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Bending Test Machines
Infinity Machine International Inc.
Bending Test Machines by Infinity Machine International Inc. - for applications such as bending cycle test machine wire wing left and right tester, 90° 180° bending wire swing test left and right optical cable repeated bend testing machine, cable bending durability tester, cable flex bending test machine, high precision bending test machines, and more.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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sbRIO-9229 , Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780874-01
Non-Enclosed, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9229 performs differential analog input. The sbRIO‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Non-enclosed modules are designed for OEM applications.
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PXI Resistor Module 2-Channel 2R to 32.7k with SPDT
40-293-132
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 62.1Ω
40-253-111
The 40-253-111 is a programmable resistor module with 1 channel which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements ...show more -
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AC Source
AFV-P
Intepro’s AFV-P Series is a programmable AC/DC output power source with precision measurement and control. This compact power source comes in four power levels, 600VA, 1250VA, 2500VA and 5000VA, providing clean power with distortion less than 0.3% at 40-100Hz. The AFV-P series delivers output voltage from 0 to 310VAC and frequency from 40 to 500Hz or 15 to 1000Hz with the high frequency option. It is ideal for commercial, defense and aerospace test applications from design verification, quality assurance, ATEs. The AFV-P Graphical Users Interface software makes it easy to setup complex testing of the AC input to the UUT.
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Applications
Whenever safety and cost efficiency are at stake, SuessCo sensors and monitoring systems are the first choice. Individual solutions can be developed for a large number of application areas.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Powered VXI Crates
6U VXI-C Size High Power Receiver Crate
The WIENER high power C-size VXI receiver mainframe is optimized for test applications with demanding power requirements. Up to 6kW DC power can be provided and distributed to the VXI modules.
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Applications
No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.
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Mobile Testing Center
MTC-1500
The Mobile Testing Center (MTC) is a preassembled, above ground, mobile, testing solution designed for outdoor testing applications. An affordable option to permanent Test Cells, the MTC is comprised of 2 ISO containers. Container 1 includes a Test Cell and heated and air-conditioned Control Room. Container 2 is optional and includes facility support equipment: Bulk Fuel Storage, Pneumatic System, Water Recirculation System (WRS), etc.
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Load & Fatigue Testing
DATASYST Engineering & Testing Services, Inc.
Due to variations in types and levels of load and fatigue exposure, DATASYST works with each client to determine the best possible test plan to capture the information and issues that may be present in application.
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Shielding Cube
CMQ200
The R&S®CMQ200 is a compact and fully integrated solution to cover most 5G devices in various applications. The drawer concept enables fully automated handling in manufacturing environments. The robust mechanical design ensures millions of test cycles for reliable mass production environments. The flexible cube design covers applications for smart devices, CPEs, RFIC and prototypes. R&S®CMQ200 is ready for 5G and other technologies in the frequency range from 20 GHz to 77 GHz.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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PXI/PXIe Wide Current Range Multiplexer Module, Quad 3-Channel, 2-Pole
42-514-103
The 40-514-103 (PXI) and 42-514-103 (PXIe) are low density multiplexers in quad 3-channel, 2-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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Software Applications
Excalibur Systems provides software utilities and applications programs to manage data communications for our products, which include Bus Controllers, Bus Monitors, Data Recorders and analytical flight Data Reconstructors. There are different applications for single & multi function MIL-STD-1553 and ARINC-429.
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Desktop Application
Desktop application testing refers to the testing of standalone software that can perform without a network, on a desktop, or on a laptop. Desktop applications are not affected by network downtime.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Cryogenic Lab Applications
Lake Shore products are used in a large variety of applications. Find your application here to see the recommended products.
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Application Lifecycle Management
ALM
Addressing workload complexity through efficient use of Application Lifecycle Management (ALM) tools and automation to lead to upwards of 10x ROI
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Special Application
Columbia Research Laboratories
This group of Piezoelectric Accelerometers have been specifically designed to meet Columbia Research Labs customers "special" needs. Whether it be our model 876 designed for use in extremely cold temperatures (-400°F) or our model 378-HT-1XP, designed with an extremely rugged housing for prolonged use in adverse industrial environments of shock, vibration, temperature, humidity and excessive oil, that can withstand temperatures of 700°F. We would be happy to see this list of sensors grow to meet your needs. Please call us so we can make something "special" for you.
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PCI High Density Resistor Card 5-Channel, 12-Bit, 0 To 4k Ohm
50-295A-021-5/12
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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User Defined Application Software
D9010UDAA
User defined application (UDA) is a fully customizable automated test application for your DCA, Infiniium or InfiniiVision oscilloscope. It provides full automation, including the ability to control other test and measurement devices. The development environment is free to download today, so you can begin to create your own UDAs. Simply download the software, install it on your desktop or scope, and begin developing the automated test packages you need.
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BGAN Application Tester
BAT
Square Peg Communications Inc.
While the BNE is tailored to the terminal development process, the BGAN Application Tester (BAT), is tailored towards application developers and provides a graphical user interface designed to simplify BGAN application testing.
