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1GHz EMC Emissions Analyser
SA1002
The SA1002 provides a high performance capability to measure the EMC compliance of your products. It covers the conducted emission and radiated emission bands to 1GHz, as required by most EMC standards. The included software is Windows compatible and simple to use. This powerful system automatically sets the analyser parameters to suit the test to be performed. Standard limits are available from simple pull-down menu. Results can be directly compared against these limits for easy checks on compliance status.
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Test Leads
8000 Series
The "SOFTIE" by Probe Master lets you say "goodbye" to hand fatigue and finger calluses. A soft probe that bends 90 degrees or more. A probe that conforms to the shape of your hand. This soft flexible probe bends gently to reduce wear and breakage of the lead. Many combinations are possible with the "screw on" accessories shown above. The 48" long, 18GA. test leads, are made of top quality silicone.
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USB, AC 110 VOLT AND 12 VOLT SOCKET TESTER PACK
MDPPTST
*USB, 12V and AC 110V socket testers provide the user with a simple way to test electrical sockets on a vehicle*Socket testers illuminate when when the respected voltage is detected, indicating the health of the socket*USB socket tester illuminates when 4.4V - 5.25V is detected
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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AC /DC Withstand Voltage Tester 5KV/100mA
2672C
Shenzhen Chuangxin Instruments Co., Ltd.
*High voltage, large current, high accuracy.*Leakage current, testing time, continuous arbitrarily, well-adapted.*Synchronized display measuring value( time, voltage and current).*Can choose manual or remote control test*High voltage breakdown protection, sound and light alarm, safe and reliable *Easy operation, suitable for use in production line*DC output can test small capacitance, high-voltage silicon stack, reverse voltage of transistors
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Qsome Software Testing Platform
The Qsome software testing tool has been built to make the automation of functional testing of web-based and mobile applications faster, easier and more cost-effective. Our software testing tools have been built from the ground-up with these key principles in mind: Users with no testing experience should be able to use our tools without exhaustive trainingExecuting a batch of tests should be as simple as a few mouse clicksEasy cross-browser and cross-device automated testing is a must-have, not a nice-to-have
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Bench Meters
A classic style multimeter with True RMS and phase rotation. This manual ranger covers the electrical parameters you need for HVACR and, with detachable test leads, works with our accessory heads to test non-electrical parameters too. The LT16A meter measures current, resistance, voltage, capacitance, frequency, continuity and more. Test leads store in the meter body along with the tilt stand and magnetic hanger. The body is constructed of durable ABS plastic and a blue backlight makes the large LCD even more visible.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Automated Testing for SAP
Autonomous Testing℠ for SAP
Designed for your SAP environment, Panaya Test Center is an integrated end-to-end testing platform, covering the entire functional testing spectrum including Unit Testing, System Integration Testing, Regression and UAT.
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PXI Very High Density Versatile 2-Pole MUX
40-613-002
The 40-613 Very High Density Versatile 2-pole Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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TestBench & Planar Biaxial Test Instruments
TestBench configurations were designed with component testing in mind, and thanks to their modular approach, a wide array of configurations and performance capabilities are possible. TestBench systems can be multi-channel and multi-axis, including planar biaxial testing.
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Plug And Socket Torque Test Machine
Shenzhen Chuangxin Instruments Co., Ltd.
Plug Torque Tester/Device is for compliance is checked by engaging the device, as during intended use, with the socket-outlet of a test apparatus. Plug Torque Tester is a device provided with pins intended to be introduced into fixed socket-outlets shall not impose undue strain on these socket-outlets.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Software Development
Release Quality Analytics
Software teams today are relying on insufficient data resulting in bad release decisions. SeaLights applies real-time analytics to hundreds of thousands of test executions, code changes, builds, historical data, and insights from production to determine release readiness.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Miniature Axial Extensometers
Model 3442
Jinan Testing Equipment IE Corporation
Weighing as little as 8 grams, these miniature extensometers are designed to have very low operating force with minimal specimen influence. All use an improved version of Epsilon’s dual flexure design which makes them very rugged for their size. With a module height of 15.2 mm (0.6 inches), they will fit in the limited space between grips that is typical with small test samples. Gauge lengths can be as short as 3 mm or as long as 50 mm. A newly designed gage setting pin and assembly allows the g...show more -
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Displays – LCD, TFT, OLED, Touch - 7-Segment Displays
Vishay’s 7-segment LED displays are used in a wide variety of end products including test and measurement equipment, point-of-sale terminals, telecom systems, office equipment, consumer electronics, and medical equipment. Options include 7 mm, 10 mm, and 13 mm leaded and surface-mount packages, and color choices including green, red, orange-red, yellow, soft orange, super red, and super yellow.
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Induced Signals Test
The test relates to interfering signals that may be generated by interconnected equipment. Induced signal testing is used to determine if equipment will withstand various signals, such as might be introduced by failures in other equipment to which the test unit is connected.
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Network Testing Portfolio
TEMS™
The TEMS™ Network Testing Portfolio allows you to optimize the quality of your mobile network by concentrating on user experience. TEMS gives you the ability to walk test, drive test, and dynamically analyze your mobile network under the real-life conditions your users experience—indoors, outdoors, and around the clock.
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Footwear Testing Machines
Dongguan Amade Instruments Technology Co., Ltd
Footwear testing machines are designed to determine a variety of mechanical and chemical performances of different types of shoe materials and finished shoes including sneakers, high-heeled shoes, leather shoes, casual shoes, etc. There are appearance performance tests including yellow resistance test, ageing resistance test, fastness resistance test, etc, physical performance tests containing flexing resistance test, rubbing resistance test, anti-slip test, etc, biological and chemical performance tests covering PH test, Formaldehyde content test, flame retardant test, etc, and service life test. Applicable to standards of ISO20344, SATRA, ASTM, etc.
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I3C Protocol Analyzer and Exerciser
PGY-I3C-EX-PD
Prodigy Technovations Pvt. Ltd.
I3C Protocol Analyzer (PGY-I3C-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. I3C Serial bus interface is emerging as a chosen interface for all future sensor connectivity in mobile phone and automotive Industry. This could also be chosen for low cost, reliable interface for future embedded electronic applications to address the new data intensive applications.
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Integrated Function Tester for Inductance Ballast
UI2001B
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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EMC Testers
The KES7000 System is a conductive immunity test system that is fully compliant with ISO7637-2 and ISO7637-3, international standards for EMC testing required for automotive electronic components. This system consists of the KES7700 Series Transient Surge Tester, KES7400A Series Voltage variation simulator and KES7100 application software dedicated to the KES7000 system. This product configuration supports JASO standards and the special test requirements of car manufacturers with options or custom orders.
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Custom Test Fixtures
For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements.
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Accessibility Probe
Shenzhen Chuangxin Instruments Co., Ltd.
Temperature test probe surface temperature probe
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AC Warning System
AC-15
Monitors AC on pipelines or structuresAlarm at 15v AC ThresholdConforms to NACE SP0177-2007Audio and Visual AlarmsCalibration Test UnitSuperbright LED'sReplaceable 9v Batteries
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Secondary Injection Relay Test Set
TD 1000 PLUS
TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
