Spring Probes
Spring loaded electrical conductor contacting elements. Also known as: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
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Product
Spring Loaded Contacts
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ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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Product
Hybrid Socket
CSP/Ballnest
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Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Product
Custom Probe
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When your application demands a unique set of physical attributes, Everett Charles Technologies’ team is ready to provide a custom solution. ECT has been providing custom spring probes for over 50 years. By leveraging this vast experience ECT can effectively work with you to understand your requirements and translate them into a targeted solution.
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Product
Expanding In-Circuit Capabilities
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Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
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Product
Socket Phone
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Design for phone device test and system verify.Phone device: CPU,flash,baseband,LPDDR,power IC.etcPitch range from 0.30 to 1.27mmKey material: PEI,Peek,Torlon,PPS.etcContact with top pogo pin
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Product
BGA Sockets
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Our BGA socket platform takes advantage of the H-Pin®, a high-performance stamped spring probe pin, to provide a pure vertical contact system that meets all BGA design challenges at an enabling cost.
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Product
Nanotek Brush
Nanotek Series
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Nanotek Brush is fine stainless wire brush for removing solders or dirt stuck on the tip of spring probe. It has its range of wire diameter from 30µ to 50µ and its fine wire is effective for removing solder or dirt on complicated tip type. We also have Nanotek vacuum, which is nanotech brush combined with vacuum cleaner powered by your compressor or vacuum pump.
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Product
High Current / High Temperature Spring Probes
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We have spring probes, which can be used for high temperature and high current test under 200 degree and shows high performance in them.
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Product
Kelvin Test Contactor/Probe Head
Gemini
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At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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Product
Micro Pogo Pin Tips for ZD Differential Probe Qty 6
PACC-ZD009
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Micro pogo pin tips for ZD differential probeQty 6
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Product
Linear Testfixture for Pylon Mass Interconnected Cassette interface (Cassette Not Included) 6 Positions Blocks, UUT 306 x 248 mm
MG-02-01 Pylon Genrad VG series
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for Mass interconnect changeable cassette• Up to a maximum of 6 interface blocks of 170 signals• All interface blocks can be customized
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Product
HPA General Purpose Probes
General Purpose Probe
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Product
Standard Pitch Spring Probes
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Other than spring probes with gold plating, we have spring probe with anti-solder migration coating and plating that were developed by KITA. We also have anti-solder migration material for plunger tip. These are all included in “MARATHON” series. They have wide range of tip type for various use for every popular total length.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 305gf
K100-H080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 155gf
K100-I126155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 155gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 230gf
K100-A080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 305gf
K100-I126305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 305gf
K100-E150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 230gf
K100-Q080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 155gf
K100-A080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle
KR100
Spring Probe
K100 Series, Pitch 100mil, Receptacle, no wire wrap pin. Brass with gold finish.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 305gf
K100-K150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 230gf
K100-L150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 155gf
K100-K150155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 155gf
K100-H080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 305gf
K100-D080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 230gf
K100-H080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 305gf
K100-L150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 305gf
K100-A080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.





























