Spring Probes
Spring loaded electrical conductor contacting elements. AKA: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
- Pickering Interfaces Inc.
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Cable Assembly 68-Pin Micro-D Male to Unterminated, Tinned Ends, 0.5m, Spring Latch
A068SMR-T-5B050
The 68-Pin Connector to Unterminated Cable Assy is constructed from 7/36 (28AWG) twisted pair wires with polypropylene insulation. The wires are colour coded to match the connector pin designation. The connector can be secured to the product by a Metal Spring Latch.
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Circuit Tester "Light and Sound" Hook Probe
TE6-0708C
Hangzhou Tonny Electric & Tools Co., Ltd.
*Tests 6/12 volt circuits with POWER ON.*Interchangeable tips allow tool to be used as a probe- or pierce-type tester.*Retains wire for perfect pierce with one hand.*Hook grabs hard-to-reach wires.*Durable insulated clip and heavy-duty cord for professional use.*Spring loaded strain relief prevents cord pull out and damage.*High intensity glow for under hood and under dash visibility.*Easy-to-hear buzzer provides quick circuit test confirmation.
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1C-9.6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Electrical Tester Grid Field
TCI can furnish grid spring probes for most Bare Board Electrical Testers in production at most Printed Circuit Board Manufactures. Look for your model of Bare Board Tester in the following list and call TCI for current price quotation.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-05
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Pogo Pin
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
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24V Heavy Duty Circuit Tester
27430
Heavy duty probe, cord and clamp. The probe is insulated with high-visibility shrink tubing to prevent the possibility of shorting the side of the probe to other components. Comes with a strain relief spring on the cord.
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Manual Fixture Kit
230372 – CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Standard Pitch Spring Probes
Other than spring probes with gold plating, we have spring probe with anti-solder migration coating and plating that were developed by KITA. We also have anti-solder migration material for plunger tip. These are all included in “MARATHON” series. They have wide range of tip type for various use for every popular total length.
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Mems-Based Probe Cards
MEMSFlex
Nidec SV Probe proprietary MEMSFlex™ Probes are a perfect complement to our probe card technologies, ideal for many advanced testing applications including Flip Chip, WLCSP, Solder Bump, CuPillar and Pad. Featuring a fine 3D MEMS coil spring and electro-formed Ni-pipe, these probes are manufactured using a continuous, automated, manufacturing process, we can support a wide array of custom pin pitches within a short cycle. Other features include:
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 1000 Units, Max UUT 450x330MM (wxd)
CMK-07
Linear click system with ball bearings, using gas springs. 10 mm ESD-proof top cover with aluminum reinforcement bars. Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Fingernail Test Probe
CX-Z11
Shenzhen Chuangxin Instruments Co., Ltd.
The Fingernail Test Probe is used to test to IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and a Delrin?handle. Handle has a threaded hole for use with force gauges.
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Test Finger Nail Probe
CX-75
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated test IEC60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the neccessary force for using the instrument. This probe is make of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 230 x 175 mm (wxd)
CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Data Communications And Semiconductor Device Related Products
Using our original micro springs and MC probes, these are highly durable products that are also lead-free. It is used for inspection of finished semiconductor products.
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Micro Pogo Pin Tips for ZD Differential Probe Qty 6
PACC-ZD009
Micro pogo pin tips for ZD differential probeQty 6
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÷10 HiZ 500 MHz Passive Probe for WaveSufer 400 Series Oscilloscopes.
PP007-WS-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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Passive Probe
ENVI
PMK Mess- und Kommunikationstechnik GmbH
The world's first modern probe for this high temperature range is suitable for a variety of applications with an input voltage range of 400V / 1250V peak, 10:1 divider and 350MHz bandwidth.The individual and signal-true contacting for different applications is guaranteed by the exchangeable spring tip and a variety of contacting accessories.
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Changeable Cassette
230372/1 – CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Hybrid Socket
CSP/Ballnest
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Linear Testfixture for VPC iCon i1 Mass Interconnected Cassette Interface (Cassette Not Included) 4 or 10 Positions Blocks, UTT 306 x 248 mm
MG-02-01
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 4 interface blocks of 160 signals• All interface blocks can be customized
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Manual Fixture Kit
230371 – CMCSK-02-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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BPLT-1 Long Travel Bead Probes
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Microcontactor
Microcontactor is the products using a new structure precision probe developed by NHK Spring. They are used to test the electrical characteristics of semiconductor wafers and packages. Products are manufactured in our own factory and can be custom-designed to meet our customer needs.
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High-Current Leaf Spring Probes
Made for flat contacts - fully customizable - great contacting.
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Circuit Tester With Buzzer
28620
Tests low voltage up to 28 volts. Spring loaded hook can be removed to use the probe tip only. Can also be used to check polarity and battery drain.
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BGA Sockets
Our BGA socket platform takes advantage of the H-Pin®, a high-performance stamped spring probe pin, to provide a pure vertical contact system that meets all BGA design challenges at an enabling cost.
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CMK Mechanical Kits
Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
