System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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DC System Power Supply, 6 V, 100 A, 600 W
N5741A
The single output, 600 W N5741A provides universal AC input, GPIB, LAN, USB, LXI compliance, and analog/resistance control of output voltage and current
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Measurement System
BLS-I/BCT-400
The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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Server Power And Back Up Unit Test Solutions
Built on the proven Chroma 8000 ATS platform, these customizable solutions are specifically designed for automated testing of server PSUs, power shelves, rack power systems, bidirectional DC/DC converters for BBUs, and low-voltage high-current DC/DC converters for motherboards.
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Fanless Embedded System With LGA1151 Socket 7th/6th Gen Intel® Core™ & Celeron® Processor, Intel® Q170, 2 HDMI, DisplayPort, 4 GbE LAN, 8 USB, 2 PCI Express Mini Card Slots
eBOX670-891-FL
The eBOX670-891-FL supports the 7th/6th generation Intel® Core™ i7/i5/i3 and Celeron® processors with flexible I/O configurations. This outstanding embedded box PC is equipped with dual DDR4-2133 SO-DIMM slots with system memory up to 32 GB. The eBOX670-891-FL provides high flexibility with reserved I/O module space on the rear side. The embedded system integrator can expand the system quickly and easily by installing suitable I/O modules. The fanless embedded box computer features wireless comm...show more -
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Fanless Edge System With NVIDIA® JETSON™ TX2, 1 HDMI 2.0,2 GbE LANs And 1 USB 2.0
eBOX560-900-FL
The eBOX560-900-FL employs a NVIDIA Jetson™ TX2 module which has a powerful 64-bit ARM A57 processor; a 256 CUDA cores with NVIDIA® Pascal™ GPU Architecture; 8GB of LPDDR4 memory; and 802.11ac Wi-Fi with Bluetooth. It also supports NVIDIA JetPack 3.2 SDK including TensorRT, cuDNN, CUDA Toolkit, VisionWorks, GStreamer, and OpenCV, all built on top of L4T with LTS Linux kernel. The extremely compact system is your superb choices for AI, deep learning, and edge computing. Its tough construction is IP40-rated, and it has an extended operating temperature range of -30°C to +60°C (-22°F to +140°F) and up to 3G vibration endurance.
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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IPX5 IPX6 Water Spray Test Device
CX-IPX56B
Shenzhen Chuangxin Instruments Co., Ltd.
Drop rain rain chamber Uses: This equipment is main to test the physical and other related properties of the products in the environment of simulated rain, such as electronic and electrical products, lamps, electrical cabinets, electrical components, automobiles, motorcycles and their parts and components. After the test, through the test result to determine
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Vibration Test Rigs
If you are looking for a complete vibration test rig from one source, m+p international is the place to come. We also provide custom-made vibration test rigs which are built in close co-operation with our customers in accordance with their requirements and specifications.
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Test Adapter
PMC-UNIV-TEST
PCI adapter for PMC with options for PCI and PMC Stack Pass through connections
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Electromagnetic (EM) Speed Log System
AGILOG 2
Aeronautical & General Instruments Ltd.
AGILOG 2 is based on the well-established electromagnetic principle that a voltage is induced in a conductor by a moving magnetic field. By using the sea water as a conductor, an output is generated as the vessel progresses. Electromagnetic speed measurement is passive in operation and therefore particularly suitable for use in submarines and warships. The EM technology provides reliable and robust speed availability when compared to some alternative technologies.
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Internally Ruggedized Phase Stable Test & Measurement Test Lead Assemblies
Storm-Test®
- Engineered to provide precise measurements with stable electrical performance- Excellent loss, VSWR, & phase/amplitude stability with flexure. - Internally ruggedized cable construction delivers longer life, repetitive mating and prevents crushing, bending & twisting- Accurate & repeatable measurements - Performance tested prior to shipment
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Test & Calibration
Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0). In addition to assurance of measurement accuracy, accreditation ensures traceability to known standards, provides international acceptance of measured values, and is important for compliance purposes for your own ISO/IEC certifications. Our state-of-the-art, ISO 17025 accredited calibration laboratories in San Diego, California offer a range of test and calibration services including:
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MIL-STD-1553 A / B Test And Simulation USB Module
USB-1553
*Dual redundant*1 or 2 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*More programmable triggers and acquisition*10 programmable I / O*Onboard IRIG-B timecode encoder / decoder*Supports stand-alone operation via USB connection, without external power supply*On-board battery for runtime without power supply
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Transportation Embedded System
Certified by the strict railway/vehicle/marine safety and EMC criteria, the transportation embedded systems (tBOX) are designed for transportation industry applications. The tBOX embedded systems feature wide operating temperature ranges, powerful computing performance, and high vibration resistance. The tBOX box PCs can work in various applications including fleet management, passenger infotainment systems, onboard and wayside surveillance systems, onboard device controls, gateway and dispatching systems, and more.
