- TEAM SOLUTIONS, INC.
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Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136B+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Function Modules
NAI offers over 70 smart, field-proven function modules covering a wide variety of I/O, Measurement and Simulation, Communications, Ethernet switch and SBC functions. With Off-the-shelf development and quick integration speed, NAI's function modules provide the ability to reconfigure and respond to changing design specifications reducing NRE charges and offering obsolescence protection all with unmatched flexibility with countless hardware & software combinations. Each smart function module ...show more -
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization pro...show more -
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Memory Test Systems
ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Leeb Hardness Tester
HT6561
Product synopsis1.1 Typical Applications* Die cavity of molds* Inspection of bearing and other mass produced parts on aproduction line* Failure analysis of pressure vessel, steam generator andother equipment* Inspection of installed machinery, permanent parts ofassembled systems and heavy work pieces.* Testing surface of a small hollow space* Material identification in the warehouse of metallic materials* Rapid testing in large range and multi-measuring areas forlarge-scale work piece1.2 Testing...show more -
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Touch Screen Controller
EZT-570i
The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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System Control Modules for 34980A
The 34980A System and Control modules provide additional measurement and control capabilities that are typically used in test applications. Choose from modules that include digital I/O with programmable polarity, D/A converter with onboard memory to create waveforms, and frequency counter/totalizers.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Non-Multiplexed High Speed Transient Function Card
Identified by its ADC per channel and on-board memory, it typically operates at per channel sampling rates which in aggregate would overwhelm any communication system. Data is stored on board during a test and transmitted to a host computer following completion.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditio...show more -
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Evaluation Kit
ROM-3310 Development Kit
*Evaluation kit for ROM-3310*Lower power TI sitara AM3352 1GHz processor*On board DDR3 512MB memory / 4GB Flash*HW WDT for system protection*Supports 1 GbE, 1 USB 2.0, 1 USB 2.0 OTG, 2 CANbus, 10 GPIO, 4 UART,1 I2C, 1 I2S, 1 SPI, 1 SDIO*Cable pack & Panel included*Evaluative image & test utilities built-in
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to ...show more -
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Fully Automatic Colorimeter
DRK103C
Shandong Drick Instruments Co., Ltd.
(1)5 inch TFT color LCD touch screen, the operation is more humanized, new users can be mastered in a short period of time using the method.(2)Simulation of D65 lighting lighting, using CIE1964 complementary color system and CIE1976 (L*a*b*) color space color difference formula.(3)The motherboard brand new design, using the latest technology, CPU uses 32 bits ARM processor,improve the processing speed, the calculated data is more accurate and rapid electromechanical integration design, ...show more -
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, use...show more -
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Data Acquisition Equipment
Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, us...show more -
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Probes And Cables
The iProbe is an intelligent temperature sensor that can be calibrated independently of SBIR’s blackbody systems or 104i precision thermometers. These ultra-stable, highly responsive iProbes are used to provide long term accuracy and repeatability of under 0.010°C. Each iProbe incorporates onboard flash memory that allows all calibration constants and calibration date information to be stored independently of the blackbody or thermometer system. This allows iProbes to be exchanged for use on a b...show more -
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FPGA PXIe High-Performance Digital I/O Card
GX3700e
The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design th...show more -
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LCRZ Tester
DU-6218
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Digital Test Hammers
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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PANAVIA Modules
AIM’s PANAVIA test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core design with one processor for real time bus protocol support, massive memory and IRIG-B time code encoder/decoder functions are standard. AIM delivers versions of our modules with extended temperature range and conformal coating. With 8 Tx and ...show more -
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Stack Analysis
VerOStack
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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Logic Analyzer
FS2352B
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Fibre Channel Modules
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function...show more
