Showing results: 31 - 45 of 54 items found.
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TEM Consulting, LP
The TEM Consulting near field scanner is a high precisions positioner that supports the precise movement of field probes. Using our scanning positioner field maps of planes and volumes can be developed to assist engineers in antenna design, analyzing and solving EMC problems and mapping signal intensity.
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PHI Quantes -
Physical Electronics
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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1EA560 -
Le-tehnika, d.o.o.
Multifuncional tester with LCD display enables to show wire maps and combination of pairs and their lenghts. It also measure the lenght until the broken line / cable. It is suitable for CAT5, CAT5E, and CAT6 cables. With special interface is also suitable for testing of coaxial and telephone cables. It has special unit for testing of cable ends in the other room.
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785283-01 -
NI
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Peritec Corp.
The EMI tester automatically measures the noise distribution of the electric field and the magnetic field radiated from electronic equipment with high accuracy.・ Even if PCB and IC parts have complicated bumpy shape and surface. The movable assembly can automatically trace them.・ EMI noise distribution is expressed as a variety of maps, such as 4D/3D/2D graphics and cross section view.
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k-Space Associates, Inc.
The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.
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130 SSP -
Elcometer Limited
The Elcometer 130 Soluble Salt Profiler provides fast and accurate measurement of the level and density of soluble salts - over 4 times faster than other Bresle equivalent methods. The new Elcometer 130 Soluble Salt Profiler allows you to complete a Bresle equivalent test in just over two minutes. The multi-point conductivity sensors enable the Elcometer 130 SSP to accurately display salt concentration, showing exactly where the contamination lies and generating full colour salt density maps in 2D or 3D.
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Teledyne Marine RD Instruments
For decades, Teledyne RD Instruments has been the preeminent supplier of Acoustic Doppler Current Profiling (ADCP) instrumentation for open ocean applications. Teledyne RDI’s vessel-mounted Ocean Surveyor family of ADCPs continues to raise the bar, collecting detailed maps of the distribution of water currents and suspended materials through the water column and along the ship’s path - at depths and resolutions previously considered unattainable. In real time, the ADCP is also used to aid in situ decision-making, to adapt field operations, and to understand current regime characteristics.
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DataView -
Test Spectrum, Inc.
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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MagCam NV
The fully digital and compact measurement system connects to a computer via a single USB cable, making the measurement data directly digitally available. The Magcam maps are analyzed in real time by the MagScope measurement & analysis software and its optional add-on software modules, which provide powerful measurement and analysis capabilities for a complete quality control and characterization of permanent magnets and magnet assemblies.
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TROI 7700 SERIES -
Pemtron Co., Ltd
Using Moire' pattern, Pemtron's three-dimensional lead applicationdosage tester combines 2D color images with 3D measurement data toprovide more detailed, near-real PCB images, unlike traditionalcolor maps. We will also provide you with the best solution forhigh-quality and high-precision PCB production with a varietyof statistical programs, along with information you need toquickly and accurately judge positive/failure.
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Automated Precision Inc.
API’s, on-site, first article measurement services provide inspection data on parts and assemblies with direct comparison against CAD models or drawings. Generated 3D measurement data from our portable metrology equipment and 3D scanners offers a comprehensive analysis of the physical part under measurement. Inspection reports can include 3D color maps or generated 3D models for detailed computer analysis.
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28058 -
Parallax Inc.
The SF30/C High Speed Laser Rangefinders can output an amazing 18317 readings per second. Lightweight and compact, this 0–100 meter rangefinder is designed to detect terrain and obstacles or create maps from moving vehicles and UAVs. It uses a time-of-flight system to make accurate distance measurements that are not affected by surface texture, speed, wind, changes in barometric pressure, noise, ambient light, terrain, or air temperature.
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786320-01 -
NI
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Geo Surface3D PRO -
ScienceGL, Inc.
ScienceGL offers 3D visualization for extended GIS data that combines multiple layer terrain and multi-variable thematic map in one interactive 3D screen. Visualize Digital Elevation Model (DEM), land map, roads, satellite image, LIDAR data in the same screen. Combine terrain data with vector graphics, businesses thematic map, weather map, etc. Use transparancy to highlight more important data. The unique combination of GIS and multi-variable thematic maps helps to discover trends and patterns quickly and accurately. No other data presentation method comes close to expressing so much information within such a small space.
