs.
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Atlas SCR Thyristor and Triac Analyser
SCR100
Thyristors and Triacs need special test conditions to analyse effectively - that's where the new Atlas SCR comes in. The SCR100 can apply gate test currents from 100µA up to 90mA (with test load currents of up to 100mA) so it's not limited to sensitive parts.It will automatically identify the type of part (Thyristor or Triac), identify all three leads and also categorise the gate sensitivity. This new version takes a standard Alkaline AAA battery.
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Pilot V8 Manual/Automatic
The Flying Probe Tester Pilot V8 Next series represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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FPGA PXI Card with 40 Channel ECL Buffer Module
GX3640
The GX3640 is comprised of the GX3500 FPGA card and the GX3540, 40 channel ECL expansion card. It is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), and functional test applications. The GX3640 consists of 20 differential ECL drivers and 20 differential ECL receivers. Each channel can be accessed via software commands for use in static I/O applications.
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Integrated Thermal Control System
The Vektrex Integrated Thermal Control System (ITCS) uses proprietary water-based thermal control to maintain consistent LED and laser device temperatures during high power testing applications. LED/VCSEL manufacturers and third-party test facilities standardize on ITCS chambers for their testing needs.
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USB-6346, 8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device
785815-01
8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device - The USB-6346 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Micro OHM Meter
Cambridge Instruments & Engineering Co.
This Test set is capable to measure low resistance like switch contacts, breaker contacts, busbar slices, joints, fuses, low inductive windings etc.
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Voltage Probe
KHZ43201
Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Drop Test Machine
Guangdong ALI Testing Equipment Co,. Ltd
Drop Test Machine -drop tester Satisfy With ASTM , ISTA Industrial Standards,Drop height: up to 2000mm (adjustable).
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Automatic Type Cupping Testing Machine
GWB-60C
Jinan Testing Equipment IE Corporation
The digital cupping tester is mainly used in the test of metal sheets and thin strips. The automatic cupping testing machine can test the plastic deformation performance of the sheets and thin strips. The automatic cupping testing machine meets the requirement of international GB/T 4156-2007 "Metal Material Sheet and Thin Strip Erichsen Cupping Test". Adopting a hydraulic clamping and hydraulic stamping composite oil cylinder, the cupping tester automatically shuts down when a test sample has cr...show more -
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Digital Insulation Tester
DIT-1020
Laxtronics Instruments & Controls Pvt. Ltd
Digital insulation tester Model No: DIT-1020 is designed to carry out electrical insulation measurement in delicate or sensitive electronic sensors, transducers, modules and assemblies with test voltage of 100 Volts DC, its short circuit current is less than 500uA.
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PXI-6232, 16 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Multifunction I/O Module
779618-01
16 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Multifunction I/O Module—The PXI‑6232 is a bank-isolated DAQ device designed for voltage I/O. It offers analog I/O, digital input, sourcing digital output, two 32‑bit counters, and digital triggering. The digital input and outputs are compatible with 24 V signals. It combines the safety and performance benefits of isolation with high-performance timing, amplification, and calibration technologies to offer accurate measuremen...show more -
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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Series Resonance Test Devices
Wuhan Huatian Electric Power Automation Co., Ltd.
Voltage capacitance testers by HVTEST
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Partial Discharge
Partial discharge (PD) is a local electrical discharge that occurs in imperfections or inhomogeneities. The partial discharge measurement is a so-called “non destructive test” to determine the quality of insulating materials. On the contrary of pure high-voltage test, th test item is not pre-damaged at low PD levels.
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LIGHT RANGER MUTT
TT9103
*Portable and water resistant trailer light tester and trailer brakes tester that allows the user to perform all testing functions without the use of the vehicle*Tests 7-spade, 6-round and 4/5-flat pin type trailer harnesses*Short circuit protection*Turn signal simulation and power verification LED*Water resistant*Trickle charger and trailer plug adapter includedInternal battery compartment (battery not included)
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Circuit Breaker Tester
GDGK-303
Chongqing Gold Mechanical & Electrical Equipment Co.,Ltd
1) Closing and opening time measurement of 12 channels2) Max difference of closing or opening time measurement of three phases3) Bounce time and frequency measurement of breaker closing4) Circuit breaker closing and opening speed measurement5) Travel-time, Coil current-time curve of circuit breaker operation measurement6) Clearance of circuit breaker measurement7) Variable DC circuit breaker operation power supply8) Print test results by internal micro printers
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Crack Testing
STATOGRAPH® Product Family
Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 3.55kΩ
50-297-123
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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Ground Threat Emitter Sensor System
GTESS
The Ground Threat Emitter Sensor System (GTESS) is a modular test and training system capable of stimulating multi-spectral aircraft electro-optic sensor suites at long range. The GTESS system integrates Textron Systems’ ultraviolet (Mallina™), infrared (Phoenix) and/or laser (Phantom™) ranged stimulators with an automated tracking system to facilitate fast-moving test, training and evaluation exercises. A fully integrated camera system for effective after action review. GTESS can also work in conjunction with Textron’s radio frequency (RF) range stimulator systems (PRTS™ & HPRTS) for complete multi-spectral testing.
