Semiconductor Test
prevails upon the DUT to demonstrate It's fulfillment of test requirements.
See Also: ATE
- CAMI Research Inc.
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large libr...show more -
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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Hand Socket Lid
Hand socket lid is normally used to run evaluation tests on semiconductor devices prior to High Volume Manufacturing mode. It can also be used as a trouble shooting tool at bench test.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Interface Solutions
Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.
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Function/Arbitrary Waveform Generators
Scientech Technologies Pvt. Ltd.
An Arbitrary Function Generator or an Arbitrary Waveform Generator has many applications like Embedded and Semiconductor Test Applications, RF Related Applications, Automotive Applications, Education-Related Applications, Medical Applications, Industrial Applications and Research Applications. Thus, Scientech Technologies has its customers from all disciplines and areas and thus it makes Scientech one of the biggest arbitrary function generator supplier.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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Semiconductor Testers
Cohu has 40+ years of expertise with semiconductor testers, designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices. Our portfolio of instrumentation and our universal Automatic Test Equipment platform offers best-in-class solutions and enables faster time to yield.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltag...show more -
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Probe Card Test & Analysis
Automated probe card test and repair is used to monitor probe card health to ensure cards are ready and capable of testing semiconductor devices. In cases where the card is not meeting performance specification, repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.
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Semiconductor Testing
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Burn-In Boards
Manufacture of burn-in boards since 1976. Established for more than 40 years in the market, Trio-Tech is recognized and is an approved global supplier to all major semiconductor companies. Trio-Tech has the capability to design and manufacture boards for all system types, with solutions available for many test conditions, Including HTOL, PTC, HAST and 85/85.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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Semiconductor
The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
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Signal Generators
2, 4 and 8 Channel Arbitrary Waveform Generator and Pulse Pattern Generator solutions are ideal choice in automated test benches, for physics experiments, semiconductor tests, analog and digital debugging.
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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High Current SMU 1600 A
AXC7585
Generate extremely short, fully regulated current pulses from 300 µs up to 1600 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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PXIe-5672, 2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator
779900-01
2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator —The PXIe‑5672 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5672 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/def...show more
