Showing results: 151 - 165 of 277 items found.
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
Connectors form the electronic bridge for active and passive components and devices in a variety of applications. In the laboratory and metrology sector – for example in research and development, testing or quality assurance departments – precision connectors are used due to the detailed requirements for technology and processes.
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JIBE -
Del Mar Photonics, Inc.
A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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Heidenhain Corp.
HEIDENHAIN length gauges deliver high accuracy, even over large measuring ranges. They are commonly used wherever fast, reliable, and accurate measurements are required, such as in production metrology, multi-gauging fixtures, measuring equipment monitoring, and position measurement.
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Huaxin instrument (Beijing) Co., Ltd
Here at Huaxin, as an expert test equipment solution provider, we are proud to offer a selection of pressure calibrators for precise calibration of sphygmomanometer in laboratory and on site. Our sphygmomanometer calibrators find wide applications in metrology bodies, hospitals, university labs, etc.
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UltraSort200 -
HenergySolar
The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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Menlo Systems Gmbh
Carrier envelope phase stabilization (CEP) is an enabling technology for metrology and for the generation of few cycle pulses. As one of the pioneers in the field we have developed products that allow to stabilize the carrier envelope phase of light pulses of few cycle pulse oscillators and amplifiers.
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Ingenieurbüro Mencke & Tegtmeyer Gm
The metrology systems enable the measurement of all DC and AC measurements of PV arrays and inverters as well as all the necessary environmental conditions such as irradiance, module, inverter and ambient temperatures and other meteorological measurements. Similarly, the measurement systems for use can in meteorology stations are used.
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S100|HR -
Apre Instruments
CNC polishing puts new demands on metrology tools. Many of these optics are aspheric with tight tolerances. The new machines can produce almost any surface and require a new level of metrology to provide feedback to the polishing process. This just cannot be done with outdated interferometers designed over 30 years ago. The S100|HR has the performance it takes, without breaking the bank. Measure 10X higher fringe densities to enable final figuring to begin sooner, saving you time and money. Plus measure these high density fringes 5X more accurately to enable large polishing corrections that converge quickly to final figure, including aspheres.
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4D Technology
4D Technology provides cost-effective upgrade kits to refurbish and enhance older temporal phase shifting laser interferometer systems. 4D’s extensive optical metrology experience and hands-on expertise with these systems offers owners an outstanding source of support for extending the life of older systems.
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k-Space Associates, Inc.
The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
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Metrolog -
Metrologic Group S.A.S
Get a real performance accelerator for your 3D measuring devices and more.Not only does Metrolog X4 architecture benefit from current computer and OS technologies significantly increasing the performances and metrology software throughput, but it also simplifies your day-to-day measurement workflow.
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Tencor™ -
KLA-Tencor Corp
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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YIS 200 -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
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FilmTek 2000M -
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.