Spring Probes
Spring loaded electrical conductor contacting elements. Also known as: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
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Kelvin Contact Spring Probes
We have spring probes for Kelvin contact, which best suits to use for sensitive and extremely precise test. It is used by contacting to one terminal of semiconductor by two probes. We have 0.3, 0.4 and 0.5mm pitch probe for Kelvin contact.
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Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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High Current / High Temperature Spring Probes
We have spring probes, which can be used for high temperature and high current test under 200 degree and shows high performance in them.
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Ingun Spring Probes
MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Standard Pitch Spring Probes
Other than spring probes with gold plating, we have spring probe with anti-solder migration coating and plating that were developed by KITA. We also have anti-solder migration material for plunger tip. These are all included in “MARATHON” series. They have wide range of tip type for various use for every popular total length.
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PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Fine Pitch Spring Probes
For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Spring Contact Probes
Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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K100 Series For 2.54mm [100mil] Pitch
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Package Probe
Test Socket
Jigs for testing the electrical characteristics of devices in the final testing stage after LSI package assembly.To match the increasingly high functionality of LSIs for communications and networks, such as mobile phones and mobile devices, we provide two types of test sockets: The "J-Contacts" series suited for high-frequency, high-performance devices, and the "BeeContacts" series, spring probes with a unique structure that delivers excellent contact stability.
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Linear Testfixture for VPC iCon i1 Mass Interconnected Cassette Interface (Cassette Not Included) 4 or 10 Positions Blocks, UTT 306 x 248 mm
MG-02-01
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 4 interface blocks of 160 signals• All interface blocks can be customized
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High Speed Contacts
Our quadrax, twinax, spring probe, coax, triax and fiber optic contacts can be sold seperately or configured into any of our standard connector shells sizes as well as cable assemblies and harnesses.
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Linear Testfixture (Cassette Not Included), UTT 194 x 170 mm
MG-06
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 194 x 170 mm (wxd)• Outer dimensions: 400 x 354 x 70 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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Linear Testfixture for VPC iCon i1 Mass Interconnected Cassette Interface (Cassette Not Included) 6 or 10 Positions Blocks, UUT 456 x 320 mm
MG-07-01
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 589 x 100 x 184 mm (wxdxh1xh2)• Equipped with dedicated cassette• Up to a maximum of 8 interface blocks of 160 or 170 signals• All interface blocks can be customized
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Standard Type Spring Probes
From for bare board to for ICT, we have variety of spring probes for PCB. In addition to variety of tip type and total length, we also have receptacles that match the best to spring probes. We can also attach lead wire to the receptacles.
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Custom Pogo Pin Rings & Blocks
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
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High Frequency Spring Probes
We have spring probes for high frequency for 0.5 and 0.8mm pitch. We provide spring probe with low insertion loss by shorten the total length to 1.5mm (use length 1.1mm).
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Linear Testfixture Cassette and VPD ITA Frame Not Included, UUT 306 x 248 mm
MG-02 VPC G12
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable CEM Backpanel for VPC G12(x) ITA frame mount• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Pylon ITA Mount Linear Testfixture Cassette and ITA Frame Not Included, UUT 306 x 248 mm
MG-02 VGR12
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with aluminum backpanel for a Genrad VGR12 Pylon frame• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Manual Test Adapter With Rigid Needles
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.
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EPA General Purpose Probes
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Nanotek Brush
Nanotek Series
Nanotek Brush is fine stainless wire brush for removing solders or dirt stuck on the tip of spring probe. It has its range of wire diameter from 30µ to 50µ and its fine wire is effective for removing solder or dirt on complicated tip type. We also have Nanotek vacuum, which is nanotech brush combined with vacuum cleaner powered by your compressor or vacuum pump.
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Non-Magnetic Spring Probes
We have spring probes, which are composed of nonmagnetic material to use for test environment that requires to remove the effect of magnetism.
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Switch Probes
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
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High Current Probes
The maximum continuous current rating of a spring probe is determined by its design, size, and construction. Typical probes are rated from 2 to 8 amps maximum continuously current at working travel. While this is sufficient for most board test applications, higher current applications will require a much more solid and rugged probe to withstand current capabilities of 10 to 150 amps and beyond.Another high current solution is our feed-through plunger probe line. As the name already describes, the plunger moves right through the probe and is made from a single piece, reducing the internal resistance of the probe to a minimum.
