Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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SC-1 Monitor
CS-131
The CS-131 is a high-precision chemical concentration monitor designed for use with SC-1 solutions used in cleaning processes during semiconductor manufacturing. It offers a faster response speed in a more compact size than anything available to date. The CS-131 monitors the concentrations of the individual components of the SC-1 solutions (NH3/H2O2/H2O) which is widely used to remove particles and organic substances. The monitor has a number of outputs which can be utilized to keep the concentr...show more -
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, us...show more -
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Laser Head
5517C
The Keysight 5517C is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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High Precision, High Stability Chemical Concentration Monitor
CS-700
The HORIBA CS-700 chemical concentration monitor enables high performance measurement of the individual chemical constituents of complex chemistries used in the leading edge Semiconductor Manufacturing Processes.By improving HORIBA's renowned spectroscopic measurement technology, the CS-700 realizes up to 5X improvement in measurement performance.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Semiconductor Test
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Epi Thickness & Composition
FTIR (Fourier Transform Infrared) is the most important technology for measuring epitaxial film (Epi) thickness, measuring impurities in Silicon and monitoring dielectrcis, like Borophosphosilicate glass (BPSG), FSG, PSG, etc in semiconductor industry. FTIR is evolving from a primarily quality control (wafer supply chain) technology to a tool/process/chamber (test wafers) monitoring technology and more importantly, a device (product wafers) monitoring tool.
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Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 200 MS/s Up To 8 GS Memory
Razor-X
The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Laser Systems
We offer a full line of complete laser micro-machining heads for semiconductor applications. These systems feature an integrated DPSS Jewel ND:Yag laser incorporated into a uni-body all-in-one form factor. They also have a robust mechanical and optical design for manufacturing and repair applications. Our three models of micromachining heads are diverse enough to adjust to a variety of applications including: ablation, semiconductor FA, TFT/LCD, CF and cell LCM, and OLED repair.
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OEM DC Power System For Semiconductor
AMETEK Programmable Power, Inc.
*Single Package 6-Pack of 600W power supplies*Complete self-contained controller operates independently once pre-set*Capable of ramps and sequences*Capable of inter-channel dependent operation*DeviceNet Interface*Solid State polarity switching
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DSP-Based 4/8-Axis Advanced Pulse-Train Motion Controllers
AMP-204C/AMP-208C
ADLINK"s new AMP-204C/AMP-208C DSP-based 4/8-axis advanced pulse-train motion controllers incorporate up-to-date floating-point DSP and FPGA technology, enabling high pulse output and encoder input frequency up to 6.5 MHz and 20 MHz respectively. Leveraging ADLINK" s Softmotion technology, the AMP-204C/AMP-208C offer impressive comprehensive and application-oriented motion functionality to reduce development time while maintaining superior throughput and accuracy. Superior synchronous motion con...show more -
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Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 100 MS/s Up To 8 GS Memory
The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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Systems Integration
Libra delivers customized manufacturing solutions for high complexity system integration requirements. No matter the industry, we most likely have experience in it across our 85 years of delivering solutions. We have expertise in large complex electro mechanical assemblies, both at the final product level as well as subassembly levels. From advanced robotics to intricate semiconductor capital equipment requirements, we combine system level capabilities with vertical capabilities and know how, that allows us to understand the technical underpinnings of your product. Our well equipped clean room facility allows us to deliver to the cleanliness standards that your product requires.
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Test Automation
TetraMAX®
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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DC Power Supplies
LPS Series
The LPS series power supplies are designed for various applications in semiconductor equipment along with OEM and industrial applications. Available for use in constant current or constant voltage applications they are available in power levels from 1,000 to 13,500 Watts. Common applications include heater, filament and magnet supplies along with test and burn-in applications. All models can be paralleled for increased power and custom configurations are available.
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3.4 MP Custom Lens Low Light Camera Module
e-CAM30_CUMI0330_MOD
e-CAM30_CUMI0330_MOD is a high performance, small form factor, 3.4 MP pluggable Low Light Camera Module with S-Mount lens holder. It is based on AR0330 - a 3.4MP CMOS Image sensor from ON Semiconductor®. It has a dedicated, high-performance Image Signal Processor chip (ISP) on-board that performs the entire Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images, videos and the optional MJPEG compressions.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Jetting System
IntelliJet®
The IntelliJet® Jetting System with patented ReadiSet® Jet Cartridge delivers cutting-edge reliability and micro dot dispensing for manufacturing advanced semiconductor and mobile electronics packages
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MANIFULATOR
As one of the most important module in Probe_Station, manipulator is an accurate system that probe micro distance() and contact on the electrode of semiconductor wafer, device. ECOPIA's Manipulator is very easy to use and probe arm's elastic plate is good to protect sample's surface, from being damaged by Z direction movement.
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Custom Coatings
MICROMATTER provides custom coating services (single or multi-layer) on customer supplied glass, metal and semiconductor substrates.
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Laser Heads
The laser head is the source of the laser beam used in all laser motion and position measurement systems. The primary difference between laser heads is in the velocity, reference frequency and optical output power. Other considerations are size, heat dissipation, and input power requirements. Which laser you choose depends primarily on the application in which it will be used. For example, semiconductor lithography systems typically have faster moving parts (stages), and therefore need higher velocities than machine tool applications.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Low Light USB Camera Board (Color)
See3CAM_CU30 - 3.4 MP
See3CAM_CU30 is a 3.4 MP UVC-compliant Low Light USB camera board based on AR0330 sensor from ON Semiconductor®. This Low Light Board Camera is backward compatible with USB 2.0 and supports compressed MJPEG formats at frame rates equal to USB 3.0. This sensor enables a superior low light performance. It has a dedicated, high-performance Image Signal Processor chip (ISP) that performs all the Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images, videos and the MJPEG compressions.
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High Volume Semiconductor Substrate Interconnect Tester
GATS-2100
Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors.The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Compound Semiconductor
Scientific Computing International
Semiconductors that are made from two or more elements.
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Edge Grinding Machines
The requirement for the wafer quality is getting higher and the condition of wafer edge is getting more important. The edge grinders “W-GM series” process edge grinding of various kind of materials such as Silicon, sapphire and SiC.As a solution for that, Our W-GM series are highly rated among manufactures of silicon, compound materials and other wafer shaped materials. Wafer edge grinding machine also draws the attention as a solution for the yield loss due to the knife edge of device wafer in...show more -
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Materials Metrology
VeraFlex Family
Nova Measuring Instruments Inc.
World-class XPS and XRF metrology technologies for semiconductor process control.
