Showing results: 751 - 765 of 5277 items found.
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LXinstruments GmbH
The system is used for design verification of RF assemblies. By using similar measurement technology and test software as in the production testers, parts of the test procedures developed in development can be reused in production. The DUTs are tested in RF-tight shield boxes and contacted via original plugs. The shield boxes are connected via N-connectors and other typical laboratory contacts. This allows test setups to be easily modified and individual signal paths to be separated.
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SL1002A -
Keysight Technologies
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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nm-Wave AARTS System -
Accel-RF Corporation
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Pickering Interfaces Ltd.
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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SBExpress-DT4 -
SANBlaze Technology, Inc.
The SANBlaze SBExpress-DT4 (Desktop, Gen 4) is a complete turnkey PCIe® Gen 4 NVMe SSD validation test system. With industry leading Certified by SANBlaze automated testing, the SBExpress-DT4 brings Enterprise Class NVMe validation to the developer's desktop.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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KVXJ -
KV Hipot Power Test Equipment Co.,Ltd
KVXJ SF6 Gas Online Monitor Test System is mainly applied on 35KV SF6 500KV, 220KV, 110KV GIS in the substation to monitor the SF6 gas leakage in the SF6 combined electrical equipment room environment and the oxygen content in the air in real time.
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CBC-50С (CBC-100C) -
Kharkovenergopribor Ltd.
Automatic systems CBC-C-series are designed for high-voltage withstand testing of electrical protective equipment and insulated hand tools. The tests are carried out with AC voltage (CBC-50C: UAC ≤ 50 kVRMS; CBC-100C: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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ViAcoustics
The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.
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ULTRAWAVEMX44 and ULTRAWAVEMX20-D16 -
Teradyne, Inc.
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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SL1700A Series -
Keysight Technologies
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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KRD42 series -
CME Technology Co. Ltd.
KRD42 series double lift zero drop tester is mainly suitable for large size packaging products to resist drop impact performance, its powerful power system and unique sample support for easy loading and unloading of oversized, overweight items, and automatically rise to the set height, complete the drop test.
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GATS-3200 -
W.M. Hague Company
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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SX-750SUPERⅣ -
OHT Inc.
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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onTAP Development -
Flynn Systems Corp.
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.