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ELECTRICAL TEST Kit
1021 TK
Standard Electric Works Co., Ltd
2950 CL ● Pocket size.● 4000 counts.● Full automatic measurement : Voltage measurement. Current measurement. Resistor measurement.● Data hold function.● Continuity check.● Diode measurement.● Select function.● Low battery indication.● Auto off function.● Flashlight (auto off in 1 minute). ALS-2 ● Use with any clamp meter.● x10 mode allows for more accurate measurements of low amperage devices.● x1 mode allows for direct reading.● 4mm voltmeter input jacks.● Integrated ground conductor.● 10 amp capacity.● 10cm plug cord for greater flexibility.
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Box Rain Test Chamber
Comprehensive box rain test chamber (with swing pipe and right angle tube) is used to test the electric and electronic devices by simulating natural rainfall with spraying water from the water nozzles (holes) on swing pipe or straight tube. To estimate and recognize if the shell or sealing elements of these device could ensure a good condition of working during and after the test. The products are widely used in the industries of light, electrical, electronics, automobile, motorcycle, household electric appliances, electromechanical equipment, instruments and meters, and other industries.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test p...show more -
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MANIA TEST PROBE
SERIES 76
ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Environmental Functional Test Fixtures
Circuit Check builds test fixtures for Halt/Hass testing whether a fixture is used within an environmental chamber or is a standalone fixture. Circuit Check has the capability to manufacture these types of fixtures.
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Long Range Cooled Thermal Sniper Sight
ThermoSight® HISS-XLR
The ThermoSight® HISS-XLR clip-on thermal weapon sight allows snipers to detect and recognize man-size targets in excess of 2,000 meters, an increase in engagement range of more than 25% compared to previous models. Designed to mount on any MIL-STD-1913 rail interface forward of an existing scope, HISS-XLR can interface with a wide range of day scopes and weapon platforms. Long-range optics coupled with an HD display provides crisp imagery, and portrait orientation compensates for bullet drop at extreme ranges.
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Insertion/Return Loss Test Station
JW3327
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW3327 Insertion/Return Loss Test Station is a Joinwit precise instrument, which be adopted advantages from current abroad instrument brand and improved to the application from clients, developed by Joinwit. It is a technological breakthrough in the domestic market and greatly improves the efficiency of IL test of optical devices to the MM with two wavelengths testing result in one station. It has extensive applications in the fiber cable, fiber passive device, fiber active device and optical communication system. It is suitable to perform the WIP testing and sample character testing for fiber device manufacturer research institutes.
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Test Accelerometer Sensitivity And Noise Test
Accelerometer Test Unit
*Quick and Accurate Accelerometer Test*Battery operation*All tests use 32-bit resolution A to D Converter*All data downloaded to PC via Ethernet link*Records all data to a flexible easy to use database*Records time and date of tests
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Test Patterns
DisplayMate Multimedia Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Phoronix Test Suite
Following the success of Phoronix in covering the Linux hardware scene, the Phoronix Test Suite was founded based upon the internal tools developed at Phoronix Media. The Phoronix Test Suite has a growing community and is used by numerous organizations and Fortune 500 companies. The Phoronix Test Suite continues to be developed and experiences major updates on a quarterly basis.
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Modular Test System
The GS-X modular system is used for functional testing of medical devices and for testing the electrical safety of medical and general portable devices.
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Bluetooth Tests
Devices that are equipped with Bluetooth® technology must, on the one hand, meet the respective country-specific regulatory test requirements, such as B. in accordance with FCC, ISED or CE, as well as test requirements of organizations such as the Bluetooth® SIG or the CTIA have to pass and meet in order to obtain market approval.
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High Voltage Test System
CKT-1180
The CKT 1180 is a High-Voltage Test System with up to 3500 VDC and 2800 VAC RMS leakage test capabilities.Originally designed for High-Speed Rail, the CKT 1180’s focus is to test assemblies that require extremely high reliability and work at elevated voltages.
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Test Fixtures
At Global Test Services LP, we know that verifiable yields are the backbone of your business, which is why we offer innovative, robust solutions that offer you better availability, improve efficiency, and offer flexible, scalable systems that meet the specific quality and test needs of your business.
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Combo Test Lead Kit
U8201A
Designed for use with U3606A DMM | DC power supply; includes leads, probes, alligator clips, SMT grabbers, and banana plugs
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VLF test system
BAUR PHG 80 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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SSD Test Systems
MPT3000HVM / MPT3000HVM2
As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.
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APU Test Cells
Atec is a leader in test cell design and construction for aircraft auxiliary power units (APUs). We are licensed and experienced for work with all major OEMs, DoD, and US Allies. Our Phoenix™ APU Cells feature common configuration, modular utilities, and fast installation and startup.
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Shielded Test Cell
With an operating frequency starting at 10kHz, the Standard Test Cell (STC) creates an ideal environment for testing wireless devices for such technologies as GSM, UMTS, CDMA, Bluetooth, DECT, etc. Developed for the R&D, production and quality control environments where space is critical.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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vibration test system
Labtone Test Equipment Co., LTD
Labtone EV series of electrodynamic shaker vibration test System simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications.Labtone EV series of electromagnetic vibration testing system simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications. In the laboratory, with the aid of vibration testing sys...show more -
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32-bit PCI Test Backplane
SKU-014-01
The 32-bit PCI Test Backplane was designed to support production testing/debugging of PCI-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into four 32-bit PCI slots via 7 ft CAT6 cable. The PCI backplane is a versatile platform that allows you to test up to 4 PCI boards at the same time, facilitates easy access to logic signals, provides hot-swap compatibility, and per-slot overcurrent protection.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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10 MHz to 33 GHz LAN Wide Dynamic Range Average Power Sensor
L2053XA
The Keysight L2053XA is a fast, accurate and wide dynamic range 10 MHz – 33 GHz LAN average power sensor.
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Function Test Module
FX Series
Each FX module is specified one which is suitable for 5 inches bay.You can operate each module on the specified software in PC. It is used USB connection between modules and PC.You can connect MAX 16 modules which include digital IO module,relay module and so on.In case you want to use function inspection system which are combined with several modules, it will implement by our environment generation software(FX-Builder) easily.It is possible to implement by your own software as each module is compatible for Active(X).(Notes)ActiveX is compatible for latest Windows 7 32bit.
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Peel Adhesion Test Equipment
Dongguan Kejian Instrument Co., Ltd.
This machine also known as a materials testing machine , is applicable to testing tensile stress, compressive stress, shearing force, peeling force, and elongation of materials, components, andfinished product for metal, plastic, rubber, textile, synthetic chemicals, wire and cable, leather,etc.
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Database Test Automation
Improve the Quality, Integrity, and Consistency of Databases in Mission-Critical Applications