Showing results: 1756 - 1770 of 2704 items found.
-
781352-01 -
NI
Master/Slave, C Series PROFIBUS Interface Module - The cRIO-PB-MS connects NI programmable automation controllers (PACs) to PROFIBUS industrial networks as powerful masters or slaves. The interface includes the NI‑PROFIBUS for CompactRIO instrument driver for human machine … interface (HMI) and SCADA applications, as well as a graphical networking Configurator software. You can perform PROFIBUS device automated test using these interfaces. The cRIO-PB-MS is compatible with only CompactRIO systems.
-
4300C -
Valhalla Scientific Inc.
The 4300C is the perfect instrument for tackling ultra-low resistance testing requirements associated with motors, transformers, fuses, connectors, breakers, bonding/weld resistance, and many other applications. The 4300C Digital Micro-Ohmmeter measures a variety of low-resistance devices ranging in value from 100nΩ to 20kΩ. The flexible measurement format of the 4300C provides six ranges of user selectable test current (from 0.1mA to 10A) and three voltage sensitivity settings (20mV, 200mV, and 2V).
-
779730-01 -
NI
PXIe, 18-Slot (9 PXI Slots, 3 PXIe Slots), Up to 3 GB/s PXI Chassis—The PXIe‑1065 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1065 has nine PXI peripheral slots, one PXI Express slot with system timing capabilities, three PXI Express slots, and four hybrid slots that accept both PXI and PXI Express peripheral modules.
-
Triplett Test Equipment & Tools
1000A True RMS AC/DC clamp-on meter with a backlit LCD display. It offers a large variety of measurement features including AC/DC Current, AC/DC Voltage, Resistance, Temperature, Capacitance, Continuity, Diode Test and NCV Detector. The rubberized overmolded housing provides impact and drop resistance in a sleek ergonomic design, and the user-friendly Auto Power Off feature helps maximizes battery life. With a CAT III 600V design, it provides superior resistance to damage from transient overvoltages in any demanding industrial setting. The Model 9325 is suited for a variety of industrial and residential applications such as security, electrical, HVAC installations and more. Includes test leads, Type K Temperature probe, 9V battery, and case.
-
786888-01 -
NI
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
-
Teledyne LeCroy
Fibre Channel continues to evolve as the preferred communications standard for mission critical and time sensitive Storage Area Network (SAN) applications. Fibre Channel supplies over 80% of the datacenter and enterprise interconnections where lossless delivery of data is required and will be used for many years to come. Gen 6 (32GFC) products and solutions are rapidly being deployed ubiquitously across key markets today.The Fibre Channel industry is now focusing efforts on the development of Gen 7 – 64GFC utilizing PAM4 signaling – and will continue to serve those applications needing higher bandwidth and guaranteed delivery of time and content sensitive data.The SierraNet Family of Fibre Channel test platforms provides best in class traffic capture, analysis, and manipulation for testing physical link characteristics and application operations. SierraNet is designed for addressing today’s high-speed storage and communications fabrics problems and compliments other tools offering industry leading visibility and utility.
-
40-664A-001 -
Pickering Interfaces Ltd.
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
-
1507 -
Fluke Corporation
The Fluke 1507 is a versatile, compact, handheld insulation tester for advanced industrial and electrical insulation testing. Its multiple test voltages make it the ideal tool for many troubleshooting, commissioning, and preventative maintenance applications.
-
40-664A-002 -
Pickering Interfaces Ltd.
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
-
Power Diagnostix Systems GmbH
On-site transformer testing is the main application of Power Diagnostix' mobile high voltage AC test system. However, it can be used as well for other on-site testing, such as of GIS, rotating machines, or high voltage cables.
-
ABB Ltd.
Test switches are designed and manufactured to allow quick and easy multi-circuit testing of switchboard relays, meters and instruments by any conventional system.These test switches and related test plugs have the features necessary for applications involving the measurement of individual currents and voltages associated with substation instrumentation and protection devices. They have been especially designed for the measurement of potential elements, current elements, and make-before-break short-circuit elements related to Current Transformer (CT) circuits.
-
National Technical Systems
NTS electronics failure analysis capabilities can be utilized to improve yield, determine root cause of failure, extrapolate life expectancy and improve reliability, and increase performance on integrated circuits (ICs), printed circuit boards (PCBs), and passive surface mount devices as well as materials and assemblies.Electronics F/A can provide detailed information regarding the performance of materials and devices in their intended end-use application. When a device or material does not meet its performance expectations, a F/A should be performed to identify the root cause of failure. The information presented in the root cause F/A will allow the product designer, manager, test and process engineers, or end-user to identify design, selection, test, and process deficiencies. Recommendations for corrective actions from the failure analysis report can then be evaluated and implemented to enhance product reliability and performance. By having an unbiased F/A performed by an independent test laboratory, the liability of a failed device or material can be converted into an asset, resulting in production of higher quality products.
-
XF07-516 -
Curtiss-Wright Defense Solutions
The XF07-516 is a rugged quad channel 250MSPS 16-bit digital receiver XMC. The ADC devices directly interfaces to a user programmable Xilinx FPGA which allows high performance processing such as Digital Down Conversion (DDC), filtering and custom algorithms. The combination of direct high-speed, high-resolution analog I/O ports and next FPGA processing makes the XF07-516 ideal for demanding applications including radar, imaging and test equipment across both commercial and defense market spaces.
-
Guzik Technical Enterprises
The Guzik miniature AE sensor with isolated integral 30 dB preamplifier has a wide-band and excellent frequency response over the range of up-to 1 MHz. Its small size makes the sensor ideal for hard disk drive test or similar applications requiring very small size, low weight, wideband AE sensor response and high sensitivity. A small diameter, external flexible cable connects the sensor with a 3-pin JST connector on the other end.
-
DST200 -
Rohde & Schwarz GmbH & Co. KG
The R&S®DST200 RF diagnostic chamber is the ideal environment for RF analysis during development. It supports a wide range of radiated test applications for wireless devices and fits on any R&D lab bench, where it can be used at all times during the product design and optimization phase. The R&S®DST200 effectively assists in achieving high first-time pass rates during final type approval, which saves time and money.
