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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 1801 - 1815 of 4410 items found.

  • Vacuum Probing Systems

    SemiProbe

    Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the  Vacuum Probing System. All key modules are interchangeable and upgradeable.

  • Burn-In System

    TRIO-TECH International

    The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.

  • PD Measurement Devices

    Power Diagnostix Systems GmbH

    This group of instruments offer partial discharge measurement functions of different performance level. Devices for test and research laboratories as well as systems for on-site PD analysis are available. Stand alone units, computer controlled systems or wireless operating acquisition sets are shown in this area.

  • RSE Wireless EMC Spurious Emission

    TS8996 - Rohde & Schwarz GmbH & Co. KG

    The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.

  • New Battery Analyzer

    Hangzhou Xun Anda Electrical Co., Ltd.

    1. Test application: 12V/6V batteries test and 12V Starting /Charging system test.2. Test battery type: regular liquid, AGM battery, GEL battery,VRLA battery3. CCA test range: 40~2000CCA (SAE).4. Voltage test range: 1.5-15V.5. Display SOH (state of health), SOC(state of charge).6. Test for multiple battery standards: SAE, DIN, EN, IEC, CA.7. Graphic LCD display with back light, LCD brightness adjustable.8. Multigle language operation: English, Chinese, Germany, French, Spanish. 9.internal resistance

  • Boundary-Scan DIMM Socket Tester

    ScanDIMM - Corelis, Inc.

    Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.

  • MIPI Receiver Test Solution

    M8085A - Keysight Technologies

    The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.

  • Intermediate Test Cells

    Atec, Inc.

    Atec’s modular intermediate test cells are the most versatile on the market today. Over the last 40 years the A/M37T-20 jet engine test system developed by Atec and Celtech has become the leading test bed solution for over 15 engines and their variants, including:F100, F101, F110, F119, F124, F125, F404, F414, J85, TF33, TF34, TFE731

  • Cable-End Test Fixtures

    Test Head Engineering, LLC

    Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.

  • 2-Axis Rate and Position Tables

    ACUTRONIC Switzerland Ltd

    When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.

  • End-Of-The-Line Tester

    Certifier 1200 - LITE-CHECK LLC.

    Presenting a vehicle test station for electrical, brake, and ABS End-Of-The-Line testing from LITE-CHECK, the leader in economical, technician-friendly test equipment. With state of the art software and hardware automatic operations are recorded for a complete printed report of the vehicles electrical and air system. Heavy-duty test station for complete electrical, air brake, ABS, and 121 brake timing & end-of-line testing.

  • MULTI-FUNCTION AVIONICS TEST SET

    TR-220 - Tel-Instrument Electronics Corp.

    The TR-220 provides test capability for Traffic and Collision Avoidance Systems (TCAS), Distance Measuring Equipment (DME) and Transponders (Modes A, C, and S). The TR-220 features state-of-the art design technology. Microprocessor control results in easy-to-use operation that requires minimum amounts of training. Setup menu allows storage of various test parameters to facilitate quick recall of test conditions.

  • SD-SDI Test Signal Generator

    7750TG - Evertz Microsystems Ltd.

    The 7750TG Test Signal Generator provides a cost effective method of generating SDTV 270Mb/s test signals. The 7750TG is ideal for checking signal path integrity, monitor alignment or to determine system performance over varying cable lengths. The 7750TG generates test signals in 525 line and 625 line SMPTE 259M-C video formats and offers four 270Mb/s outputs.

  • Material Handlind Equipment

    Magnetic Analysis Corp

    Accurate handling, conveying and positioning of material, before, during and after the test is a critical part of any NDT  system. MAC’s mechanical handling products, the result of many years of experience with actual NDT installations, help to ensure accuracy and successful test results. Standard and custom-designed options are available, plus “V” Roll and Constant Center Triple Guide Roll Test Benches.

  • Hall Effect Measurement system

    HMS-3000 - ECOPIA

    Hall Effect Measurement System is very useful for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Therefore, it is essentially required system to understand the electrical characteristics of semiconductor device.Ecopia’s HMS series consist of constant current source , terminal conversion system by Van der Pauw technique, low temperature(77K) test system and magnetic flux density input system. So, it is well-established system that has all the things needed to Hall Effect Measurement System.

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