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Buchholz Relay Test Benches
HAOMAI Electric Test Equipment Co., Ltd.
Buchholz relays are used to protect transformers, and these test benches perform necessary quality and performance checks.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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MIPI Receiver Test Solution
M8085A
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Customized Electrical Test Optical Inspection
Landrex Technologies Co., Ltd.
Customized Electrical Test Optical Inspection
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Analog Test Solutions
ATX series
The ATX series of instruments are designed for applications that require an analog performance that is not achievable with industry standard platforms like PXI(e).
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Bed of Nails Test Clips
142-2
These multi-purpose test clips are a great way to tap live readings. Unique micro pins cause less damage, should you decide to pierce the wire's insulation.
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Product Test & Measurement Development Software tools
Tequra Requirements
Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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3KV High Voltage Test
45EHV/VC20EHV: 4.5inch High Voltage Motherboard for Celadon Element™ 20mm VC20EHV VersaCore™ and VersaJet™ System
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Test Manufacturing
Since forming in 1986, Amfax has always recognised the importance of having a strong manufacturing department in house, staffed by skilled qualified individuals.
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UV Test Chamber
Wewon Environmental Chambers Co, Ltd.
* UV test chamber simulates damaging effects of long term outdoor exposure of materials and coatings by exposing test samples to varying conditions of the most aggressive components of weathering – ultraviolet radiation, moisture and heat. * UV test chamber use fluorescent lamps to provide a radiation spectrum centered in the ultraviolet wavelengths. Moisture is provided by forced condensation, and temperature is controlled by heaters. Based on your testing sample’s size, We has two options uv test chambers for choice.
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LED Optical Aging Test Instrument
LEDLM-80PL
LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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Stationary Circuit Breaker Test System
ACTAS C160
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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Radar level sensors: applications & products
Our radar level sensors offer reliable, fast level measurement with micrometer-level accuracy. This opens up new applications for level measurement – for example, in the level control of molten steel or aluminum for the metal industry or in the high-precision flow measurement of bulk material on conveyor belts for the mining industry.
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General Purpose Test Probes
Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Built-In Relay Self-Test Diagnostic Test Tool
BIRST
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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In-Circuit Test Fixtures
In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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H(3)TRB & HTGB Test Systems
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Impact Test Apparatus
IT-50
Impact test is an essential physical test prescribed in many standards to test samples for mechanical shock. It is designed to perform such tests. The test is carried out to ensure that the test items have adequate mechanical strength to withstand the stresses and rough handling imposed during installation and use. It is adapted to test various types of electrical accessories such as switches, sockets, plugs, starter seats and other electrical appliances.
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VME Test System
VMETS
Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Combo Test Lead Kit
U8201A
Designed for use with U3606A DMM | DC power supply; includes leads, probes, alligator clips, SMT grabbers, and banana plugs
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LED Lighting Test Instrument Integrating Sphere
CX-I.5S
Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
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Electrodynamic Vibration Test Systems
J-series
J-series is a high-functionality system that offers usability and durability furnished with functions that accommodate high velocity and large displacement testing.
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Actuation Methods for Functional Test Systems
Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Magnetic Material Test Fixture
16454A
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Tone Test Set
240 Weathertite
The AINES Model 240 Tone Test Set is a water resistant tone generator equipped with a weathertite 2 conductor modular cord and jack. The set can be connected to the Network Interface Device (NID) with either the two individual clips or the modular cord. This allows the CPE circuit to be viewed in both directions, towards the Central Office and towards the customer premise. In the event the CPE does not have a jack, but instead has a cord, plug the cord into the Model 240s jack and transmit tone!
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Test Design on Demand Services
Our team of QA professionals is ready to start immediately on your project and will guarantee meeting the deadline that is suitable for your business.