System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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SWB-2814, 8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-14
8x9, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2814 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Systems Certification
Project integration offering a complete turnkey solution including design, engineering, FAA and international regulatory certification services and testing, and installation kit manufacturing.
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Instruments
Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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TO-CAN Package Inspection System
7925
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Smart Aircraft System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insight you need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Powered VME64x Crates
9U VME64x 6023
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for VME/VME64 bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Test Charts
iQ charts
Image Engineering GmbH & Co. KG
The basis of our test chart portfolio are the ESSER TEST CHARTS owned by Image Engineering and known worldwide for their high quality which we continually improve. Included in the extensive program are HDTV charts for broadcast, multipurpose charts as well as the UTT chart (Universal Test Target), the leading system for the standardized digitalization of archives, which is already being used by the Metropolitan Museum in New York.
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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Test Chambers
The focus of the Feutron climate simulation overall concept is on the simplest operation of the overall functions of the test systems and the highest reliability with maximum efficiency. This is why our systems are supplied as plug-in compact devices.
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Basic Electronics Trainer
Basic Electronics Trainer System to understand Characteristics of Variuos Type of Electronic Components.Functional block diagrams are provided on-board for Teaching/Training. These Trainer provides with various Test Points to Measure the Parameters on Multimeter.
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Universal Function Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Integrated Hardness Tester With Impact Device G
TIME®5106
Beijing TIME High Technology Ltd.
TIME5106 dynamic type hardness tester is integrated with impact device G for testing solid components like heavy castings and forgings. It can perform hardness test in individual mode or in system mode.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Mezzanine System
5362
ECM P/N 5362 provides eight channels of LVDS I/O with fixed 100 ohm termination. Speeds are up to 200M bits per second. All channels power up as inputs. Software can then enable outputs on a channel by channel basis.
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ATE Development
Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Single Sensor Enhanced Vision Systems
Rely on the industry leading Max-Viz enhanced vision systems (EVS) from Astronics to enhance your safety and situational awareness while flying.
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Digital Interconnect Test System, Reference Solution
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Inertial Navigation Systems (INS and IMU)
Inertial Navigation Systems (INS and IMU)High accuracy 100Hz GPS and GNSS receivers and Inertial Navigation Systems (IMU - inertial measurement units) with Real-time Kinematics (RTK) correction for the most precise position-based test and measurement applications.
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PXI 16x4 Signal Insertion and Monitor Matrix
40-525A-002
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also available in a 34x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system.
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Test Solution Requirements Gathering
When we first talk to our customers about their test requirements, they generally know what they want to achieve but often do not have the detailed requirement specifications to enable us to design and build a suitable test system for them. The process of generating a detailed design specification is both time consuming and stressful, so we understand the challenges this causes.
