Showing results: 3166 - 3180 of 5277 items found.
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778952-02 -
NI
50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.
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Megger Group Ltd.
Transformer insulation resistance deterioration is one of the most common causes of transformer failure: a failing transformer is a costly replacement in an electrical system with the potential for a long downtime. If you fail to maintain your transformer with regular insulation resistance testing (as can be carried out by the Megger Transformer Ohmmeter (MTO) series of transformer test equipment) then it’s likely to fail before reaching its maximum operating life.
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ViTec Co. Ltd
The hardware part of the measuring system of the test bench is built on the basis of equipment from National Instruments and contains the following components: multichannel switching system for signal conditioning SCXI, interrogation system of "fast-changing" voltage signals and AC power PXI, including M-series NI PXI-6220 board for SCXI module measuring channels, a high-performance Ethernet controller for the distributed I / O system and industrial control cFP-2110 running operating systems hard real-time, multi-channel vibration measurement complex K-5101.
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UC8110 -
UC Instruments, Corp.
The UC8110 desktop tunable lasers offer superior performance for the test of DWDM components, AWG & PLC components, optical amplifiers, DWDM system and other general purpose of fiber optical test and measurement applications. It is a wavelength high accuracy, high power output, small dimension, fast startup, affordable tunable laser source system. UC INSTRUMENTS provides C band, L band, or C+L band tunable laser sources options.
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390PT -
PulseTech Products Corp.
The 390PT Battery and System Tester lets you quickly, safely and accurately test both 6-Volt and 12-Volt lead-acid flooded, AGM (flat and spiral plate) and gel cell batteries in or out of the vehicle and test 12-Volt and 24-Volt charging systems for proper operation. Combined singe load, dynamic resistance technology and algorithms display battery voltage and capacity in easy to understand results in seconds. The handy "QUICK START" instruction guide is printed on the back of the tester.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.
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National Technical Systems
Gravelometer testing is designed to evaluate the resistance of vehicle surface coatings (paint, clear coats, metallic plating, etc.) to chipping caused by the impacts of gravel and other flying objects in accordance with SAE and ASTM standards. The primary usage of this test is to simulate the effects of the impact of gravel or other debris on automotive parts. Test samples are typically mounted in the back of the Gravelometer, and air pressure is used to project 1 pint (approximately 300 pieces) of gravel at the sample. The test sample is then removed and gently wiped off with a clean cloth. Tape is then applied to the entire tested surface. Removal of the tape then pulls off any loose fragments of the coating. The appearance of the tested sample is then compared to standard transparencies supplied by SAE to determine the chipping ratings. Visual examination can also be used to describe where in the coating/substrate system that the failure has been induced.
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Ponovo Power Co., Ltd.
PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.
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MBP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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FLP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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XMC850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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PCIE850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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VPX850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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mTOP™ -
GL Communications Inc.
Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
