Showing recent results 121 - 135 of 331 products found.
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SALD-BC Series - Shimadzu Corp.
Measurement is possible with small amounts of sample. Use of a funnel improves operation ease when pouring samples via the funnel, and the vertical motion of the stirring plate suppresses the adverse affects of sedimentation of particles to ensure accurate measurement. This is ideal for measurement of particles in the sub-micron region or lower. Also, waste solutions can be kept to a minimum when using organic solvents as the dispersion medium.
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AJ-1000 - Rtec Instruments
The state of the art Rtec Air jet erosion tester AJ-5000 allows to test repeated impact erosion test that delivers a stream gas with abrasive particles. The tester comes with close loop temperature control upto 900C. The tester is used to rank erosion of various materials, coatings etc. across a wide range of abrasive particle materials, shape, size at various temperature and impact speed.
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PCE Instruments
A radiation detector is a device for measuring nuclear, electromagnetic or light radiation. A nuclear radiation detector identifies nuclear radiation by measuring the emission of ionizing radiation of alpha particles, beta particles and gamma rays. Also referred to as a geiger counter, a nuclear radiation detector consists of two main elements: the processing electronics and the geiger tube. The geiger tube is filled with low-pressure inert gas like helium, argon or neon. If radioactive radiation occurs, the inert gas is ionized. An anode within the geiger tube registers the quantity of ionized particles numerically correlating with the strength of the radioactive radiation. The radioactivity measurement is then displayed on the LCD screen of the geiger counter or nuclear radiation detector.
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3140 - TSI Inc.
Automated Filter Tester 3140 utilizes the same, proven, oil-aerosol generator technology found in Models 8127 and 8130. It produces oil aerosol without heat, so a variety of oils can be used. Two Condensation Particle Counters (CPCs) simultaneously count upstream and downstream particles. This enables quick, accurate, and repeatable measurements of filters with efficiencies as high as 99.999999% (eight 9’s), or penetrations down to 0.000001%.
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DEM Solutions Ltd.
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
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CF2000 - Postnova Analytics GmbH
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
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Electrogrip Company
Lightweighted and low-expansion chucks with 10nm active-area flatness are required in EUV lithographic tools. These chucks also have low outgassing and low particle generation.
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Brooks Automation, Inc.
Combines best particle and AMC cleaning performance and provides humidity control at the highest throughput. Vacuum decontamination chambers are integrated to the footprint and loaded by the robot.
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DRK8091 - Shandong Drick Instruments Co., Ltd.
Widely used in particle analysis in pharmaceutical, food, cosmetics, food and other industries, the use of advanced integrated circuit control, the operation is extremely simple.
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Bertin Instruments
Coriolis Air samplers are dedicated to the collect of biological particles in the air which bring new perspectives for the control of airborne contamination thanks to its liquid sample.
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Parker Kittiwake - Parker Hannifin Corp
Parker Ferrous Wear Meter (FWM) detects abrasive ware metal iron particles in an oil samples taken from lubricated engine, liner and cylinder machinery.
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Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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SALD-HC Series - Shimadzu Corp.
This system is capable of measuring the particle distribution of high-concentration samples that cannot be measured using previous methods. Measurement is possible with very small amounts of samples without the need for calibration.
