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Head Expanders
By increasing the mounting area of the shaker, multiple items can be tested at the same time, decreasing total test cycle time. In addition, with Guided Head Expanders, payloads with large foot prints can be safely mounted and tested on the shaker, minimizing the risk of damage to the shaker suspension system. Although many head expanders are resonant below 1000 Hz, average or extremal control allows operation to 2000 Hz.
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Electrical Testing Services
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
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Three-Phase compact Electric Power/Energy
MC133C
The Model MC133C is a compact single housed three phase electric power/energy calibrator. It can supply the device under test with precision one phase AC voltage and current with calibrated phase shift along with DC voltage and current. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A.
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The Ultimate Circuit Tester Kit
28640
The tester kit tests low voltage up to 28 volts. Also finds electrical shorts, checks polarity, detects battery drain, and checks circuits from a distance. Heavy-duty coil cord extends over 8 feet. Detachable, spring-loaded hook pulls the center of the wire into the probe every time. Attach alligator clip to the probe when a clip-on connection is needed.
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Compression Test Apparatus
CT-20 C
Is designed to perform tests specified in many standards where resistance of insulating materials to elevated operating temperatures is to be determined. It is used to test insulation materials used in Electrical Appliances, Electrical wiring accessories, luminaires, motors, connectors, etc. The test ensures that external parts of insulating material, the deterioration of which might cause the appliance to fail to comply with the relevant standards, are sufficiently resistant to heat
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Filter Testers
All filter test equipment from TSI, used for testing efficiencies of filter media and a variety of air filters, including high and very high-efficiency filters, respiratory filters, cartridges, and protective garments, is known for its simple and reliable operation. All of our filter testers can determine the efficiency of filters using submicron poly- and monodisperse oil and/or sodium chloride aerosol. Additionally, TSI's filter test solutions are used to comply with various testing standards and regulations around the globe.
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Cable + Network Tester
LinkIQ
The LinkIQ™ Network+Cable Tester is designed to provide trusted cable testing along with network testing professionals need to do their jobs. LinkIQ™ validates cable performance (up to 10 Gig) using frequency-based measurements and provides distance to fault information along with a wire map of the cable under test.
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Climatic Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Climatic test chambers are also referred as environmental test chambers, which is the general name of various test chambers that simulate the natural climate environment of raining, high temperature, low temperature, constant temperature, illumination, dewing etc, products including constant temperature chamber, constant humidity chamber, ozone aging test chamber, UV accelerated weathering tester, vacuum hot air oven, salt spray chamber, steam aging tester, rain test chamber, dust proof test chamber, ventilation aging chamber, xenon lamp weathering test chamber and so on.
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Highly Accelerated Stress Screening (HASS) Test
HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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PXI Switched Guard Reed Relay Module, 26x SPST
40-121-001
The 40-121-001 provides 26x SPST switches in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
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RF Test Enclosure With Preconfigured I/O Panels, ≥ 90 dB Isolation, 300 MHz - 18 GHz
dbSAFE X
The dbSAFEx Series advanced shielded boxes are versatile for any wireless testing. Designed to operate between 300 MHz to 18 GHz, testing of wireless devices has never been more reliable and affordable.
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PXI Versatile Multiplexer, Solid State, 350mA, 60V
40-681A-001
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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Bias Network, 100 MHz to 12.4 GHz
11590B
The Keysight 11590B broadband high power bias networks can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF port.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 925Ω
40-298-021
The 40-298-021 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Structural Test ICP® Accelerometers
Conventional structural test data systems use few to several hundred sensors. Cables bundles can be complex and confusing resulting in setup errors. Sensors with TEDS (Transducer Electronic Data Sheet) allow for an internal sensor digital chip to store sensor information. This information contains descriptive identifiers that when connected to a TEDS compatible signal conditioner or data system, reads the descriptive information and automatically aligns the data system. Human error is minimi...show more -
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Diamond Testers
Napco Precision Instruments Co
Jewelry Tester is an account of full wavelength spectrum analyzer. It can appraise true or false and whether or not dyed of jewelry. its wavelength range from ultraviolet to near infrared. it can test spectral reflectance curve of hundred kinds of jewelry effectively.
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PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 472Ω
40-253-020
The 40-253-020 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Impact Testing Machine (Izod & Charpy)
Suitable for Charpy & Izod Impact tests on different materials. It is based on Pendulum principle.Rigid designs of instrument frame & other parts assure minimum energy absorption during fracture which results in improved test accuracies.The highly strained & wearing parts like support blocks & strikers are of special alloy steels duly heat treated.Direct indication of Impact energy absorbed by sample on large dial -Safety guard for the user is provided.Initial potential energy fo...show more -
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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DC Electronic Load, Single-Input: 150V, 40A, 250W
EL33133A
The Keysight EL33133A bench DC electronic load provides a single input and a built-in data logger. Provide static or dynamic load test up to 40 A and 150 V. Display results in a meter view or over time using the built-in data logger.
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Equipment Monitoring Module
DR YIELD software & solutions GmbH
The Equipment Monitoring Module (EMM) allows the control of specific tools using product test data.
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Hi-Q Laser RIN Analyzer
OE4001
The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.
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PCI High Density Resistor Card 18-Channel, 8 Bit, 0 To 255 Ohm
50-295A-121-18/8
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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MCB Tripping Current Characteristic Test Bench
The SCR Elektroniks 12 station MCB Tripping Characteristics Test Bench is optimally designed to verify the Tripping Characteristic of MCBs as per clause 9.10.1 of IEC 60898 (Also mentioned in Indian Standards IS 8828). The bench essentially comprises of Servo Controlled mechanism to set and maintain desired current (against incoming mains fluctuation) and a Micro controller based master controller unit plus timer, which governs the entire sequence of operation making it a stand-alone system once the user connects the MCB and configures the test parameters.
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Performance & Load Testing for APIs, Mobile and Web Apps
Test the performance of any mobile app, website or API in under 10 minutes. Simulate up to one million users with our developer-friendly, self service platform. 100% compatible with Open Source Apache JMeter. Supports Selenium.
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Bathless Tablet Disintegration Instrument
sensIR 3200
Distek’s sensIR 3200 uses proven bathless heating to offer a disintegrator without the hassle of and inconveniences associated with conventional water bath-based instruments. By eliminating the water bath and utilizing a sleek modular unit, Distek’s sensIR 3200 offers two, four or six disintegration test stations in the smallest foot print of any comparably equipped model.
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Test Loads
ML11
Each test load provides two test operations for verifying functionality of a Hipot Tester and Ground Continuity Tester. Provides two ground continuity tests (open and short) at up to 35 amperes maximum
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Pocket Type Digital Multimeter
MCD-007
MULTI MEASURING INSTRUMENTS Co., Ltd.
・Easy operation with rotary switch.・AC/DC voltage, resistance, continuity check and diode test with full autoranging operation.・3200 count full scale with bargraph display.・Low power consumption with auto power off function.
