Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Generator Insulation Resistance Tester
WA2670
Wuhan Sangao Electrical Test Installations Limit Co.
WA2670 series insulation resistance testing instrument is special use for internal water cooling generator's measurement test. Meanwhile, can also be used in laboratory or field insulation test.20mA.5000V. The output current is greater than 20mA,Maximum output voltage is 5000V.With high precision micro current measurement system, digital boost system.Only need a high-voltage line and a signal line connecting the sample can be measured.Only need a high-voltage line and a signal line connecting the sample can be measured.Automatic measurement, the results from the large screen liquid crystal display, and the results are stored.
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 13.6Ω
40-252-031
The 40-252-031 is a programmable resistor module with 2 channels which can be set between 2Ω and 13,6kΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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Obsolete ATE, Replacement Systems
No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 3.55kΩ
40-252-023
The 40-252-023 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Analyzers
BA500 Series
The BA500 analyzers are high performance battery analyzers with charge and discharge capabilities. The analyzers connect to your computer via USB and the BA500WIN software program is used to control the analyzer and battery under test. This system has a fast data collection system allowing you to collect and view as much data as required. Once you collect this data you can graph, analyze & save it.
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ACCUplace Position Grid
AP-P Series
The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
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Test Adapters / Aeroflex Test System
52xx / 5300
We develop and manufacture test adapters for your existing interface including documentation and test program
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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 1.02k Ohm - SPST
50-294-121
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI Expandable 16x16 RF Matrix 75Ohm Type 43
45-720A-711
The 45-720A module is a 6U 16x16 RF Matrix suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximises isolation and RF performance.
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Cone Penetration Tester
DRK8096
Shandong Drick Instruments Co., Ltd.
Determination of compliance with national standards GB / T26991, were compact design, LCD display, automatic data collection and the corresponding statistical calculations, measurement report printout.It can connect the PC output data.The entire testing process is very simple, in full compliance with the provisions of the State Pharmacopoeia. Accurate measurement results, which has good reproducibility, stability of the system.
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PV-IV Solutions
We offer a broad range of PV IV Measurement systems for measuring solar cells from 3 mm to 300 x 300 mm. The wide range of solar simulators, vacuum chuck test stations, and electronic loads make it impossible to list “standard solutions” Most systems are put together for individual customer needs based on cell type and contact geometry of the devices being tested. Over the last several years we have designed and manufactured a wide range test solutions for many different types of cells and contact geometries. In most cases a customized solution is no more than a slight customization of a standard platform that has been previously designed.
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Test Benches DC
Combined with a power source system e.g. MTS750 this test bench is used as a DC meter test system with 40 test positions.
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JIS/ASTM Standard-Compliant Plastic Bending Test System
Testing of Plastic in Accordance with JIS, ISO and ASTM Standards Can Be Performed
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably....show more -
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HDD-8261, 4 TB, 6-Drive, PXI Data Storage Module
784192-01
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
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1x4 Optical Switch Module
81595B
The plug-in module for Keysight's Lightwave Solution Platform 8163B, 8164B, 8166B is ideal for flexible system configuration in applications such as transceiver/receiver test with small foot-print or multiple passive component test with complex cascade.
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Dust Chamber Manufacturer
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. is a good dust chamber manufacturer and made a 3380 liters blowing sand and dust test chamber for a Vietnam customer last week. The controller system of this 3380 liters dust test chamber can be connected to the computer.
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EMI and EMC Test System
EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Test System
Maynuo Electronic Co.,Ltd a professional R & D and production of programmable DC electronic loads, programmable DC power supply, high power load, power supply, AC power supply, power supply, such as testing high-performance mobile phone test equipment and facilities, as well as electrical, electronic, aerospace, military, chemical, automotive, battery charger, battery, solar cell production lines and other industries to provide automated testing program. The company has many years experience...show more -
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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NDT And Ultrasonic Testing
ToronTech offers a wide range of Non-destructive testing (NDT) techniques & machines to evaluate the properties of a material, component or system without causing damage.
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Slip Table Assembly
ST Series
The ST Series Slip Table Assembly is one of three base configurations offered by Unholtz-Dickie for its vibration test systems. It is ideally suited for sequential 3-axis test capability with minimized cross axis response; for testing heavy, oversized, or non-symmetrical loads; and for products where orientation with respect to gravity is necessary.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Combination Board Tester
ATE QT2256-640 PXI
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform...show more