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Temperature Control Battery Short Circuit Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL'S Temperature control battery short circuit test chamber is designed to comply with standard. According to the short-circuit test requirement, the short-circuit must be less than 5 mΩ to achieve maximum curren.
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Wire Systems Analyzer
Console Test Systems (CTS)
Wire Systems Analyzer Commercial Roll around detects and locates faults and detects degradation in electrical interconnect systems ranging from simple to complex. Used to verify the operation of relays, circuit breakers, indicators, switches, diodes, transformers, 1553 couplers, etc.
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High Accuracy Fibre Optic Inertial Navigation System
SATURN INS
SATURN INS, from Teledyne TSS, is a world leading surface navigation system which offers enhanced unparalleled INS performance which builds on the TSS fibre optic gyro system by adding inertial navigation (INS) capability.As with SATURN, it is available in three standard heading accuracy variants; 0.1° sec lat (SATURN10INS), 0.3° sec lat (SATURN30INS) and 0.5° sec lat (SATURN50INS).
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High Voltage Switching System
964i
The manual method is extremely problematic. Slow, error prone, labor intensive, operator hazardous – don’t even think about recording the test results. The 964i on the other hand, is purpose built to fully automate all of you HV switching needs. You chose the 964i, partnered it with a Vitrek 95X Series Industrial Strength Hipot Tester and QuickTest Pro test automation software. The company wins the Malcolm Baldridge National Quality Award, you get a promotion and that corner office you’ve always wanted. Choose carefully.
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Desktop Meter Test Station
2990
The 2990 revolutionizes meter testing by providing full series parallel meter testing in a small, budget-friendly desktop package.
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Time Sensitive Test Tools
We have developed a series of custom testing tools as part of our dedication to performing the most comprehensive testing in the industry. These tools allow for testing at lower layers than most commercially available tools and are available for use in your own testing labs. In addition, we have an extensive amount of T&M partner test tools which members of our testing services also have access to.
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Equipment Front End Module (EFEM) Class 1 Minienvironment System
MiniMax™
Genmark’s MiniMax™ Equipment Front End Module (EFEM) is a class 1 minienvironment system designed to maximize productivity of semiconductor processing equipment tools that require the highest level of automation.The MiniMax™ can be customized to meet the automation requirements of any semiconductor manufacturing tool application and specified with one of the Genmark’s sophisticated and precise wafer and reticle handling robots, including the full line of patented GPR single or dual arm robots, GREX robot series, single and dual wafer aligners, FOUP/FOSB openers, reticle libraries, as well as any other customer specified equipment.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Data Acquisition System
DAQ973A
Get the next-generation data acquisition (DAQ) system with a three-slot mainframe and your choice of nine plug-in modules. Interface with the DAQ using Keysight BenchVue DAQ software or use the intuitive graphical front panel with task-oriented, self-guiding menus.
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Automated Meter Test Set
Model 2130
The TransData Model 2130 is a fully automated, computer controlled electricity meter test set designed for on-site accuracy testing and revenue certification of high-accuracy, multi-function energy meters to meet rigorous PUC, Sarbanes Oxley and ISO testing requirements.
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Slip Line Detection System
YIS 200
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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Life-time Measurement System For Silicon Bulks/ingots By JIS Method
HF-100DCA
*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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Integrated Test Environment
ITE
The Integrated Test Environment (ITE) is our solution to handle complex hardware or software test projects.ITE provides features to define and manage requirements and test cases in different documents, link them with each other as well as plan tests and test campaigns. Moreover the tests can be developed, executed and evaluated by considering the linked requirements. Test results can additionally be recorded and finally reported in different, adaptable and configurable reports.
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3U VPX Systems
Curtiss-Wright Defense Solutions
Our SWaP-optimized 3U VPX rugged mission computer systems are pre-integrated and pre-validated to reduce your cost, risk, and time to market. These systems are based on open standards to meet Modular Open Systems Approach (MOSA) requirements and qualified for temperature extremes, high altitudes, voltage spikes, shock, vibration, and more.
