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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Vibration Test Technology
These vibration exciters (also called shakers) use permanent magnets and are available as portable and stationary systems for simulating ambient vibration conditions. Robust design ensures a long service life, and typical applications include structure analysis and testing smaller subassemblies. These shakers are characterized by high lateral and axial stiffness and come in lightweight construction as specified by industrial users.
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DC High-Voltage Test Device
PGK 25
BAUR Prüf- und Messtechnik GmbH
Cable testing with the BAUR PGK 25. Cables must be tested in compliance with the national and international standards. This applies before the commissioning of new cable networks. The portable BAUR PGK 25 cable test device is used for DC voltage testing in low- and medium-voltage cables. It is characterised by its low weight of only 16.5 kg, by the easy operation and solid construction for onsite use.* Compact device for DC voltage testing with negative polarity* Continuously adjustable output voltage* Perfect for mobile use
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ASI Test Equipment
ASI has designed its own line of aviation electronics test equipment utilizing modern design and manufacturing techniques. Being primarily a service facility, ASI is able to identify what type of test equipment is required in the avionics field from a service technician's view. This equipment is designed with the technician in mind, for ease of operation and maintenance.
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Test Switches and Accessories
FT Flexitest Family
The ABB FT test kit comes with a convenient carrying case to hold your hand held meter, test plugs patch cords, clips, and test probes in neat order. Patch cords are highly durable and flexible. Test switch accessories include: Test plugs Test kits Covers Interlocking bars Miscellaneous
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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EIA Test Charts
EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Flight Test Switches
Curtiss-Wright Defense Solutions
Our compact, deterministic flight test switches have been qualified to reliably deliver high-speed, real-time data with a wide temperature operation ranging from -40 to 85°C. Their rapid boot-up capability minimizes data loss from power outages, while their flexible forwarding and filtering configurations can send what is required to multiple destinations for real-time monitoring, recording, and transmission.
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Antenna Test Chambers
Special design for low PIM antenna measurements Shielding > 90 dB Frequency Range 700/1000 MHz to 6000 MHz Residual PIM < -165 dBc (@ 2 x 43 dBm) Up to 6 antenna ports for multi-band and MIMO antennas Standard models for antennas up to 2.7 m length Customized solutions available on request
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Fine Tip Test Probes
U1164A
Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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MANUAL TEST FIXTURE KITS
SERIES 5590
Built with unique design features: Ease of assembly and disassembly All side panels are removable Side panel material is delrin for easy machining for connectors, switches etc.Light weight and durable construction2" Between Probe plate and lid plate allowing more room for tall board components
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Low to Medium Test Volume
KI-TK072
1310/1550 nm & 850/1300 nm source & Autotest power meter + acceptance reporting software, inspection microscope, cleaning materials. Interchangeable SC & LC connectors
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Universal Test Machine Stands
FTUS
Portable, adjustable height, stands are available for all FTU chamber models. They support the chamber without transferring weight to your testing machine. Standard Universal Test Machine stands are furnished with an 18 inch, electrically actuated, lift system, four swivel casters with locks, and an all welded frame. Four types of stands are available
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Battery Pack Test System
*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery.
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Function Test Systems
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Test Samples
Performance testing of metal detection equipment is a crucial part of a food safety and quality management system. Confirming the correct performance of your detector at regular intervals ensures your system is compliant with programs like FSMA, SQF, GFS, BRC and other relevant auditing schemes.
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Electrolyser Test Software
Greenlight's control and automation software for electrolyser testing offers exceptional functionality with a user-friendly graphical interface. Enhanced with our proprietary automation language, Emerald comprehensively manages the full range of electrolyser test system parameters. The simple user-friendly interface permits even novices to begin testing in minutes.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Small Test Boxes
In today’s environment a small specific test box may be needed to test a component, perform R&D or simply tweak your product. Cuming Lehman Chambers has the ability to custom design and construct a precise test box to meet your specific needs.
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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PCB Test Points and Terminals
Our PCB test points and terminals feature a large loop for easy probe attachment or to facilitate the clipping on of other components. They are ideal for components which need frequent replacement and are also suitable for raising hot components above the surface of the PCB.
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Altitude Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
The altitude test chambers of Sanwood Technology is designed to allow users to perform temperature, humidity, and altitude condition tests in a combined test chamber, and create multiple conditions to meet multiple test requirements at the same time.
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In-Circuit Test Systems
Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.