Showing results: 1666 - 1680 of 4410 items found.
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Summit Z58 -
Teledyne LeCroy
The Summit Z58 Exerciser/Analyzer is Teledyne LeCroy's latest generation PCI Express (PCIe) protocol exerciser, leveraging years of experience in providing advanced protocol test tools to the PCI Express community. Supporting traffic generation at data rates to 32 GT/s with link widths up to 8 lanes, the system is designed for developers who need a protocol test system supporting the PCI Express 5.0 specification.
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Z416 -
Teledyne LeCroy
The Summit Z416 exerciser is Teledyne LeCroy's fifth generation PCI Express (PCIe) protocol exerciser, leveraging years of experience in providing advanced protocol test tools to the PCI Express community. Supporting traffic generation at data rates to 16 GT/s with link widths up to 16 lanes, the system is designed for developers who need a protocol test system supporting the PCI Express 4.0 specification.
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Captronic Systems Pvt Ltd
The aerospace & defence scientists and engineers working on the design, development and validation of avionics systems or sub systems (Line Replaceable Unit – LRUs) face a challenge of testing them as all physical components may not be available for testing purpose. Also, such testing is costly and time consuming. Avionics Test Suite is a platform empowering them to perform the tests in simulated environment, testing various commonly used Avionics bus interfaces.
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2706 IM -
Standard Electric Works Co., Ltd
● True measurement of speaker systems actual impedance at 1kHz.● Three test ranges (20Ω / 200Ω / 2000Ω) allow testing of home theater and commercial sound systems.● Measures transformer impedances.● Battery operated.● Low battery indication.● Data hold function.● Timer function for continuous hands free operation.● The timer can last about 3-5 minutes when users press.● TEST ON/OFF button.
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of Bench-top Xenon Lamp Test Chamber, Bench-top Xenon lamp aging test chamber, Bench-top xenon lamp weathering test chamber ,Xenon Lamp Test Chamber, Xenon Test Chamber manufacturers Small, simple and economic xenon test chamber. It uses a low power air-cooling xenon lamp to produce enough big irradiance energy in a small space. Moreover, through a special catoptrical system to ensure every exposure sample get the homogeneous irradiance distribution.
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PITC -
Bemco Inc.
The PITC, with a temperature range of -70 C to +177 C, was first introduced in the late 1950s by Bemcos Conrad/Missimer Division. Today, the modernized version of this system is the ideal solution where short run or infrequent tests are required, test specimens are unusual in size or shape, initial capital costs must be held low, or test needs are frequently changed.
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40-682A-002 -
Pickering Interfaces Ltd.
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-681A-001 -
Pickering Interfaces Ltd.
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-683A-001 -
Pickering Interfaces Ltd.
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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7751TG2-HD -
Evertz Microsystems Ltd.
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
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Polaris Networks
The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Flynn Systems Corp.
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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GPIB -
Test Electronics
Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.
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NX Solo -
Dynalab Test Systems, Inc.
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
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Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).