Spring Probes
Spring loaded electrical conductor contacting elements. Also known as: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
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Hybrid Socket
CSP/Ballnest
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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HPA General Purpose Probes
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Spring Probe For Testing Bare Board And/or PCB
You can see Spring Probe for testing bare board and PCB here. Standard pitch is from 0.5mm to 3.0mm.
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Package Probe
Test Socket
Jigs for testing the electrical characteristics of devices in the final testing stage after LSI package assembly.To match the increasingly high functionality of LSIs for communications and networks, such as mobile phones and mobile devices, we provide two types of test sockets: The "J-Contacts" series suited for high-frequency, high-performance devices, and the "BeeContacts" series, spring probes with a unique structure that delivers excellent contact stability.
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ATE Socket
Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin
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Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Diagnostic Cores
VersaCore™
The diagnostic cores are uniquely designed in the VC20 format. Using the customizable PCB, components can be added to create a "golden core" to quickly troubleshoot your system Test SMUs, Test Motherboard, Test Pogo pins, Test Relay matrix.
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Electrical Tester Grid Field
TCI can furnish grid spring probes for most Bare Board Electrical Testers in production at most Printed Circuit Board Manufactures. Look for your model of Bare Board Tester in the following list and call TCI for current price quotation.
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Linear Testfixture (Cassette Not Included), UTT 586 x 248 mm
MG-03
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 586 x 248 mm (wxd• Outer dimensions: 750 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Board Test Fixture Probes
Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Screw Pins
C.C.P. Contact Probes Co., LTD.
CCP's Screw Pin is an extremely smart way to utilize a pogo pin as a connector as well as a mounting part.
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Linear Testfixture (Cassette Not Included), UTT 194 x 170 mm
MG-06
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 194 x 170 mm (wxd)• Outer dimensions: 400 x 354 x 70 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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Linear Testfixture (Cassette Not Included), UTT 456 x 320 mm
MG-07
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 456 x 320 mm (wxd)• Outer dimensions: 620 x 590 x 100 x 184 mm (wxdxh1xh2)• Designed for changeable cassette
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K100 Series For 2.54mm [100mil] Pitch
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Linear Testfixture (Cassette Not Included), UTT 105 x 170 mm
MG-01
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd)• Outer dimensions: 254 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Nanotek Brush
Nanotek Series
Nanotek Brush is fine stainless wire brush for removing solders or dirt stuck on the tip of spring probe. It has its range of wire diameter from 30µ to 50µ and its fine wire is effective for removing solder or dirt on complicated tip type. We also have Nanotek vacuum, which is nanotech brush combined with vacuum cleaner powered by your compressor or vacuum pump.
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Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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BGA Sockets
Our BGA socket platform takes advantage of the H-Pin®, a high-performance stamped spring probe pin, to provide a pure vertical contact system that meets all BGA design challenges at an enabling cost.
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Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Socket Phone
Design for phone device test and system verify.Phone device: CPU,flash,baseband,LPDDR,power IC.etcPitch range from 0.30 to 1.27mmKey material: PEI,Peek,Torlon,PPS.etcContact with top pogo pin
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Spring Contact Probes
We differentiated the spring contact probes by center and application, for the purpose of clarity. Please choose in the left navigation bar!
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Pylon ITA Mount Linear Testfixture Cassette and ITA Frame Not Included, UUT 306 x 248 mm
MG-02 VGR12
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with aluminum backpanel for a Genrad VGR12 Pylon frame• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
