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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-02
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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2.5mm Test Wire Test Probe Pin
CX-3C
Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test wire test probe pin 1.Application: Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool.
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Relays & Switches - Packaged-InP
Teledyne Relays' packaged SPDT Indium Phosphide Active RF Switches provide low insertion loss and high linearity, with bandwidths from DC up to 60GHz. These switches also maintain excellent signal integrity beyond 40Gbps, and have a very compact package size of 3mm x 3mm x 1mm. Teledyne's Active RF switches are ideal for test and measurement systems, microwave communication, and radar applications.
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PXI Precision Resistor Module, 4-Channel, 2 to 6.97k
40-297-130
This 4-channel PXI precision resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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300-Watt AC/DC Power Supply, 6U VME
Model 56SQ2
NAI’s 56SQ2 is a 300 Watt AC/DC Power Supply that uses two slots in a standard VME chassis. It is conduction-cooled through the card edge/wedgelock. This power supply accepts either a single- or three-phase input and provides up to 5 standard VME outputs plus standby at 300 Watts. It is designed for VME and general purpose applications. An onboard microcontroller allows for design flexibility.Standard features include continuous Background Built-in-Test (BIT); remote error sensing; holdup time; ...show more -
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 8.19k Ohm - SPST
40-294-124
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Source / Measure Units
A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 122Ω
40-253-112
The 40-253-112 is a programmable resistor module with 1 channel which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Waveguide Harmonic Mixers (smart mixer), 50 to 75/80 GHz
M1970V
The Keysight M1970V 50 to 75/80 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of the N9030A PXA, N9020A MXA, and N9010A EXAsignal analyzers up to 80 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve your DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Cooled MWIR High-Sensitivity Camera
FLIR GF335
If you need a mobile camera that can detect extremely subtle temperature differences, the FLIR GF335 Broadband is the camera for you. The GF335 is a high sensitivity, low noise, cooled thermal camera that excels at detecting faint heat signatures. It is well suited to a wide range of applications, including use on test ranges, non-destructive testing, research, and science applications.
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Teraohmmeter/IR Tester
98x
The new 981i and 983i Teraohmmeters are designed to tackle the toughest High Resistance measurement applications. Demanding applications that most other IR testers won’t measure up to. So when it’s time to test higher voltage IR values like today’s electric vehicle systems and higher voltage solar arrays — look to Vitrek to deliver the IR tester you need for your production line.
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LabVIEW Full Development System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Software Platform Bundle
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.
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PCI High Voltage MUX
50-350-001
The 50-350-001 is a Short PCI Card designed as a high voltage multiplexer for use in a Submarine Cable Testing Application. It is designed to allow the dynamic connection of various test instruments to 1 of 16 test points. The multiplexer may be operated as a conventional multiplexer with break-before-make action when a new channel is selected.
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PXI Medium Density Switch Matrix Modules
Pickering's range of medium density switch matrix modules is a cost-effective solution for applications that require mid-range matrices in the PXI format. Selected modules are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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PXI Programmable Resistor Card 2-Channel 3 Ohm to 65.5k Ohm - SPST
40-294-133
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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AC Hipot Test Set
Weshine Electric Manufacturing Co., Ltd
AC Hipot Test Equipment for Dielectric Withstand Test are suitable for 50 / 60 Hz AC testing of low capacity test objects. Optionally, these units can also be upgraded to function as DC test sets by mounting the rectifier attachment on top of the transformer.Weshine® AC Hipot Test Set for AC hipot test can be equipped with a rectifier attachment for DC voltage testing.Typical application areas:Testing of cables Testing of switchgearTesting of transformersTesting of CP & PTTesting of MV systems
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Tensile & Compression Testing
If you are looking for a value on the forces needed to assemble a product, or what it will take to overcome a connector latch or other device that mates together, let Environment Associates perform these tests for you. We can test in both tensile and compression on samples that are less than 14" (35.56 cm) wide and can handle product travel less than 54" (137.6 cm), with sensitivities at 0.01 lbs. (4.53 grams) at a wide range of speeds. EA specializes in the determination of connector performance for many different applications and styles.
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MTM-EtherStem: Ethernet Microcontroller Module
SIMPLIFY INTERFACING: The MTM-Ether-Stem allows communication between host-based applications and any MTM module on the BrainStem bus. Designed for test direction, control, data collection, or loading reflex programs.
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EMS Test System
TS9982
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Thermal Test Vehicles
TTV
Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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STANAG3910/EFEX Test And Simulation Module for Standard Ethernet
ANET3910
STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.
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LFA-3000 Light Flicker Analyzer
Hangzhou Everfine Photo-E-Info Co., LTD
LFA-3000 can simulate flickering measurement and analysis under various voltage fluctuation conditions, and the system has built-in standard voltage waveform database, one operation can complete the test and analysis of IEC 61547-1, convenient and fast. Meet the lighting product design, quality inspection and application of flickering test analysis needs.
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Test Automation Platform Developer's System
KS8400A
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω to 925Ω
50-298-021
The 50-298-021 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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SLSC and CRIO Modules and Accessories
Our approach to delivering a high-quality Aerospace, Automated Test Equipment (ATE) asset begins with leveraging National Instruments hardware and software standard platforms. Beginning with high quality instrument platforms for standard Input and Output (I/O), we leverage NI’s PXI and Compact RIO platforms. Extending these system is NI’s unique platform for Switching, Loads and Signal Conditioning (SLSC), which allow the standard I/O to be customized for high performance aerospace industry applications.
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Electric Vehicle Test Solution
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Sy...show more -
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.